Inventor profile of:

Michael E. Simmons

City:

Colton, Oregon

Country:

United States

Published Applications:

13

Last publication date:

2026-03-05

Top Assignees for applications by Michael E. Simmons

The entities that hold a legal rights for patent applications filed by inventor Simmons Michael E.:

Recent patent applications by Simmons Michael E.

Michael E. Simmons from Colton, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-03-05
US20260063668A1
Physics

OPTOELECTRONIC PROBE CARDS, OPTOELECTRONIC TESTERS, AND RELATED METHODS

#2 | 2025-12-18
US20250383371A1
Physics

VIBRATION ISOLATION LAYERS, MEASUREMENT SYSTEMS THAT INCLUDE THE VIBRATION ISOLATION LAYERS, AND RELATED METHODS

#3 | 2025-12-18
US20250383231A1
Physics

OPTICAL CALIBRATION STRUCTURES FOR OPTICAL PROBES, OPTICAL PROBE SYSTEMS THAT INCLUDE THE OPTICAL CALIBRATION STRUCTURES, AND METHODS OF CALIBRATING A PLURALITY OF OPTICAL PROBES

#4 | 2025-11-13
US20250347586A1
Physics

LENS ARRAYS, FIBER OPTIC FIXTURES THAT INCLUDE THE LENS ARRAYS, PROBE SYSTEMS THAT INCLUDE THE FIBER OPTIC FIXTURES, AND METHODS OF FORMING FIBER OPTIC FIXTURES

#5 | 2021-05-06
US20210132115A1
Physics

Probe systems including imaging devices with objective lens isolators, and related methods

#6 | 2021-04-01
US20210096176A1
Physics

Probe systems for optically probing a device under test and methods of operating the probe systems

#7 | 2020-12-03
US20200378888A1
Physics

Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems

#8 | 2019-04-04
US20190101567A1
Physics

Probe systems for testing a device under test

#9 | 2017-11-23
US20170338142A1
Electricity

High voltage chuck for a probe station

#10 | 2017-07-20
US20170205446A1
Physics

Shielded probe systems

#11 | 2016-07-07
US20160195579A1
Physics

High voltage chuck for a probe station

#12 | 2015-09-10
US20150255322A1
Electricity

Wafer-handling end effectors with wafer-contacting surfaces and sealing structures

#13 | 2013-03-28
US20130075982A1
Physics

High voltage chuck for a probe station

InventorID:

161204 ⎘