G01N2223/0813 - CPC Classification Index

ClassID:

169942 ⎘

G01N2223/0813 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation secondary emission incident ion beam, e.g. proton incident ion beam and measuring X-rays [PIXE]

Recent Application in this class:

20250189469

PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS

20250164421

SPECTROMETER

20220349844

Spectrometer