ALIGNMENT TIP FOR A CHARACTERIZATION DEVICE

METHOD OF AND SCANNING PROBE MICROSCOPY SYSTEM FOR MEASURING A TOPOGRAPHY OF A SIDE WALL OF A STRUCTURE ON A SURFACE OF A SUBSTRATE

METHOD OF MEASURING FEATURE WITH PROBE MICROSCOPE

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

High Frequency Passivated AFM Cantilever and Method of Fabrication

Atomic Force Microscopy Probe with Tilted Tip and Method of Fabrication Thereof

RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MICROSCOPY/LITHOGRAPHY TIPS

Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device

Self-packing three-arm thermal scanning probe for micro-nano manufacturing

CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEMPERATURE

METHOD FOR MEASURING, BY MEASUREMENT DEVICE, CHARACTERISTICS OF SURFACE OF OBJECT TO BE MEASURED, ATOMIC FORCE MICROSCOPE FOR PERFORMING SAME METHOD, AND COMPUTER PROGRAM STORED IN STORAGE MEDIUM TO PERFORM SAME METHOD

METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

Probe, method of manufacturing a probe and scanning probe microscopy system

SYSTEMS AND METHODS FOR MANUFACTURING NANO-ELECTRO-MECHANICAL-SYSTEM PROBES

A DIAMOND SCANNING ELEMENT, ESPECIALLY FOR IMAGING APPLICATION, AND A METHOD FOR ITS FABRICATION

METHOD FOR OBTAINING CHARACTERISTICS OF SURFACE TO BE MEASURED, BY USING INCLINED TIP, ATOMIC FORCE MICROSCOPE FOR PERFORMING METHOD, AND COMPUTER PROGRAM STORED IN STORAGE MEDIUM IN ORDER TO PERFORM METHOD

Large radius probe

Metrology probe with built-in angle and method of fabrication thereof

Method of providing a MEMS device comprising a pyramidal protrusion, and a mold

TIP-ENHANCED RAMAN SPECTROSCOPE SYSTEM

Scanning Probe and Electron Microscope Probes and Their Manufacture

Cantilever, ultrasound acoustic microscopy device comprising the cantilever, method of using the same and lithographic system including the same

PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD

Atomic force microscopy cantilever, system and method

Scanning probe having micro-tip, method and apparatus for manufacturing the same

Systems and methods for manufacturing nano-electro-mechanical-system probes

SYSTEM FOR SCANNING PROBE MICROSCOPY APPLICATIONS AND METHOD FOR OBTAINING SAID SYSTEM

METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY

Probe chip, scan head, scanning probe microscopy device and use of a probe chip

Photodetector for scanning probe microscope

Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips

Large radius probe

Method and tip substrate for scanning probe microscopy

AFM with suppressed parasitic signals

Method for providing a probe device for scanning probe microscopy

ATOMIC FORCE MICROSCOPY CANTILEVER, SYSTEM AND METHOD

Systems and methods for manufacturing nano-electro-mechanical-system probes

Atomic force microscope probes and methods of manufacturing probes

Scanning probe having micro-tip, method and apparatus for manufacturing the same

Tip-enhanced Raman spectroscope system

Large radius probe

Scanning probe and electron microscope probes and their manufacture

Methods for designing and processing a microcantilever-based probe with an irregular cross section applied in an ultra-low friction coefficient measurement at a nanoscale single-point contact

Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips

Conical nano-carbon material functionalized needle tip and preparation method therefor

AFM with suppressed parasitic signals

Microfluidic cell for atomic force microscopy

Probe assembly and testing device

Scanning head of scanning probe microscope

Metallic device for scanning probe microscopy and method for manufacturing same

Scanning probe and electron microscope probes and their manufacture

Cantilever for atomic force microscopy

Method of fabricating nano-scale structures on the edge and nano-scale structures fabricated on the edge using the method

Compact probe for atomic-force microscopy and atomic-force microscope including such a probe

Cantilever for a scanning type probe microscope

Metallic device for scanning near-field optical microscopy and spectroscopy and method for manufacturing same

