Milpitas, California
United States
135
2011-09-29
128
2013-08-06
These are the the leading inventors for applications assigned to CREDENCE SYSTEMS CORPORATION:
CREDENCE SYSTEMS CORPORATION based in Milpitas, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
High resolution clock signal generator
#2 | 2010-10-05 ✅ Patent 7,810,005 granted on 2010-10-05Method and system for correcting timing errors in high data rate automated test equipment
#3 | 2010-09-28 ✅ Patent 7,805,628 granted on 2010-09-28High resolution clock signal generator
#4 | 2010-07-27 ✅ Patent 7,765,443 granted on 2010-07-27Test systems and methods for integrated circuit devices
#5 | 2010-07-20 ✅ Patent 7,761,751 granted on 2010-07-20Test and diagnosis of semiconductors
#6 | 2010-01-28AUTOMATED TEST SYSTEM AND METHOD
#7 | 2009-11-10 ✅ Patent 7,615,990 granted on 2009-11-10Loadboard enhancements for automated test equipment
#8 | 2009-03-19 ✅ Patent 8,295,182 granted on 2012-10-23Routed event test system and method
#9 | 2009-02-17 ✅ Patent 7,492,181 granted on 2009-02-17Method and device for enabling the measurement of device under test voltages using a testing instrument of limited range
#10 | 2008-10-21 ✅ Patent 7,439,728 granted on 2008-10-21System and method for test socket calibration using composite waveform
#11 | 2008-08-19 ✅ Patent 7,414,438 granted on 2008-08-19Clock based voltage deviation detector
#12 | 2008-07-24 ✅ Patent 7,636,155 granted on 2009-12-22System and method for resolving photoemission from semiconductor devices
#13 | 2008-05-13 ✅ Patent 7,372,302 granted on 2008-05-13High speed, out-of-band differential pin driver
#14 | 2008-04-17APPARATUS AND METHOD FORMING A CONTACT TO SILICIDE AND A CONTACT TO A CONTACT
#15 | 2008-04-01 ✅ Patent 7,353,126 granted on 2008-04-01Method of determining coherent test conditions
#16 | 2008-03-27 ✅ Patent 7,535,000 granted on 2009-05-19Method and system for identifying events in FIB
#17 | 2008-03-13 ✅ Patent 7,471,100 granted on 2008-12-30Semiconductor integrated circuit tester with interchangeable tester module
#18 | 2008-03-11 ✅ Patent 7,343,538 granted on 2008-03-11Programmable multi-function module for automatic test equipment systems
#19 | 2008-02-14 ✅ Patent 7,532,014 granted on 2009-05-12LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers
#20 | 2008-01-31APPARATUS AND METHOD FOR INTEGRATED CIRCUIT DESIGN FOR CIRCUIT EDIT
#21 | 2007-12-20 ✅ Patent 7,884,024 granted on 2011-02-08Apparatus and method for optical interference fringe based integrated circuit processing
#22 | 2007-12-20Lens housing with integrated thermal management
#23 | 2007-12-20System and method for thermal management and gradient reduction
#24 | 2007-11-22 ✅ Patent 7,430,130 granted on 2008-09-30D-optimized switching converter
#25 | 2007-10-11 ✅ Patent 7,679,358 granted on 2010-03-16System and method for voltage noise and jitter measurement using time-resolved emission
#26 | 2007-09-06 ✅ Patent 7,466,852 granted on 2008-12-16Time resolved non-invasive diagnostics system
#27 | 2007-09-06 ✅ Patent 7,492,529 granted on 2009-02-17Bi-convex solid immersion lens
#28 | 2007-08-07 ✅ Patent 7,254,203 granted on 2007-08-07Method and apparatus for use of high sampling frequency A/D converters for low frequency sampling
#29 | 2007-08-02 ✅ Patent 7,243,039 granted on 2007-07-10System and method for determining probing locations on IC
#30 | 2007-08-02 ✅ Patent 7,257,507 granted on 2007-08-14System and method for determining probing locations on IC
#31 | 2007-07-10 ✅ Patent 7,242,257 granted on 2007-07-10Calibration-associated systems and methods
#32 | 2007-06-05 ✅ Patent 7,227,702 granted on 2007-06-05Bi-convex solid immersion lens
#33 | 2007-05-29 ✅ Patent 7,224,828 granted on 2007-05-29Time resolved non-invasive diagnostics system
