168330 ⎘
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by measuring secondary emission from the material using electron or ion using incident ion beams, e.g. proton beams Measuring excited X-rays, i.e. particle-induced X-ray emission [PIXE]
NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VIA X-RAY MODELLING BASED ON GROUND TRUTH MEASUREMENTS
#2PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS
#3Surface Analysis Method and Surface Analysis Apparatus
#4Magnetic Deflector and Methods of Use Thereof
#5PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPECIES FOCUSED ION BEAMS
#6Particle-induced x-ray emission (PIXE) using hydrogen and multi-species focused ion beams
#71 MEV TO 3 MEV DEUTERON/PROTON CYCLOTRON FOR MATERIAL ANALYSIS
#8System and method of preparing integrated circuits for backside probing using charged particle beams
#9MeV-based ion beam analysis apparatus
#10System and method of preparing integrated circuits for backside probing using charged particle beams
#11Method and system for analysis of objects
#12Material characterization using ion channeling imaging
#13Composition analysis method and composition analysis system
#14Charged particle microscope with improved spectroscopic functionality
#15X-ray detector including integrated electron detector
#16Electron detector including an intimately-coupled scintillator-photomultiplier combination, and electron microscope and X-ray detector employing same
#17Methods and Systems for Analyzing Samples Using Particle Irradition
#18Method and apparatus for measuring wall thickness of a vessel