Cantilever for a scanning type probe microscope

Magnetic field value measuring device and method for measuring magnetic field value

Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus

Magnetic force microscope and magnetic field observation method using same

Cantilever for magnetic force microscope and method of manufacturing the same

PROBE SYSTEM COMPRISING AN ELECTRIC-FIELD-ALIGNED PROBE TIP AND METHOD FOR FABRICATING THE SAME

Magnetic field sensor device for direct magnetic field imaging and method of fabrication thereof

Magnetic device inspection apparatus and magnetic device inspection method

Probes for enhanced magnetic force microscopy resolution

Method and device for analyzing distribution of coercive force in vertical magnetic recording medium using magnetic force microscope

Probe system comprising an electric-field-aligned probe tip and method for fabricating the same

Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubes

Method of forming pointed structures

Probe for a scanning microscope

Probe for an atomic force microscope and method for making such a probe

Method and apparatus for tunable magnetic force interaction in a magnetic force microscope

Scanning probe sensor with a ferromagnetic fluid

Methods for referencing related magnetic head microscopy scans to reduce processing requirements for high resolution imaging