ClassID:

164224

G01B9/02071 - CPC Classification

Classification description:

Instruments as specified in the subgroups and characterised by the use of optical measuring means; Interferometers; Reduction or prevention of errors; Testing; Calibration; Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by measuring path difference independently from interferometer

Recent Application in this class:
#1
20220357146
2022-11-10

System and method for correcting optical path length measurement errors

#2
20220090909
2022-03-24

Thickness evaluation method of cell sheet

#3
20200208958
2020-07-02

Automatic calibration optical interferometer and automatic calibration method of optical interferometer

#4
20200191552
2020-06-18

Position measurement system, zeroing method, lithographic apparatus and device manufacturing method

#5
20190195614
2019-06-27

Optical coherence tomographic device comprising dual correction beams of different path lengths

#6
20190187661
2019-06-20

Spatial accuracy correction method and apparatus

#7
20190187660
2019-06-20

Spatial accuracy correction method and apparatus

#8
20180315207
2018-11-01

Method and system for calculating a height map of a surface of an object from an image stack in scanning optical 2.5D profiling of the surface by an optical system

#9
20180195858
2018-07-12

MEASUREMENT APPARATUS FOR MEASURING SHAPE OF TARGET OBJECT, SYSTEM AND MANUFACTURING METHOD

#10
20170307353
2017-10-26

Swept-source optical coherence tomography (SS-OCT) phase stabilization with reference signal calibration

#11
20170199023
2017-07-13

Optical coherence tomography microscopy apparatus and method for detecting a three-dimensional image of an object

#12
20160231172
2016-08-11

Self calibration for mirror positioning in optical MEMS interferometers

#13
20150022817
2015-01-22

Profilometer with partial coherence interferometer adapted for avoiding measurements straddling a null position

#14
20140139839
2014-05-22

Self calibration for mirror positioning in optical MEMS interferometers

#15
20130265585
2013-10-10

Systems and methods for phase measurements

#16
20120327425
2012-12-27

Grazing incidence interferometer

#17
20120002210
2012-01-05

OPTICAL INTERFEROMETER

#18
20110235056
2011-09-29

Method for measuring wear rate

#19
20110222067
2011-09-15

Technique to determine mirror position in optical interferometers

#20
20110090461
2011-04-21

Apparatus for measurement of the axial length of an eye

#21
20100309479
2010-12-09

Interference measuring device

#22
20100094135
2010-04-15

Systems and methods for phase measurements

#23
20100091295
2010-04-15

System and method for optical coherence tomography

#24
20090268213
2009-10-29

Apparatus for measurement of the axial length of an eye

#25
20090207416
2009-08-20

Surface characteristic determining apparatus

#26
20080049234
2008-02-28

Colorimetric three-dimensional microscopy

#27
20060262315
2006-11-23

Position-measuring device for determining the position of two objects movable with respect to each other along a measuring direction, and method for forming a reference pulse for such a position-measuring device

#28
20050105097
2005-05-19

Systems and methods for phase measurements

#29
20050057756
2005-03-17

Systems and methods for phase measurements