Freemont, California
United States
8
2024-12-05
7
2025-04-22
These are the the leading inventors for applications assigned to NOVA MEASURING INSTRUMENTS INC.:
NOVA MEASURING INSTRUMENTS INC. based in Freemont, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Characterizing and measuring in small boxes using XPS with multiple measurements
#2 | 2024-10-17 ✅ Patent 12,360,063 granted on 2025-07-15SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATTEROMETRY
#3 | 2024-03-14 ✅ Patent 12,165,863 granted on 2024-12-10Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
#4 | 2024-03-14FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS AND XRF TECHNOLOGIES
#5 | 2024-02-08 ✅ Patent 12,158,437 granted on 2024-12-03XPS metrology for process control in selective deposition
#6 | 2023-09-14 ✅ Patent 11,988,502 granted on 2024-05-21Characterizing and measuring in small boxes using XPS with multiple measurements
#7 | 2023-03-23 ✅ Patent 11,764,050 granted on 2023-09-19Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
#8 | 2023-01-19 ✅ Patent 11,680,915 granted on 2023-06-20XPS metrology for process control in selective deposition
Also check out NOVA MEASURING INSTRUMENTS INC.'s (Freemont, United States) applicant profile with 8 patent applications submitted.
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