Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices; Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope Optical microscopes coupled with SPM
METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING PROBE MICROSCOPY DEVICE, AND A COMPUTER PROGRAM PRODUCT FOR PERFORMING SAID METHOD
#2METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICE
#3SCANNING PROBE MICROSCOPE
#4NANOSCALE SCANNING SENSORS
#5METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
#6Automated optimization of AFM light source positioning
#7Nanoscale scanning sensors
#8Automated optimization of AFM light source positioning
#9OPTICAL OUTPUT SYSTEM, MEASUREMENT SYSTEM, OPTICAL PUMP-PROBE SCANNING TUNNELING MICROSCOPE SYSTEM, COMPUTING DEVICE, PROGRAM, AND COMPUTING METHOD
#10Method and apparatus for measuring magnetic field strength
#11Multiple integrated tips scanning probe microscope
#12Scanning probe nanotomograph comprising an optical analysis module
#13SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
#14Method and apparatus for positioning a micro- or nano-object under visual observation
#15Method and apparatus for measuring magnetic field strength
#16Multiple integrated tips scanning probe microscope
#17Characterizing a height profile of a sample by side view imaging
#18Apparatus and method for generating three-dimensional image of polymer solute substance which exists in liquid solvent
#19OBSERVATION METHOD USING COMPOUND MICROSCOPE INCLUDING AN INVERTED OPTICAL MICROSCOPE AND ATOMIC FORCE MICROSCOPE, PROGRAM TO PERFORM OBSERVATION METHOD, AND COMPOUND MICROSCOPE
#20NANOSCALE SCANNING SENSORS
#21Fiber-coupled metal-tip near-field chemical imaging spectroscopy
#22Vibration damping connector and use of the vibration damping connector
#23Sample vessel retention structure for scanning probe microscope
#24Method and apparatus for sub-diffraction infrared imaging and spectroscopy and complementary techniques
#25Scanning probe microscope
#26Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppression
#27Nanoantenna scanning probe tip, and fabrication methods
#28Measuring device and method for determining mass and/or mechanical properties of a biological system
#29ATOMIC FORCE MICROSCOPE MEASURING DEVICE
#30Systems and methods for non-destructive surface chemical analysis of samples
#31Scanning probe microscope
#32Multiple Integrated Tips Scanning Probe Microscope
#33Scanning mechanism and scanning probe microscope
#34System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing
#35Raman microscope and electron microscope analytical system
#36Nanoscale scanning sensors
#37Nanoindenter multimodal microscope objective for mechanobiology
#38Scanning probe microscope
#39Compound microscope
#40Analysis of ex vivo cells for disease state detection and therapeutic agent selection and monitoring
#41Scanning probe microscope
#42Integrated microscope and related methods and devices
#43Method for positioning an atomic force microscopy tip in a cell
#44Fast-scanning SPM scanner and method of operating same
#45System for mechanical characterization of materials and biological samples in the sub-millinewton force range
#46Inspection instrument
#47SCANNED PROBE MICROSCOPE WITHOUT INTERFERENCE OR GEOMETRIC CONSTRAINT FOR SINGLE OR MULTIPLE PROBE OPERATION IN AIR OR LIQUID
#48Atomic force microscope manipulation of living cells
#49Probe alignment tool for the scanning probe microscope
#50Analysis of ex vivo cells for disease state detection and therapeutic agent selection and monitoring
#51Scanning probe microscope having improved optical access
#52Apparatus and method for examining a specimen by means of probe microscopy
#53Self displacement sensing cantilever and scanning probe microscope
#54Method for examining a measurement object, and apparatus
#55Fast-scanning SPM scanner and method of operating same
#56Devices for probe microscopy
#57Scanning probe microscope fine-movement mechanism and scanning probe microscope using same
#58Scanning Microscope With Shape Correction Means
#59Scanning probe microscope and sample observing method using this and semiconductor device production method
#60Compound microscope
#61Compound scanning probe microscope
#62Scanning probe microscope and molecular structure change observation method