171153 ⎘
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for establishing or regulating a desired environmental condition within a sample chamber
Sub-classes:DISCHARGE MEMBER FOR ANALYSIS
#2Sealed AFM cell
#3Device and method for scanning probe microscopy
#4Scanning-type probe microscope
#5Atomic force microscope tip holder for imaging in liquid