Eagan, Minnesota
United States
24
2014-08-28
The entities that hold a legal rights for patent applications filed by inventor Funk William A.:
William A. Funk from Eagan, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Test apparatus having a probe card and connector mechanism
#2 | 2014-08-14Test systems with a probe apparatus and index mechanism
#3 | 2014-07-31Test apparatus having a probe card and connector mechanism
#4 | 2014-05-22Test apparatus having a probe core with a twist lock mechanism
#5 | 2012-06-28Apparatus and method for terminating probe apparatus of semiconductor wafer
#6 | 2012-02-16Probe test equipment for testing a semiconductor device
#7 | 2011-08-25Test apparatus having a probe core with a twist lock mechanism
#8 | 2010-10-14Apparatus and method for terminating probe apparatus of semiconductor wafer
#9 | 2010-08-12Replaceable probe apparatus for probing semiconductor wafer
#10 | 2010-02-09Electrical, high temperature test probe with conductive driven guard
#11 | 2009-12-03Replaceable probe apparatus for probing semiconductor wafer
#12 | 2009-06-18Apparatus and method for terminating probe apparatus of semiconductor wafer
#13 | 2009-04-16Replaceable probe apparatus for probing semiconductor wafer
#14 | 2007-12-06Apparatus and Method for Terminating Probe Apparatus of Semiconductor Wafer
#15 | 2007-11-01Shielded probe apparatus for probing semiconductor wafer
#16 | 2007-09-18Electrical, high temperature test probe with conductive driven guard
#17 | 2007-04-19Apparatus and Method for Terminating Probe Apparatus of Semiconductor Wafer
#18 | 2006-08-24Apparatus and method for terminating probe apparatus of semiconductor wafer
#19 | 2006-06-01Shielded probe apparatus for probing semiconductor wafer
#20 | 2006-03-09Replaceable probe apparatus for probing semiconductor wafer
#21 | 2006-01-31Shielded probe apparatus for probing semiconductor wafer
#22 | 2005-12-13Electrical, high temperature test probe with conductive driven guard
#23 | 2005-11-17Apparatus and method for terminating probe apparatus of semiconductor wafer
#24 | 2005-11-08Apparatus and method for terminating probe apparatus of semiconductor wafer
768396 ⎘