168331 ⎘
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups – , or by measuring secondary emission from the material using electron or ion using incident ion beams, e.g. proton beams Measuring secondary ion emission, e.g. secondary ion mass spectrometry [SIMS]
ADAPTIVE COUNT RATE MODULATION TO INCREASE DEPTH PROFILE DYNAMIC RANGE IN SECONDARY ION MASS SPECTROSCOPY
#2Multiple Plasma Ion Source for Inline Secondary Ion Mass Spectrometry
#3Method for evaluating suitability of a pharmaceutical container for lipid-based carrier systems
#4SUBCELLULAR SELF-TRACER ION IMAGING AND LOCALIZATION METHOD OF METAL ELEMENTS
#5MEASUREMENT OF LATERAL DOPANT CONCENTRATION AND DISTRIBUTION IN HIGH ASPECT RATIO TRENCH STRUCTURES
#6METHOD FOR CORRECTING AGE OF COLUMBITE-TANTALITE BY USING DOUBLE-REFERENCE-MATERIALS
#7METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
#8APPLICATION OF TOF-SIMS FOR ANALYSIS OF FORMATION FLUID SAMPLES AND FORMATION ROCK SAMPLES
#9MULTIPLE PLASMA ION SOURCE FOR INLINE SECONDARY ION MASS SPECTROMETRY
#10Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
#11Positive Electrode Active Material, and Positive Electrode and Lithium Secondary Battery Which Include the Same
#12METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
#13JOINT NANOSCALE THREE-DIMENSIONAL IMAGING AND CHEMICAL ANALYSIS
#14Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
#15NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTROMETRY
#16INFORMATION PROCESSING APPARATUS AND CONTROL METHOD FOR INFORMATION PROCESSING APPARATUS
#17Highly selective chromatography-molecular rotational resonance spectroscopy systems and methods
#18Method and device for analysing SIMS mass spectrum data
#19Correlative multimodal chemical imaging via machine learning
#20Pan-sharpening for microscopy
#21Single cell analysis using secondary ion mass spectrometry
#22Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry
#23Joint nanoscale three-dimensional imaging and chemical analysis
#24PHOTOELECTRIC CONVERSION ELEMENT, PHOTOELECTRIC CONVERSION MODULE, AND ELECTRONIC DEVICE
#25High efficiency solar cell and method for manufacturing high efficiency solar cell
#26Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry
#27Inspection system and inspection method to qualify semiconductor structures
#28Charged particle beam irradiation apparatus and control method
#29SiC substrate evaluation method, SiC epitaxial wafer manufacturing method, and SiC epitaxial wafer
#30High efficiency solar cell and method for manufacturing high efficiency solar cell
#31Extraction system for charged secondary particles for use in a mass spectrometer or other charged particle device
#32Extraction system for charged secondary particles for use in a mass spectrometer or other charged particle device
#33Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry
#34Charged particle detector and charged particle beam apparatus
#35SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
#36Secondary ion mass spectroscopic method, mass spectrometer and uses thereof
#37Method for multiplexed sample analysis by photoionizing secondary sputtered neutrals
#38Single cell analysis using secondary ion mass spectrometry
#39Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry
#40Method for characterizing a sample combining an X-ray characterization technique and a secondary ionization mass spectrometry characterization technique
#41Pre-coated surfaces for imaging biomolecules
#42Device for mass spectrometry
#43Method for multiplexed sample analysis by photoionizing secondary sputtered neutrals
#44Digital pore alteration methods and systems
#45Float glass for chemical strengthening
#46DETECTION OF CARIOUS DENTIN TISSUE AND REMOVAL THEREOF BY MEANS OF A DENTAL INSTRUMENT
#47Ion source, ion gun, and analysis instrument
#48Focused ion beam apparatus and method of working sample using the same
#49Mass distribution spectrometry method and mass distribution spectrometer
#50Charged particle beam apparatus
#51Method for a highly sensitive detection and quantification of biomolecules using secondary ion mass spectrometry (SIMS) and related technologies
#52Method of planar imaging on semiconductor chips using focused ion beam
#53METHOD AND APPARATUS FOR PROVIDING BEAMS OF NANODROPLETS FOR HIGH SPUTTERING RATE OF INERT MATERIALS
#54Oxygen diffusion evaluation method of oxide film stacked body
#55Surface analyzer of object to be measured and analyzing method
#56Nonoparticulate assisted nanoscale molecular imaging by mass spectrometery
#57METHOD AND APPARATUS FOR PROVIDING BEAMS OF NANODROPLETS FOR HIGH SPUTTERING RATE OF INERT MATERIALS
#58Time-of-flight spectrometry and spectroscopy of surfaces
#59Sample inspection methods, systems and components
#60Method for a Highly Sensitive Detection and Quantification of Biomolecules Using Secondary Ion Mass Spectrometry (SIMS) and Related Technologies
#61Method of manufacturing an analytical sample and method of analyzing an analytical sample
#62METHOD AND APPARATUS ALLOWING QUANTITATIVE INVESTIGATIONS OF ORGANIC AND INORGANIC SAMPLE BY DECOUPLING THE SPUTTERING PROCESS FROM THE ANALYSIS PROCESS
#63SUBSTRATES AND METHODS FOR CULTURING STEM CELLS
#64Method of manufacturing an analytical sample and method of analyzing an analytical sample
#65Device and method for analyzing an organic sample
#66Method for determining concentration of impurity element
#67Method for Analysis of a Solid Sample
#68Method of manufacturing an analytical sample and method of analyzing an analytical sample
#69Susceptor
#70Methods of manufacturing reference sample substrates for analyzing metal contamination levels
#71Time-of-flight secondary ion mass spectrometer mapping of cells and tissue
#72Method for acquiring information of a biochip using time of flight secondary ion mass spectrometry and an apparatus for acquiring information for the application thereof
#73Statistical methods applied to surface chemistry in minerals flotation
#74Direct detection method for products of cellular metabolism using ToF-SIMS
#75Method and apparatus for in situ depositing of neutral Cs under ultra-high vacuum to analytical ends
#76Method and apparatus for analyzing the composition of an object
#77Method of expeditiously using a focused-beam apparatus to extract samples for analysis from workpieces