CASSETTE FOR HOLDING A PROBE

A PROBE CASSETTE FOR STORING, TRANSPORTING AND HANDLING ONE OR MORE PROBE DEVICES FOR A PROBE BASED SYSTEM

Detection Device for Scanning Probe Microscope

Probe, method of manufacturing a probe and scanning probe microscopy system

METHOD FOR OBTAINING CHARACTERISTICS OF SURFACE TO BE MEASURED, BY USING INCLINED TIP, ATOMIC FORCE MICROSCOPE FOR PERFORMING METHOD, AND COMPUTER PROGRAM STORED IN STORAGE MEDIUM IN ORDER TO PERFORM METHOD

Probe cassette for holding a probe in storage for use in a scanning probe microscope

Surface analysis device

Probe chip, scan head, scanning probe microscopy device and use of a probe chip

Chip carrier exchanging device and atomic force microscopy apparatus having same

Handling device for handling a measuring probe

Z-position motion stage for use in a scanning probe microscopy system, scan head and method of manufacturing

Multi-axis positioning device

Atomic force microscope probes and methods of manufacturing probes

Numerically controlled rotary probe switching device based on environment-controllable atomic force microscope

Method of positioning a carrier on a flat surface, and assembly of a carrier and a positioning member

SCANNING PROBE MICROSCOPY SYSTEM, AND METHOD FOR MOUNTING AND DEMOUNTING A PROBE THEREIN

Multiple integrated tips scanning probe microscope with pre-alignment components

Nozzle inspection method and apparatus

Microfluidic cell for atomic force microscopy

Probe assembly and testing device

Scanning head of scanning probe microscope

Scanning probe microscopy utilizing separable components

Scanning probe microscope

Device and method for measuring and/or modifying surface features on a surface of a sample

Top-cover for a controlled environmental system, top-cover-set and controlled environmental system compatible with probe based techniques and procedure to control the environment for a sample

Microfabricated optical probe

Scanning probe microscopy system for mapping high aspect ratio nanostructures on a surface of a sample

Probe holding table and medical device

Probe system and method for receiving a probe of a scanning probe microscope

Detection device having attached probe

Method of positioning a carrier on a flat surface, and assembly of a carrier and a positioning member

System and method of performing scanning probe microscopy on a substrate surface

Fixing mechanism actuatable without a tool and which fixes a measuring probe in a detachable manner for a scanning probe microscope

Cantilever attachment fitting and scanning probe microscope provided therewith

Probe and sample exchange mechanism

Instrument changing assembly and methods

Scanning probe microscope

Measurement of surface energy components and wettability of reservoir rock utilizing atomic force microscopy

MICROSCOPE OBJECTIVE MECHANICAL TESTING INSTRUMENT

Scanning probe microscope and method of operating the same

Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof

Probe module, method for making and use of same

Leveling apparatus and atomic force microscope including the same

Sealed AFM cell

High throughout reproducible cantilever functionalization

Inert gas delivery system for electrical inspection apparatus

Scanning probe microscopy cantilever comprising an electromagnetic sensor

Probe head scanning probe microscope including the same

Probe assembly for a scanning probe microscope

Mount for a scanning probe sensor package, scanning probe sensor package, scanning probe microscope and method of mounting or dismounting a scanning probe sensor package

Scanning probe microscope with compact scanner

Inert gas delivery system for electrical inspection apparatus

Metrology probe and method of configuring a metrology probe

Multifunctional scanning probe microscope

CANTILEVER HEATING MECHANISM, AND A CANTILEVER HOLDER AND CANTILEVER HEATING METHOD THAT USE THE SAME

Probe arrangement for exchanging in a controllable way liquids with micro-sized samples of material like biological cells

Low temperature device with low-vibration sample holding device

Scanning probe microscope with automatic probe replacement function

SCANNING PROBE MICROSCOPE WITH TILTED SAMPLE STAGE

Cantilever with pivoting actuation

Measuring device with daisy type cantilever wheel

Probe tip assembly for scanning probe microscopes

Scanning probe microscopy inspection and modification system

Scanning probe microscope with automatic probe replacement function

Cantilever holder and scanning probe microscope including the same

Scanning probe microscopy inspection and modification system

Atomic force microscope

Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same

SELF-ALIGNING SCANNING PROBES FOR A SCANNING PROBE MICROSCOPE

Methods of imaging in probe microscopy

Probe replacement method for scanning probe microscope

Probe module with integrated actuator for a probe microscope

MICROMECHANICAL SYSTEM

Object inspection and/or modification system and method

Overlay measurement methods with firat based probe microscope

Scanning probe microscopy inspection and modification system

Beam tracking system for scanning-probe type atomic force microscope

Method and apparatus of manipulating a sample

Cantilever holder and scanning probe microscope

Scanning probe microscope using a surface drive actuator to position the scanning tip

Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder

Environmental cell for a scanning probe microscope

Balanced momentum probe holder

Method and apparatus for removing and/or preventing surface contamination of a probe

Scanning probe microscopy inspection and modification system

Method and apparatus for manipulating a sample

Hybrid squid microscope with magnetic flux-guide for high resolution magnetic and current imaging by direct magnetic field sensing

Object inspection and/or modification system and method

Probe mounting device for a scanning probe microscope

VCSEL-based resonant-cavity-enhanced atomic force microscopy active optical probe

Actuators for securing probes in a scanning probe microscope