Beaverton, Oregon
United States
17
2020-07-09
17
2020-10-20
These are the the leading inventors for applications assigned to FormFactor Beaverton, Inc.:
FormFactor Beaverton, Inc. based in Beaverton, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Probe systems and methods for calibrating capacitive height sensing measurements
#2 | 2020-01-23 ✅ Patent 10,698,025 granted on 2020-06-30Probe systems and methods that utilize a flow-regulating structure for improved collection of an optical image of a device under test
#3 | 2019-07-25 ✅ Patent 10,877,070 granted on 2020-12-29Probes with fiducial targets, probe systems including the same, and associated methods
#4 | 2019-04-04 ✅ Patent 10,698,002 granted on 2020-06-30Probe systems for testing a device under test
#5 | 2018-10-04 ✅ Patent 10,330,703 granted on 2019-06-25Probe systems and methods including electric contact detection
#6 | 2018-05-31 ✅ Patent 10,571,487 granted on 2020-02-25Contact engines, probe head assemblies, probe systems, and associated methods for on-wafer testing of the wireless operation of a device under test
#7 | 2018-03-29 ✅ Patent 10,459,006 granted on 2019-10-29Probe systems and methods
#8 | 2018-02-01 ✅ Patent 10,281,492 granted on 2019-05-07Shielded probe systems with controlled testing environments
#9 | 2017-12-21 ✅ Patent 10,120,020 granted on 2018-11-06Probe head assemblies and probe systems for testing integrated circuit devices
#10 | 2017-12-14 ✅ Patent 10,161,994 granted on 2018-12-25Systems and methods for electrically testing electromigration in an electromigration test structure
#11 | 2017-11-23 ✅ Patent 10,062,597 granted on 2018-08-28High voltage chuck for a probe station
#12 | 2017-10-05 ✅ Patent 10,060,963 granted on 2018-08-28Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges
#13 | 2017-09-21 ✅ Patent 10,180,486 granted on 2019-01-15Test standards and methods for impedance calibration of a probe system, and probe systems that include the test standards or utilize the methods
#14 | 2017-07-20 ✅ Patent 10,060,950 granted on 2018-08-28Shielded probe systems
#15 | 2017-05-25 ✅ Patent 10,365,323 granted on 2019-07-30Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature change
#16 | 2016-11-17 ✅ Patent 10,267,848 granted on 2019-04-23Method of electrically contacting a bond pad of a device under test with a probe
#17 | 2015-08-27 ✅ Patent 10,281,518 granted on 2019-05-07Systems and methods for on-wafer dynamic testing of electronic devices
Also check out FormFactor Beaverton, Inc.'s (Beaverton, United States) applicant profile with 4 patent applications submitted.
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