168329 ⎘
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by measuring secondary emission from the material using electron or ion using incident ion beams, e.g. proton beams
Sub-classes:Method for Acquiring Target Thickness of Hydrogen Embrittlement-Resistant Layer of Neutron Source Target, Terminal, and Storage Medium
#2METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED THROUGHPUT
#3Method for cross-section sample preparation
#4SYSTEM AND METHOD FOR MODELING A ROCK SAMPLE
#5ANALYSIS DEVICE AND ANALYSIS METHOD
#6Method for cross-section sample preparation
#7Systems and Methods for Hydrocarbon Reservoir Divided Model Generation and Development
#8Correlation between emission spots utilizing CAD data in combination with emission microscope images
#9Method for cross-section sample preparation
#10Structured detectors and detector systems for radiation imaging
#11Dispositioning defects detected on extreme ultraviolet photomasks
#12Structured detectors and detector systems for radiation imaging
#13Structured detectors and detector systems for radiation imaging
#14Position feedback for multi-beam particle detector
#15Structured detectors and detector systems for radiation imaging
#16Structured detectors and detector systems for radiation imaging
#17Structured detectors and detector systems for radiation imaging
#18Method for mapping crystal orientations in a sample made of a polycrystalline material
#19Circuit tracing using a focused ion beam
#20Method for generating image data relating to an object and particle beam device for carrying out this method
#21Circuit tracing using a focused ion beam
#22Cross-section processing and observation method and cross-section processing and observation apparatus
#23Bulk deposition for tilted mill protection
#24Alignment marking for rock sample analysis
#25FIB-SEM array tomography
#26Circuit tracing using a focused ion beam
#27Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage medium
#28Digital rock analysis systems and methods with multiphase flow REV determination
#29Charged-particle microscope device and method for inspecting sample using same
#30Time-of-flight mass spectrometry of surfaces
#31Surface analyzer of object to be measured and analyzing method
#32Quantification method of functional groups of organic layer
#33Isotope ion microscope methods and systems
#34ELECTRON DETECTION SYSTEMS AND METHODS
#35Gas charge container, atom probe apparatus, and method for analyzing hydrogen position in material
#36Micro-sample processing method, observation method and apparatus
#37Method and apparatus for cross-section processing and observation
#38METHOD AND APPARATUS FOR CROSS-SECTION PROCESSING AND OBSERVATION
#39Sample decontamination
#40Time-of-flight mass spectrometry of surfaces
#41Micro-sample processing method, observation method and apparatus
#42Probe-holding apparatus, sample-obtaining apparatus, sample-processing apparatus, sample-processing method and sample-evaluating method
#43Use of ion induced luminescence (IIL) as feedback control for ion implantation
#44Determining dopant information
#45Focused ion beam apparatus and method of preparing/observing sample
#46Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods
#47Ion sources, systems and methods
#48Method and apparatus for analysis of elements in bulk substance
#49Probe-holding apparatus, sample-obtaining apparatus, sample-processing apparatus, sample-processing method and sample-evaluating method
#50Method and apparatus for characterizing a recess located on a surface of a substrate
#51Living cell microbeam directional and quantitative irradiation imaging apparatus and method