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Inventor profile of:

Michael Kwan

City:

Sunnyvale, California

Country:

United States

Published Applications:

8

Last publication date:

2024-03-14

Top Assignees for applications by Michael Kwan

The entities that hold a legal rights for patent applications filed by inventor Kwan Michael:

ReVera Incorporated 4 Sunnyvale, CA United States
ReVera, Incorporated 1 Santa Clara, CA United States
NOVA MEASURING INSTRUMENTS INC. 1 Santa Clara, CA United States
NOVA MEASURING INSTRUMENTS INC. 1 Freemont, CA United States
NOVA MEASURING INSTRUMENTS INC. 1 Fremont, CA United States
ReVara, Incorporated 1 Santa Clara, CA United States

Recent patent applications by Kwan Michael

Michael Kwan from Sunnyvale, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-03-14

US20240085174A1

FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS AND XRF TECHNOLOGIES

#2 | 2021-12-02

US20210372787A1

Feed-forward of multi-layer and multi-process information using XPS and XRF technologies

#3 | 2015-03-12

US20150069230A1

Method and system for non-destructive distribution profiling of an element in a film

#4 | 2014-03-13

US20140070096A1

Method and system for non-destructive distribution profiling of an element in a film

#5 | 2012-12-20

US20120318974A1

Method and system for non-destructive distribution profiling of an element in a film

#6 | 2011-06-16

US20110144787A1

Method and system for non-destructive distribution profiling of an element in a film

#7 | 2008-11-20

US20080283743A1

Method and system for non-destructive distribution profiling of an element in a film

#8 | 2007-01-11

US20070010973A1

Method and system for non-destructive distribution profiling of an element in a film

InventorID:

682756 ⎘