169941 ⎘
Investigating materials by wave or particle radiation secondary emission incident ion beam, e.g. proton
Sub-classes:LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES
#2METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
#3METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
#4SYSTEM AND METHOD FOR MODELING A ROCK SAMPLE
#5ANALYSIS DEVICE AND ANALYSIS METHOD
#6Electrical measurements in samples