ClassID:

171154

G01Q30/10 - CPC Classification

Classification description:

Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices; Means for establishing or regulating a desired environmental condition within a sample chamber Thermal environment

Recent Application in this class:
#1
20250290949
2025-09-18

Heat Dissipating AFM Probe

#2
20250224316
2025-07-10

FROZEN SOLUTION SAMPLE PREPARATION DEVICE APPLICABLE TO ULTRA-HIGH VACUUM SYSTEM

#3
20240272196
2024-08-15

Scattering-type scanning near-field optical microscopy with Akiyama piezo-probes

#4
20230176088
2023-06-08

DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD

#5
20220057430
2022-02-24

Scanning probe microscope, scan head and method

#6
20210325429
2021-10-21

Initiating and monitoring the evolution of single electrons within atom-defined structures

#7
20200249256
2020-08-06

Initiating and monitoring the evolution of single electrons within atom-defined structures

#8
20200166540
2020-05-28

Low drift system for a metrology instrument

#9
20190317125
2019-10-17

MICROSCOPY SAMPLE STAGE FOR GAS HYDRATE TESTS AND TEMPERATURE AND PRESSURE CONTROLLING SYSTEM OF THE STAGE

#10
20190310283
2019-10-10

Cryogenic cooling system

#11
20190219609
2019-07-18

Scanning probe microscope combined with a device for acting on a probe and a specimen

#12
20190219608
2019-07-18

Scanning probe nanotomograph comprising an optical analysis module

#13
20190035136
2019-01-31

Apparatus and method for generating three-dimensional image of polymer solute substance which exists in liquid solvent

#14
20170336188
2017-11-23

Surface measurement probe

#15
20170168089
2017-06-15

Modular atomic force microscope with environmental controls

#16
20160282243
2016-09-29

Structure for achieving dimensional stability during temperature changes

#17
20150338438
2015-11-26

Modular atomic force microscope with environmental controls

#18
20150074859
2015-03-12

Low drift scanning probe microscope

#19
20140326707
2014-11-06

Probe tip heating assembly

#20
20130227970
2013-09-05

Device for the light stimulation and cryopreservation of biological samples

#21
20130212750
2013-08-15

Zero thermal expansion, low heat transfer, variable temperature sample assembly for probe microscopy

#22
20130198913
2013-08-01

Apparatus for mechanically robust thermal isolation of components

#23
20130037978
2013-02-14

Methods of manufacturing diamond capsules

#24
20110239336
2011-09-29

Low drift scanning probe microscope

#25
20110174797
2011-07-21

CANTILEVER HEATING MECHANISM, AND A CANTILEVER HOLDER AND CANTILEVER HEATING METHOD THAT USE THE SAME

#26
20100263097
2010-10-14

Method for examining a sample

#27
20100089069
2010-04-15

Low temperature device with low-vibration sample holding device

#28
20100031403
2010-02-04

Heat Coupling Device

#29
20090151434
2009-06-18

Apparatus and method using a disk drive slider and/or a peltier plate in an atomic force microscope

#30
20080256850
2008-10-23

Diamond structures as fuel capsules for nuclear fusion

#31
20080072665
2008-03-27

Device and method for scanning probe microscopy

#32
20070194225
2007-08-23

Coherent electron junction scanning probe interference microscope, nanomanipulator and spectrometer with assembler and DNA sequencing applications

#33
20070029480
2007-02-08

Integrated electron beam tip and sample heating device for a scanning tunneling microscope