Assignee profile:

CELADON SYSTEMS, INC.

City:

Apple Valley, Minnesota

Country:

United States

Published Applications:

19

Last publication date:

2014-08-28

Patent Grants:

19

Last grant date:

2015-05-05

Top Inventors for applications by CELADON SYSTEMS, INC.

These are the the leading inventors for applications assigned to CELADON SYSTEMS, INC.:

Recent patent applications by CELADON SYSTEMS, INC.

CELADON SYSTEMS, INC. based in Apple Valley, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2014-08-28 ✅ Patent 9,024,651 granted on 2015-05-05
US20140239996A1
Physics

Test apparatus having a probe card and connector mechanism

#2 | 2014-08-14 ✅ Patent 8,994,390 granted on 2015-03-31
US20140225636A1
Physics

Test systems with a probe apparatus and index mechanism

#3 | 2014-07-31 ✅ Patent 9,018,966 granted on 2015-04-28
US20140210501A1
Physics

Test apparatus having a probe card and connector mechanism

#4 | 2014-05-22 ✅ Patent 9,678,149 granted on 2017-06-13
US20140139248A1
Physics

Test apparatus having a probe core with a twist lock mechanism

#5 | 2012-06-28 ✅ Patent 8,860,450 granted on 2014-10-14
US20120161804A1
Physics

Apparatus and method for terminating probe apparatus of semiconductor wafer

#6 | 2012-02-16 ✅ Patent 8,698,515 granted on 2014-04-15
US20120038380A1
Physics

Probe test equipment for testing a semiconductor device

#7 | 2011-08-25 ✅ Patent 8,674,715 granted on 2014-03-18
US20110204912A1
Physics

Test apparatus having a probe core with a twist lock mechanism

#8 | 2010-11-11 ✅ Patent 7,956,629 granted on 2011-06-07
US20100283494A1
Physics

Probe tile for probing semiconductor wafer

#9 | 2010-10-14 ✅ Patent 8,149,009 granted on 2012-04-03
US20100259288A1
Physics

Apparatus and method for terminating probe apparatus of semiconductor wafer

#10 | 2010-08-12 ✅ Patent 7,999,564 granted on 2011-08-16
US20100203758A1
Physics

Replaceable probe apparatus for probing semiconductor wafer

#11 | 2010-02-09 ✅ Patent 7,659,737 granted on 2010-02-09
US11836507
-

Electrical, high temperature test probe with conductive driven guard

#12 | 2009-12-03 ✅ Patent 8,354,856 granted on 2013-01-15
US20090295416A1
Physics

Replaceable probe apparatus for probing semiconductor wafer

#13 | 2009-06-18 ✅ Patent 7,768,282 granted on 2010-08-03
US20090153166A1
Physics

Apparatus and method for terminating probe apparatus of semiconductor wafer

#14 | 2009-04-16 ✅ Patent 7,728,609 granted on 2010-06-01
US20090096472A1
Physics

Replaceable probe apparatus for probing semiconductor wafer

#15 | 2008-08-28 ✅ Patent 7,786,743 granted on 2010-08-31
US20080204059A1
Physics

Probe tile for probing semiconductor wafer

#16 | 2007-11-01 ✅ Patent 7,545,157 granted on 2009-06-09
US20070252606A1
Physics

Shielded probe apparatus for probing semiconductor wafer

#17 | 2007-03-29 ✅ Patent 7,345,494 granted on 2008-03-18
US20070069747A1
Physics

Probe tile for probing semiconductor wafer

#18 | 2006-03-09 ✅ Patent 7,626,404 granted on 2009-12-01
US20060049841A1
Physics

Replaceable probe apparatus for probing semiconductor wafer

#19 | 2005-04-19 ✅ Patent 6,882,168 granted on 2005-04-19
US10601764
-

Probe tile for probing semiconductor wafer

Also check out Celadon Systems, Inc.'s (Apple Valley, United States) applicant profile with 4 patent applications submitted.

AssigneeID:

65392 ⎘