Inventor profile of:

Axel Becker

City:

Dresden

Country:

Germany

Published Applications:

14

Last publication date:

2025-09-11

Top Assignees for applications by Axel Becker

The entities that hold a legal rights for patent applications filed by inventor Becker Axel:

Recent patent applications by Becker Axel

Axel Becker from Dresden, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-09-11
US20250282063A1
Performing operations; transporting

WAFER-HANDLING END EFFECTORS CONFIGURED TO SELECTIVELY LIFT A WAFER FROM AN UPPER SURFACE OF THE WAFER, PROBE SYSTEMS THAT INCLUDE THE WAFER-HANDLING END EFFECTORS, AND METHODS OF UTILIZING THE WAFER-HANDLING END EFFECTORS

#2 | 2024-06-13
US20240190019A1
Performing operations; transporting

WAFER-HANDLING END EFFECTORS CONFIGURED TO SELECTIVELY LIFT A WAFER FROM AN UPPER SURFACE OF THE WAFER, PROBE SYSTEMS THAT INCLUDE THE WAFER-HANDLING END EFFECTORS, AND METHODS OF UTILIZING THE WAFER-HANDLING END EFFECTORS

#3 | 2020-01-23
US20200025823A1
Physics

Probe systems and methods that utilize a flow-regulating structure for improved collection of an optical image of a device under test

#4 | 2014-07-03
US20140185649A1
Physics

Systems and methods for handling substrates at below dew point temperatures

#5 | 2014-05-29
US20140145743A1
Physics

Modular prober and method for operating same

#6 | 2011-07-28
US20110181710A1
Physics

ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER

#7 | 2011-01-20
US20110013011A1
Physics

Arrangement and method for focusing a multiplane image acquisition on a prober

#8 | 2010-02-25
US20100045265A1
Electricity

METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A SOLAR CELL

#9 | 2010-02-25
US20100045264A1
Physics

PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL

#10 | 2008-07-24
US20080173697A1
Performing operations; transporting

Method and apparatus for the correction of defective solder bump arrays

#11 | 2008-07-03
US20080158664A1
Physics

ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER

#12 | 2008-05-22
US20080116911A1
Physics

Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus

#13 | 2007-12-27
US20070296402A1
Physics

Adapter for positioning of contact tips

#14 | 2007-03-22
US20070064992A1
Physics

PROCESS FOR THE INSPECTION OF A VARIETY OF REPETITIVE STRUCTURES

InventorID:

776343 ⎘