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Inventor profile of:

Philippe PERDU

City:

TOULOUSE

Country:

France

Published Applications:

16

Last publication date:

2018-11-22

Top Assignees for applications by Philippe PERDU

The entities that hold a legal rights for patent applications filed by inventor PERDU Philippe:

CREDENCE SYSTEMS CORPORATION 7 Milpitas, CA United States
CENTRE NATIONAL D'ETUDES SPATIALES 5 Paris, France
DCG SYSTEMS, INC. 1 Fremont, CA United States
Université de Bourgogne 1 Dijon, France
CENTRE NATIONAL D'ETUDES SPATIALES (CNES) 1 PARIS CEDEX 01, France
Centre National d 'Etudes Spatiales 1 Paris, France
Centre National d'Etudes Spatiales 1 Paris Cedex, France
CENTRE NATIONAL D'ETUDES SPATIALES CNES 1 Paris, France
CENTRE NATIONALE D' ETUDES 1 Paris, France

Recent patent applications by PERDU Philippe

Philippe PERDU from TOULOUSE, FR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2018-11-22

US20180336162A1

METHOD AND DEVICE FOR RECONSTRUCTING A USEFUL SIGNAL FROM A NOISY ACQUIRED SIGNAL

#2 | 2012-05-10

US20120116734A1

Method of characterizing an electrical defect affecting an electronic circuit, related device and information recording medium

#3 | 2011-08-04

US20110187352A1

METHOD AND MACHINE FOR MULTIDIMENSIONAL TESTING OF AN ELECTRONIC DEVICE ON THE BASIS OF A MONODIRECTIONAL PROBE

#4 | 2007-06-14

US20070132464A1

Magnetic-field-measuring probe

#5 | 2007-05-17

US20070108975A1

Device for measuring a component of current based on magnetic fields

#6 | 2007-03-13

US10312632

Method for customizing an integrated circuit element

#7 | 2007-03-08

US20070052412A1

Magnetic-field-measuring device

#8 | 2006-08-17

US20060181268A1

Apparatus and method for detecting photon emissions from transistors

#9 | 2006-05-25

US20060108997A1

Apparatus and method for detecting photon emissions from transistors

#10 | 2005-10-20

US20050231219A1

Apparatus and method for detecting photon emissions from transistors

#11 | 2005-09-20

US9831525

Method and installation for fast fault localization in an integrated circuit

#12 | 2005-09-13

US10728522

Apparatus and method for detecting photon emissions from transistors

#13 | 2005-07-07

US20050146321A1

Apparatus and method for detecting photon emissions from transistors

#14 | 2005-05-10

US10234231

Apparatus and method for detecting photon emissions from transistors

#15 | 2005-02-03

US20050024057A1

Methods of using measured time resolved photon emission data and simulated time resolved photon emission data for fault localization

#16 | 2005-01-13

US20050006602A1

Spatial and temporal selective laser assisted fault localization

InventorID:

2355588 ⎘