#34 | 2007-05-22 ✅ Patent 7,222,280 granted on 2007-05-22Diagnostic process for automated test equipment
#35 | 2007-05-17Method for in-line testing of semiconductor wafers
#36 | 2007-04-26 ✅ Patent 7,307,440 granted on 2007-12-11Semiconductor integrated circuit tester with interchangeable tester module
#37 | 2007-04-19 ✅ Patent 7,271,664 granted on 2007-09-18Phase locked loop circuit
#38 | 2007-03-15 ✅ Patent 7,243,278 granted on 2007-07-10Integrated circuit tester with software-scaleable channels
#39 | 2007-03-01 ✅ Patent 7,659,981 granted on 2010-02-09Apparatus and method for probing integrated circuits using polarization difference probing
#40 | 2007-03-01 ✅ Patent 7,733,100 granted on 2010-06-08System and method for modulation mapping
#41 | 2007-01-30 ✅ Patent 7,171,598 granted on 2007-01-30Tester system having a multi-purpose memory
#42 | 2007-01-11 ✅ Patent 7,161,347 granted on 2007-01-09Test head for semiconductor integrated circuit tester
#43 | 2007-01-04 ✅ Patent 7,450,245 granted on 2008-11-11Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system
#44 | 2006-11-30 ✅ Patent 7,314,767 granted on 2008-01-01Method for local wafer thinning and reinforcement
#45 | 2006-11-28 ✅ Patent 7,143,326 granted on 2006-11-28Test system algorithmic program generators
#46 | 2006-11-23 ✅ Patent 7,639,025 granted on 2009-12-29Collection optics integrating an objective and a SIL
#47 | 2006-11-23 ✅ Patent 7,530,034 granted on 2009-05-05Apparatus and method for circuit operation definition
#48 | 2006-11-14 ✅ Patent 7,135,123 granted on 2006-11-14Method and system for integrated circuit backside navigation
#49 | 2006-11-02 ✅ Patent 7,296,195 granted on 2007-11-13Bit synchronization for high-speed serial device testing
#50 | 2006-10-10 ✅ Patent 7,120,840 granted on 2006-10-10Method and system for improved ATE timing calibration at a device under test
#51 | 2006-10-05 ✅ Patent 7,292,059 granted on 2007-11-06Power supply assembly for a semiconductor circuit tester
#52 | 2006-10-05FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS
#53 | 2006-09-28 ✅ Patent 7,496,467 granted on 2009-02-24Automatic test equipment operating architecture
#54 | 2006-09-26 ✅ Patent 7,113,630 granted on 2006-09-26PICA system detector calibration
#55 | 2006-09-26 ✅ Patent 7,113,886 granted on 2006-09-26Circuit and method for distributing events in an event stream
#56 | 2006-09-21 ✅ Patent 7,302,358 granted on 2007-11-27Automatic test equipment operating architecture
#57 | 2006-08-29 ✅ Patent 7,098,529 granted on 2006-08-29System and method for packaging a semiconductor device
#58 | 2006-08-24 ✅ Patent 7,697,146 granted on 2010-04-13Apparatus and method for optical interference fringe based integrated circuit processing
#59 | 2006-08-17 ✅ Patent 7,323,862 granted on 2008-01-29Apparatus and method for detecting photon emissions from transistors
#60 | 2006-08-03 ✅ Patent 7,471,753 granted on 2008-12-30Serializer clock synthesizer
#61 | 2006-06-22 ✅ Patent 7,246,026 granted on 2007-07-17Multi-domain execution of tests on electronic devices
#62 | 2006-06-06 ✅ Patent 7,057,410 granted on 2006-06-06Interface structure for semiconductor integrated circuit test equipment
#63 | 2006-05-25 ✅ Patent 7,439,730 granted on 2008-10-21Apparatus and method for detecting photon emissions from transistors
#64 | 2006-05-18 ✅ Patent 7,389,449 granted on 2008-06-17Edge selecting triggering circuit
#65 | 2006-05-16 ✅ Patent 7,045,791 granted on 2006-05-16Column simultaneously focusing a partilce beam and an optical beam
#66 | 2006-05-11 ✅ Patent 7,297,948 granted on 2007-11-20Column simultaneously focusing a particle beam and an optical beam
#67 | 2006-05-09 ✅ Patent 7,042,239 granted on 2006-05-09Arrangement for manual disengagement of a device interface board from a personal tester
#68 | 2006-05-02 ✅ Patent 7,039,841 granted on 2006-05-02Tester system having multiple instruction memories
