CONDUCTIVE FIXATION FOR ELECTRON MICROSCOPY

METHOD FOR INSPECTING SEMICONDUCTOR MANUFACTURING EQUIPMENT USING A WAFER

Method And Device For Localizing Charge Traps In A Crystal Lattice

PHOTOTHERMAL IMAGING DEVICE AND SYSTEM

TECHNOLOGIES FOR PHOTOTHERMAL ACTION-BASED TWO-DIMENSIONAL INFRARED SPECTROSCOPY WITH HIGH SPATIAL RESOLUTION

SCANNING PROBE MICROSCOPE AND SAMPLE USED THEREIN

Detection of Probabilistic Process Windows

METHODS FOR FEEDBACK DETECTION OF A MEMS ARRAY

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS AND THEIR USE FOR PROCESS MONITORING AND CONTROL

DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING METHOD

MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD

Method of Dispositioning and Control of a Semiconductor Manufacturing Process

Nano-Mechanical Infrared Spectroscopy System and Method Using Gated Peak Force IR

Nano robotic system for high throughput single cell DNA sequencing

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

Sample, method for manufacturing sample, and method for measuring infrared absorption spectrum

Photothermal imaging device and system

SYSTEM AND METHOD FOR DETERMINING AND/OR PREDICTING UNBIASED PARAMETERS ASSOCIATED WITH SEMICONDUCTOR MEASUREMENTS

DEVICE AND METHOD FOR COMPREHENSIVE CHARACTERIZATION, ANALYSIS, HETERO-GENITY AND PURITY QUANTIFICATION OF EXTRACELLULAR VESICLES

Method for electrically examining electronic components of an integrated circuit

Thermal desorbers

Method and apparatus for identifying sample position in atomic force microscope

Apparatus and method for examining and/or processing a sample

Multifunctional nanoprobes for scanning probe microscopy

Active bimodal AFM operation for measurements of optical interaction

System and method for generating and analyzing roughness measurements and their use for process monitoring and control

Method and apparatus for examining a measuring tip of a scanning probe microscope

Scanning probe microscope with a sample holder fed with electromagnetic wave signals

Detection of probabilistic process windows

Frequency tracking for subsurface atomic force microscopy

System for measuring the absorption of a laser emission by a sample

System and method for generating and analyzing roughness measurements

System and method for predicting stochastic-aware process window and yield and their use for process monitoring and control

System and method for low-noise edge detection and its use for process monitoring and control

Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy

System and method for generating and analyzing roughness measurements and their use for process monitoring and control

Method for SEM-guided AFM scan with dynamically varied scan speed

Apparatus and method for examining and/or processing a sample

System and method for generating and analyzing roughness measurements and their use for process monitoring and control

System and method for generating and analyzing roughness measurements and their use for process monitoring and control

Thermal desorbers

Photothermal imaging device and system

Conductive fixation for electron microscopy

Device integrated with scanning probe for optical nanofocusing and near-field optical imaging

Surface sensitive atomic force microscope based infrared spectroscopy

System and method for generating and analyzing roughness measurements

Method and apparatus for examining a measuring tip of a scanning probe microscope

Multi-axis positioning device

Method for moving and transferring nanowires using tapered hair of diameter on micron range

Frequency modulation detection for photo induced force microscopy

Methods and apparatus for high throughput SEM and AFM for characterization of nanostructured surfaces

Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy

Scanning probe microscope and scanning method using the same

Alignment system and method

System and method for generating and analyzing roughness measurements

System and method for generating and analyzing roughness measurements

System and method for generating and analyzing roughness measurements

Conical nano-carbon material functionalized needle tip and preparation method therefor

Method and apparatus for measuring a size of a crystal grain, and method for fabricating a poly-silicon thin film

Tunnel current control apparatus and tunnel current control method

Characterizing a height profile of a sample by side view imaging

SNOM device using heterodyne detection

Methods and devices for examining an electrically charged specimen surface

Apparatus and method for generating three-dimensional image of polymer solute substance which exists in liquid solvent

Rare earth nitride structure or device and fabrication method

Methods and apparatus for high throughput SEM and AFM for characterization of nanostructured surfaces

Microscope comprising a movable objective-camera system with rolling shutter camera sensor and a multi-color strobe flash and method for scanning microscope slides with proper focus

Method of carrier profiling in semiconductors

Linked micromechanical positioning apparatus for real-time testing and measurement

Method and apparatus for infrared scanning near-field optical microscopy based on photothermal effect

Photothermal imaging device and system

Method and apparatus for sub-diffraction infrared imaging and spectroscopy and complementary techniques

Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view

Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy

Imaging systems and methods using fluorescent nanodiamonds

METHOD AND APPARATUS FOR ANALYZING AND FOR REMOVING A DEFECT OF AN EUV PHOTOMASK

Peakforce photothermal-based detection of IR nanoabsorption

Method and apparatus for chemical and optical imaging with a broadband source

Infrared characterization of a sample using oscillating mode

Tip enhanced laser assisted sample transfer for biomolecule mass spectrometry

Systems and devices for non-destructive surface chemical analysis of samples

Accelerated training of a machine learning based model for semiconductor applications

Sample holder for scanning electron microscopy (SEM) and atomic force microscopy (AFM)

