Patents-Review.com
ClassID:

171190 ⎘

G01Q60/54 - CPC Classification

Classification description:

Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof; MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes Probes, their manufacture, or their related instrumentation, e.g. holders

Sub-classes:
Recent Application in this class:
#1
20240410962
2024-12-12

METROLOGY DEVICE AND METHOD

 #2
20240044938
2024-02-08

Nanoscale scanning sensors

 #3
20230113008
2023-04-13

A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND A METHOD FOR ITS FABRICATION

 #4
20220413007
2022-12-29

Nanoscale scanning sensors

 #5
20220384715
2022-12-01

Magnetoresistive stack without radiated field, sensor and magnetic mapping system comprising such a stack

 #6
20220065895
2022-03-03

Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample

 #7
20180246143
2018-08-30

NANOSCALE SCANNING SENSORS

 #8
20180136253
2018-05-17

Cantilever for a scanning type probe microscope

 #9
20170356932
2017-12-14

Micro magnetic trap and process for evaluating forces with pico Newton resolution

 #10
20170212146
2017-07-27

Resonance suppression structure of a wideband near-field magnetic probe and a construction method thereof

 #11
20160109478
2016-04-21

Magnetic field value measuring device and method for measuring magnetic field value

 #12
20150323562
2015-11-12

MAGNETIC PROFILE MEASURING DEVICE AND METHOD FOR MEASURING MAGNETIC PROFILE FOR DIRECT-CURRENT (DC) MAGNETIC FIELD

 #13
20150253355
2015-09-10

Nanoscale scanning sensors

 #14
20140218016
2014-08-07

Magnetic profile measuring device and method for measuring magnetic profile for alternating-current magnetic field

 #15
20130263332
2013-10-03

INSPECTION APPARATUS AND METHOD FOR A MAGNETIC HEAD

 #16
20130174302
2013-07-04

Magnetic field observation device and magnetic field observation method

 #17
20130063139
2013-03-14

METHOD AND ITS APPARATUS FOR INSPECTING A MAGNETIC HEAD DEVICE

 #18
20120291161
2012-11-15

Cantilever for magnetic force microscope and method of manufacturing the same

 #19
20120121935
2012-05-17

PROBE, METHOD FOR MANUFACTURING PROBE, PROBE MICROSCOPE, MAGNETIC HEAD, METHOD FOR MANUFACTURING MAGNETIC HEAD, AND MAGNETIC RECORDING/REPRODUCING DEVICE

 #20
20120079636
2012-03-29

Magnetic sensor and scanning microscope

 #21
20120079632
2012-03-29

METHOD TO MEASURE 3 COMPONENT OF THE MAGNETIC FIELD VECTOR AT NANOMETER RESOLUTION USING SCANNING HALL PROBE MICROSCOPY

 #22
20110061139
2011-03-10

METHOD TO MEASURE 3 COMPONENT OF THE MAGNETIC FIELD VECTOR AT NANOMETER RESOLUTION USING SCANNING HALL PROBE MICROSCOPY

 #23
20110030109
2011-02-03

Surface state measuring device, and surface state measuring method using the device

 #24
20100205699
2010-08-12

Magnetic device inspection apparatus and magnetic device inspection method

 #25
20100154088
2010-06-17

Magnetic sensor and scanning microscope

 #26
20070268016
2007-11-22

Apparatus for detecting magnetic signals and signals of electric tunneling

 #27
20070235340
2007-10-11

Cantilever probes for nanoscale magnetic and atomic force microscopy

 #28
20070204681
2007-09-06

Carbon thin line probe

 #29
20070014148
2007-01-18

Methods and systems for attaching a magnetic nanowire to an object and apparatuses formed therefrom

 #30
20060163767
2006-07-27

Plastic cantilevers for force microscopy

 #31
20060150720
2006-07-13

Probe for a scanning microscope

 #32
20060138077
2006-06-29

Method of making an angled tip for a scanning force microscope

 #33
20060042364
2006-03-02

Angled tip for a scanning force microscope

 #34
20050241375
2005-11-03

Cantilever probes for nanoscale magnetic and atomic force microscopy

 #35
20050211915
2005-09-29

Probe for an atomic force microscope and method for making such a probe

 #36
20050206376
2005-09-22

High frequency scanning SQUID microscope and method of measuring high frequency magnetic fields

 #37
20050174130
2005-08-11

Spatially resolved electromagnetic property measurement

 #38
20050151536
2005-07-14

Magnetic carbon nanotube

 #39
20050057248
2005-03-17

Hybrid squid microscope with magnetic flux-guide for high resolution magnetic and current imaging by direct magnetic field sensing

 #40
20050017171
2005-01-27

Probe structures incorporating nanowhiskers, production methods thereof and methods of forming nanowhiskers