Apple Valley, Minnesota
United States
39
2020-10-29
The entities that hold a legal rights for patent applications filed by inventor Root Bryan J.:
Bryan J. Root from Apple Valley, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Modular rail systems, rail systems, mechanisms, and equipment for devices under test
#2 | 2020-04-09High voltage probe card system
#3 | 2019-08-01Modular rail systems, rail systems, mechanisms, and equipment for devices under test
#4 | 2019-01-31Magnet extension
#5 | 2019-01-10Modular rail systems, rail systems, mechanisms, and equipment for devices under test
#6 | 2018-01-25Test systems with a probe apparatus and index mechanism
#7 | 2016-11-03Test apparatus having a probe core with a latch mechanism
#8 | 2016-06-30Apparatus and method for terminating probe apparatus of semiconductor wafer
#9 | 2015-07-23Test systems with a probe apparatus and index mechanism
#10 | 2015-03-26Apparatus and method for terminating probe apparatus of semiconductor wafer
#11 | 2014-08-28Test apparatus having a probe card and connector mechanism
#12 | 2014-08-14Test systems with a probe apparatus and index mechanism
#13 | 2014-07-31Test apparatus having a probe card and connector mechanism
#14 | 2014-05-22Test apparatus having a probe core with a twist lock mechanism
#15 | 2012-06-28Apparatus and method for terminating probe apparatus of semiconductor wafer
#16 | 2012-02-16Probe test equipment for testing a semiconductor device
#17 | 2011-08-25Test apparatus having a probe core with a twist lock mechanism
#18 | 2010-11-11Probe tile for probing semiconductor wafer
#19 | 2010-10-14Apparatus and method for terminating probe apparatus of semiconductor wafer
#20 | 2010-08-12Replaceable probe apparatus for probing semiconductor wafer
#21 | 2010-02-09Electrical, high temperature test probe with conductive driven guard
#22 | 2009-12-03Replaceable probe apparatus for probing semiconductor wafer
#23 | 2009-06-18Apparatus and method for terminating probe apparatus of semiconductor wafer
#24 | 2009-04-16Replaceable probe apparatus for probing semiconductor wafer
#25 | 2008-08-28Probe tile for probing semiconductor wafer
#26 | 2007-12-06Apparatus and Method for Terminating Probe Apparatus of Semiconductor Wafer
#27 | 2007-11-01Shielded probe apparatus for probing semiconductor wafer
#28 | 2007-09-18Electrical, high temperature test probe with conductive driven guard
#29 | 2007-04-19Apparatus and Method for Terminating Probe Apparatus of Semiconductor Wafer
#30 | 2007-03-29Probe tile for probing semiconductor wafer
#31 | 2006-08-24Apparatus and method for terminating probe apparatus of semiconductor wafer
#32 | 2006-06-01Shielded probe apparatus for probing semiconductor wafer
#33 | 2006-03-09Replaceable probe apparatus for probing semiconductor wafer
#34 | 2006-01-31Shielded probe apparatus for probing semiconductor wafer
#35 | 2005-12-13Electrical, high temperature test probe with conductive driven guard
#36 | 2005-11-17Apparatus and method for terminating probe apparatus of semiconductor wafer
#37 | 2005-11-08Apparatus and method for terminating probe apparatus of semiconductor wafer
#38 | 2005-09-22Probe tile for probing semiconductor wafer
#39 | 2005-04-19Probe tile for probing semiconductor wafer
768395 ⎘