#69 | 2006-04-25 ✅ Patent 7,034,520 granted on 2006-04-25Integrated circuit tester
#70 | 2006-04-25 ✅ Patent 7,036,109 granted on 2006-04-25Imaging integrated circuits with focused ion beam
#71 | 2006-04-25 ✅ Patent 7,035,755 granted on 2006-04-25Circuit testing with ring-connected test instrument modules
#72 | 2006-04-20 ✅ Patent 7,177,777 granted on 2007-02-13Synchronization of multiple test instruments
#73 | 2006-04-13 ✅ Patent 7,439,168 granted on 2008-10-21Apparatus and method of forming silicide in a localized manner
#74 | 2006-04-13 ✅ Patent 7,612,321 granted on 2009-11-03Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner
#75 | 2006-04-06 ✅ Patent 7,099,792 granted on 2006-08-29Synchronization of multiple test instruments
#76 | 2006-03-30 ✅ Patent 7,409,617 granted on 2008-08-05System for measuring characteristics of a digital signal
#77 | 2006-03-28 ✅ Patent 7,019,546 granted on 2006-03-28Test head for integrated circuit tester
#78 | 2006-03-21 ✅ Patent 7,017,091 granted on 2006-03-21Test system formatters configurable for multiple data rates
#79 | 2006-03-07 ✅ Patent 7,009,382 granted on 2006-03-07System and method for test socket calibration
#80 | 2006-03-02 ✅ Patent 7,212,941 granted on 2007-05-01Non-deterministic protocol packet testing
#81 | 2006-03-02 ✅ Patent 7,230,240 granted on 2007-06-12Enhanced scanning control of charged particle beam systems
#82 | 2006-02-14 ✅ Patent 6,998,863 granted on 2006-02-14Arrangement for providing electrical connections to pin electronics cards in test head
#83 | 2006-02-09 ✅ Patent 7,478,345 granted on 2009-01-13Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
#84 | 2006-02-09 ✅ Patent 7,115,426 granted on 2006-10-03Method and apparatus for addressing thickness variations of a trench floor formed in a semiconductor substrate
#85 | 2006-02-09 ✅ Patent 7,327,452 granted on 2008-02-05Light beam apparatus and method for orthogonal alignment of specimen
#86 | 2006-01-19 ✅ Patent 7,245,133 granted on 2007-07-17Integration of photon emission microscope and focused ion beam
#87 | 2006-01-12 ✅ Patent 7,135,678 granted on 2006-11-14Charged particle guide
#88 | 2006-01-10 ✅ Patent 6,985,219 granted on 2006-01-10Optical coupling for testing integrated circuits
#89 | 2006-01-05 ✅ Patent 7,454,678 granted on 2008-11-18Scan stream sequencing for testing integrated circuits
#90 | 2005-12-27 ✅ Patent 6,979,994 granted on 2005-12-27Power supply device for a component testing installation
#91 | 2005-12-22 ✅ Patent 7,009,173 granted on 2006-03-07Lens mount integrated with a thermoelectrically cooled photodetector module
#92 | 2005-12-13 ✅ Patent 6,976,234 granted on 2005-12-13Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
#93 | 2005-11-24 ✅ Patent 7,099,791 granted on 2006-08-29System and method for linking and loading compiled pattern data
#94 | 2005-11-24 ✅ Patent 7,336,066 granted on 2008-02-26Reduced pin count test method and apparatus
#95 | 2005-10-25 ✅ Patent 6,958,248 granted on 2005-10-25Method and apparatus for the improvement of material/voltage contrast
#96 | 2005-10-20 ✅ Patent 7,400,154 granted on 2008-07-15Apparatus and method for detecting photon emissions from transistors
#97 | 2005-10-18 ✅ Patent 6,956,365 granted on 2005-10-18System and method for calibration of testing equipment using device photoemission
#98 | 2005-10-18 ✅ Patent 6,955,930 granted on 2005-10-18Method for determining thickness of a semiconductor substrate at the floor of a trench
#99 | 2005-09-22 ✅ Patent 6,951,482 granted on 2005-10-04Controlled-impedance coaxial cable interconnect system
#100 | 2005-09-13 ✅ Patent 6,943,572 granted on 2005-09-13Apparatus and method for detecting photon emissions from transistors
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