3D profiling system of semiconductor chip and method for operating the same

Method of measuring a topographic profile and/or a topographic image

Methods and devices for examining an electrically charged specimen surface

PeakForce photothermal-based detection of IR nanoabsorption

Apparatus and method for examining a surface of a mask

Method and apparatus for infrared scattering scanning near-field optical microscopy

Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample

Through process flow intra-chip and inter-chip electrical analysis and process control using in-line nanoprobing

Determining a state of a high aspect ratio hole using measurement results from an electrostatic measurement device

Systems and methods for non-destructive surface chemical analysis of samples

Method to obtain absorption spectra from near-field infrared scattering using homo-dyne detection

High heating rate thermal desorption for molecular surface sampling

Fabrication of a malleable lamella for correlative atomic-resolution tomographic analyses

Method and apparatus for direct measurement of the amplitude and/or phase of a molecular vibration

Method and apparatus for automated scanning probe microscopy

Method for measuring and analyzing surface structure of chip or wafer

Scanning probe microscope and measuring method using same

Apparatus and method for correlating images of a photolithographic mask

Probe-based data collection system with adaptive mode of probing

Scanning probe microscope with improved feature location capabilities

AFM-coupled microscale radiofrequency probe for magnetic resonance imaging and spectroscopy

Stress analysis of 3-D structures using tip-enhanced Raman scattering technology

Tuning-fork based near field probe for spectral measurement, near-field microscope using the same, and spectral analysis method using near-field microscope

Probe tip heating assembly

Systems and methods for laser assisted sample transfer to solution for chemical analysis

AFM-coupled microscale radiofrequency probe for magnetic resonance imaging and spectroscopy

Apparatus of analyzing a sample and a method for the same

Method and apparatus for analyzing and for removing a defect of an EUV photomask

Substrate measurement apparatus with electron distortion unit

Apparatus and method for investigating an object

Hybrid microprobe for electrochemical and SERS monitoring, scanning and feedback stimulation and the preparation method thereof

Quantitative characterization of metallic and semiconductor single-walled carbon nanotube ratios

Probe having nano-fingers

Methods of manufacturing diamond capsules

High frequency deflection measurement of IR absorption with a modulated IR source

Electronic control and amplification device for a local piezoelectric force measurement probe under a particle beam

Prototyping station for atomic force microscope-assisted deposition of nanostructures

Multiple modulation heterodyne infrared spectroscopy

Inspection instrument

High frequency deflection measurement of IR absorption

AFM measuring method and system thereof

Systems and methods for laser assisted sample transfer to solution for chemical analysis

Spatially resolved thermal desorption/ionization coupled with mass spectrometry

High frequency deflection measurement of IR absorption

High frequency deflection measurement of IR absorption

Indenter assembly

Dynamic power control, beam alignment and focus for nanoscale spectroscopy

Dynamic power control for nanoscale spectroscopy

METHOD FOR IDENTIFYING INDIVIDUAL VIRUSES IN A SAMPLE

Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

Optical microscope

Device and method for an atomic force microscope for the study and modification of surface properties

Actuatable capacitive transducer for quantitative nanoindentation combined with transmission electron microscopy

Minute measuring instrument for high speed and large area and method thereof

Method and apparatus for the combined analysis of a sample with objects to be analyzed

Near-field Raman spectroscopy

Protein microscope

Methods of polarization engineering and their applications

Pump probe measuring device and scanning probe microscope apparatus using the device

Infrared imaging using thermal radiation from a scanning probe tip

Nanotip repair and characterization using field ion microscopy

Tool tips with scanning probe microscopy and/or atomic force microscopy applications

Field-aided preferential deposition of precursors

High frequency deflection measurement of IR absorption

Method and system for near-field spectroscopy using targeted deposition of nanoparticles

Prototyping station for atomic force microscope-assisted deposition of nanostructures

Ionization method and apparatus using electrospray

High frequency deflection measurement of IR absorption

MEMS nanoindenter

Scanning ion probe systems and methods of use thereof

Scanning probe microscope system

Diamond structures as fuel capsules for nuclear fusion

Positioning mechanism and microscope using the same

Spin microscope based on optically detected magnetic resonance

Protein microscope

Methods and systems of performing device failure analysis, electrical characterization and physical characterization

High speed measurement, analysis and imaging systems and methods for length scales from meter to sub-nanometer

Cantilever holder and scanning probe microscope including the same

Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography

Quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope

Actuatable capacitive transducer for quantitative nanoindentation combined with transmission electron microscopy

Scanning ion probe systems and methods of use thereof

Near-field polarized-light measurement apparatus

Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements

Planar resonant tunneling sensor and method of fabricating and using the same

Method and apparatus for localized infrared spectrocopy and micro-tomography using a combination of thermal expansion and temperature change measurements

Integrated measuring instrument

Near-field film-thickness measurement apparatus

Surface texture measuring instrument

Method for locally highly resolved, mass-spectroscopic characterization of surfaces using scanning probe technology

Integrated EWP-STM spin resonance microscope

Photomask defect correction method employing a combined device of a focused electron beam device and an atomic force microscope

Shape measuring apparatus, shape measuring method, and aligning method

Method and apparatus for measuring depth of holes formed on a specimen

Measurement device for electron microscope

Delay time modulation femtosecond time-resolved scanning probe microscope apparatus

Dual stage instrument for scanning a specimen

Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same

Method and apparatus for infrared scattering scanning near-field optical microscopy