171198 ⎘
General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group Probe characteristics
Sub-classes:APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORCE MICROSCOPE
#2METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#3SCANNING PROBE MICROSCOPE
#4METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING PROBE MICROSCOPY DEVICE, AND A COMPUTER PROGRAM PRODUCT FOR PERFORMING SAID METHOD
#5METHODS AND DEVICES FOR EXTENDING A TIME PERIOD UNTIL CHANGING A MEASURING TIP OF A SCANNING PROBE MICROSCOPE
#6APPARATUS AND METHOD FOR IDENTIFYING TARGET POSITION IN ATOMIC FORCE MICROSCOPE
#7METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#8Detection Device for Scanning Probe Microscope
#9NANOSCALE IMAGING SYSTEMS AND METHODS THEREOF
#10Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope
#11Coated active cantilever probes for use in topography imaging in opaque liquid environments, and methods of performing topography imaging
#12Apparatus and method for a scanning probe microscope
#13Method and apparatus for examining a measuring tip of a scanning probe microscope
#14Systems and methods for mechanosynthesis
#15Modular scanning probe microscope head
#16Systems and methods for mechanosynthesis
#17Scanning probe microscope
#18Method and apparatus for examining a measuring tip of a scanning probe microscope
#19Apparatus and method for a scanning probe microscope
#20Data processing device for scanning probe microscope
#21Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope
#22SCANNING PROBE MICROSCOPE
#23MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND APPLICATIONS
#24Microfabricated optical probe
#25Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus
#26Automated atomic force microscope and the operation thereof
#27Nanotube based transistor structure, method of fabrication and uses thereof
#28Probe unit for test tools and method of manufacturing the same
#29Automated atomic force microscope and the operation thereof
#30Scanning probe microscope
#31Measurement of surface energy components and wettability of reservoir rock utilizing atomic force microscopy
#32Miniaturized cantilever probe for scanning probe microscopy and fabrication thereof
#33Motion sensor integrated nano-probe N/MEMS apparatus, method, and applications
#34AFM fluid delivery/liquid extraction surface sampling/electrostatic spray cantilever probe
#35Sensor for low force-noise detection in liquids
#36Indented Mold Structures For Diamond Deposited Probes
#37Characterization structure for an atomic force microscope tip
#38CHEMICAL SENSOR WITH OSCILLATING CANTILEVERED PROBE
#39Microprobe, measurement system and method
#40Method of manufacturing an SPM probe with a scanning tip and with an alignment aid located opposite the scanning tip
#41Chemical sensor with oscillating cantilevered probe
#42Semiconductor probe and method of writing and reading information using the same
#43Method and apparatus of manipulating a sample
#44Method and apparatus for manipulating a sample
#45Chemical sensor with oscillating cantilevered probe and mechanical stop
#46Systems and methods for mechanosynthesis