Dresden
Germany
14
2025-09-11
The entities that hold a legal rights for patent applications filed by inventor Becker Axel:
Axel Becker from Dresden, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
WAFER-HANDLING END EFFECTORS CONFIGURED TO SELECTIVELY LIFT A WAFER FROM AN UPPER SURFACE OF THE WAFER, PROBE SYSTEMS THAT INCLUDE THE WAFER-HANDLING END EFFECTORS, AND METHODS OF UTILIZING THE WAFER-HANDLING END EFFECTORS
#2 | 2024-06-13WAFER-HANDLING END EFFECTORS CONFIGURED TO SELECTIVELY LIFT A WAFER FROM AN UPPER SURFACE OF THE WAFER, PROBE SYSTEMS THAT INCLUDE THE WAFER-HANDLING END EFFECTORS, AND METHODS OF UTILIZING THE WAFER-HANDLING END EFFECTORS
#3 | 2020-01-23Probe systems and methods that utilize a flow-regulating structure for improved collection of an optical image of a device under test
#4 | 2014-07-03Systems and methods for handling substrates at below dew point temperatures
#5 | 2014-05-29Modular prober and method for operating same
#6 | 2011-07-28ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER
#7 | 2011-01-20Arrangement and method for focusing a multiplane image acquisition on a prober
#8 | 2010-02-25METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A SOLAR CELL
#9 | 2010-02-25PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL
#10 | 2008-07-24Method and apparatus for the correction of defective solder bump arrays
#11 | 2008-07-03ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER
#12 | 2008-05-22Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus
#13 | 2007-12-27Adapter for positioning of contact tips
#14 | 2007-03-22PROCESS FOR THE INSPECTION OF A VARIETY OF REPETITIVE STRUCTURES
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