Miniaturized and compact probe for atomic force microscopy

Scanning probe and electron microscope probes and their manufacture

In situ tribometer and methods of use

Dynamic sweep-plow microcantilever device and methods of use

Probe actuation system with feedback controller

Probe system with multiple actuation locations

Systems and methods for manufacturing nano-electro-mechanical-system probes

Scanning probe microscope

Method for making a 3D nanostructure having a nanosubstructure, and an insulating pyramid having a metallic tip, a pyramid having nano-apertures and horizontal and/or vertical nanowires obtainable by this method

Interferometric atomic-force microscopy device and method

System for fabricating nanoscale probe and method thereof

Scanned probe microscopy (SPM) probe having angled tip

System and method for high-speed atomic force microscopy with switching between two feedback loops

Feedback controller in probe microscope utilizing a switch and a inverter

Probe shape evaluation method for a scanning probe microscope

Method of determining a spring constant of a cantilever and scanning probe microscope using the method

Metal tip for scanning probe applications and method of producing the same

Quantitative analysis of MRNA and protein expression

Video rate-enabling probes for atomic force microscopy

Scanning probe having integrated silicon tip with cantilever

CANTILEVER-BASED OPTICAL INTERFACE FORCE MICROSCOPE

Method and apparatus for micromachines, microstructures, nanomachines and nanostructures

Video rate-enabling probes for atomic force microscopy

Cantilever-based optical fiber probe interfacial force microscope for partial immersion in liquid

Wear-less operation of a material surface with a scanning probe microscope

Cantilever with paddle for operation in dual-frequency mode

Method to reduce wedge effects in molded trigonal tips

Apparatus and method for investigating surface properties of different materials

Method for making a 3D nanostructure having a nanosubstructure, and an insulating pyramid having a metallic tip, a pyramid having nano-apertures and horizontal and/or vertical nanowires obtainable by this method

Scanning probe microscope

Probe and cantilever

DUAL-TIP CANTILEVER

Method and Apparatus for Micromachines, Microstructures, Nanomachines and Nanostructures

HEATED CANTILEVER

SCANNING PROBE EPITAXY

Piezoresistor height sensing cantilever

Nanomanufacturing devices and methods

Method for producing tapered metallic nanowire tips on atomic force microscope cantilevers

SCANNING PROBE EPITAXY

METHOD OF NANOSCALE PATTERNING USING BLOCK COPOLYMER PHASE SEPARATED NANOSTRUCTURE TEMPLATES

Tool tips with scanning probe microscopy and/or atomic force microscopy applications

Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof

SPM probe with shortened cantilever

Method of fabricating a probe device for a metrology instrument and a probe device produced thereby

Dual tip atomic force microscopy probe and method for producing such a probe

Diamond film deposition and probes

Rocking Y-shaped probe for critical dimension atomic force microscopy

PROBE AND CANTILEVER

Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same

Video rate-enabling probes for atomic force microscopy

AFM probe with variable stiffness

Cantilever with carbon nano-tube for AFM

Microcoaxial probes made from strained semiconductor bilayers

Scanning probe microscope system

Optically controllable device

Probe microscope and measuring method using probe microscope

Cantilever assembly

Cantilever and cantilever manufacturing method

Probe for scanning probe microscope and method of producing the same

Method of fabricating resistive probe having self-aligned metal shield

Semiconductor probe having resistive tip with low aspect ratio and method of fabricating the same

Dual tip atomic force microscopy probe and method for producing such a probe

Probe with embedded heater for nanoscale analysis

Processing probe, processing apparatus, and method of manufacturing the processing probe

Cantilever

Probe for a scanning probe microscope and method for fabricating same

Method of manufacturing semiconductor probe having resistive tip

MEMS differential actuated nano probe and method for fabrication

Probes for use in scanning probe microscopes and methods of fabricating such probes

Near field scanning microscope probe and method for fabricating same

Scanning probe microscope probe with integrated capillary channel

Method and apparatus for micromachines, microstructures, nanomachines and nanostructures

SPM cantilever and fabricating method thereof

Method for manufacturing a split probe

MEMS differential actuated nano probe and method for fabrication

Field effect transistor sensor

VCSEL-based resonant-cavity-enhanced atomic force microscopy active optical probe