171157 ⎘
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices; Means for establishing or regulating a desired environmental condition within a sample chamber Vacuum environment
KITS, SYSTEMS, AND METHODS FOR TRANSFERRING SAMPLES BETWEEN VACUUM INSTRUMENTS
#2FROZEN SOLUTION SAMPLE PREPARATION DEVICE APPLICABLE TO ULTRA-HIGH VACUUM SYSTEM
#3DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD
#4MICROSCOPY SAMPLE STAGE FOR GAS HYDRATE TESTS AND TEMPERATURE AND PRESSURE CONTROLLING SYSTEM OF THE STAGE
#5Apparatus and method for generating three-dimensional image of polymer solute substance which exists in liquid solvent
#6High magnetic field scanning probe microscope employing liquid helium-free room-temperature bore superconducting magnet
#7Sample vessel retention structure for scanning probe microscope
#8Scanning probe microscope
#9APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPY
#10Scanning tunneling microscope assembly, reactor, and system
#11NANOROBOT MODULE, AUTOMATION AND EXCHANGE
#12Conductive atomic force microscopy system with enhanced sensitivity and methods of using such a system