171155 ⎘
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices; Means for establishing or regulating a desired environmental condition within a sample chamber Fluid environment
Sub-classes:Force microscope with helium atmosphere
#2Apparatus and method for generating three-dimensional image of polymer solute substance which exists in liquid solvent
#3Modular atomic force microscope with environmental controls
#4Scanning probe microscope
#5Atomic force microscope drying system and atomic force microscope
#6Modular atomic force microscope with environmental controls
#7APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPY
#8Sealed AFM cell
#9Fluid delivery for scanning probe microscopy
#10Inert gas delivery system for electrical inspection apparatus
#11Method and apparatus for nanomechanical measurement using an atomic force microscope
#12Method of studying a sample in an ETEM
#13Scanning tunneling microscope assembly, reactor, and system
#14Inert gas delivery system for electrical inspection apparatus
#15Method for measuring the force interaction that is caused by a sample
#16FLUID DELIVERY FOR SCANNING PROBE MICROSCOPY
#17Method for examining a sample
#18Atomic force microscopy probe
#19Cantilever evaluation system, cantilever evaluation method, and cantilever evaluation program
#20Fluid delivery for scanning probe microscopy
#21Fluid delivery for scanning probe microscopy
#22Scanning probe microscope and measuring method by means of the same