171226 ⎘
Details of instruments or arrangements of the types included in groups - and; General constructional details; Measuring leads; Measuring probes; Measuring probes; Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins Elastic
Sub-classes:TEST DEVICE AND MANUFACTURING METHOD THEREOF
#2PROBE PIN AND SOCKET
#3PROBE SYSTEM, PROBE CARD, PROBE HEAD AND METHOD FOR TESTING ELECTRONIC DEVICE UNDER TEST INTEGRATED ON A SEMICONDUCTOR WAFER, AND ELECTRONIC DEVICE TESTED BY THE PROBE CARD
#4BATTERY CELL MEASURING DEVICE
#5PROBE FOR PROBE CARD
#6Test Socket for Enhancing Integrated Circuit Testing and Its Manufacturing Method
#7MICROSTRUCTURE INSPECTION DEVICE AND SYSTEM AND USE OF THE SAME
#8ELECTRICALLY CONDUCTIVE CONTACT PIN
#9COMPLIANT TEST PROBE
#10ELECTRONIC TEST DEVICE WITH NEGATIVE-PRESSURE-TYPED CONTACT ALIGNMENTS
#11ELECTRICALLY CONDUCTIVE CONTACT PIN AND INSPECTION APPARATUS COMPRISING THE SAME
#12PROBE AND METHOD FOR MANUFACTURING ELECTRICAL CONNECTION DEVICE
#13PROBE APPARATUS
#14ELECTRICALLY CONDUCTIVE CONTACT PIN AND METHOD FOR MANUFACTURING SAME
#15Metal Plated Conductive Elastomer Sort Probe
#16PROBE PIN AND SOCKET
#17SOCKET
#18Contact Probe with Customizable Geometry and Relative Probe Head
#19ELECTRICAL CONNECTOR
#20ELECTRICAL CONNECTOR
#21PROBE-HEAD FOR ELECTRICAL DEVICE INSPECTION AND MANUFACTURING METHOD THEREOF
#22TEST HEAD
#23PROBING HEAD
#24Detection Mechanism, Wire Positioning Apparatus, And Wire Processing Device
#25ELECTRO-CONDUCTIVE CONTACT PIN AND INSPECTION DEVICE INCLUDING SAME
#26ELASTIC CONTACTOR WITH ENHANCED BONDING
#27INSPECTION METHOD AND INSPECTION DEVICE
#28METAL MOLDED ARTICLE, MANUFACTURING METHOD THEREFOR, AND INSPECTION DEVICE HAVING SAME
#29PROBE PASSING METHOD AND PROBE
#30ELECTRO-CONDUCTIVE CONTACT PIN AND VERTICAL PROBE CARD HAVING SAME
#31PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRONIC DEVICE UNDER TEST INTEGRATED ON A SEMICONDUCTOR WAFER, AND ELECTRONIC DEVICE UNDER TEST TESTED BY THE PROBE CARD
#32PROBE CARD, PROBE HEAD, METHOD FOR MANUFACTURING THE PROBE HEAD, AND ELECTRONIC DEVICE UNDER TEST TESTED BY THE PROBE CARD
#33CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES AND CORRESPONDING PROBE HEAD
#34ELECTRICALLY CONDUCTIVE CONTACT PIN AND INSPECTION DEVICE HAVING SAME
#35PROBE CARD
#36GUIDE MEMBER, INSPECTION DEVICE, AND ELECTRO-CONDUCTIVE CONTACT PIN
#37METAL PRODUCT, METHOD OF MANUFACTURING SAME, AND TEST DEVICE HAVING SAME
#38VERTICAL PROBE CARD
#39SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOARD INTERFACES
#40TEST PIN STRUCTURE
#41VERTICAL PROBE CARD AND OPEN-TYPE PROBE THEREOF
#42Probe Structure and Electronic Device with Probe Structure
#43WAFER INSPECTION SYSTEM
#44CONTACT PROBE
#45CONTACT PROBE
#46METHOD FOR PRODUCING A PROBE CARD
#47METHODS OF REINFORCING PLATED METAL STRUCTURES AND MODULATING MECHANICAL PROPERTIES USING NANO-FIBERS
#48Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making
#49Shielded Probes for Semiconductor Testing, Methods for Using, and Methods for Making
#50ELECTRICALLY CONDUCTIVE CONTACT PIN
#51Methods of Reinforcing Plated Metal Structures and Independently Modulating Mechanical Properties Using Nano-Fibers
#52TEST SOCKET AND METHOD OF MANUFACTURING THE SAME
#53CONTACT PIN AND SOCKET FOR INSPECTION
#54FLEXIBLE CONTACTOR AND METHOD OF MANUFACTURING THE SAME
#55Contact probe for probe heads of electronic devices
#56Probe and elastic structure thereof
#57Contact pins for test sockets and test sockets comprising the same
#58Probe pin having gripping structure
#59Vertical probe pin and a probe card having same
#60PLUNGER AND METHOD OF MANUFACTURING PLUNGER
#61PROBE CARD
#62Contact probe for high-frequency applications with improved current capacity
#63ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE
#64Probe card device and disposable adjustment film thereof
#65Testing device
#66Probing system
#67DETECTION MECHANISM, WIRE POSITIONING APPARATUS, AND WIRE PROCESSING DEVICE
#68Chevron interconnect for very fine pitch probing
#69Probe card device and dual-arm probe
#70Probe card device and self-aligned probe
#71PROBE CARD DEVICE AND FAN-OUT PROBE THEREOF
#72Electro-conductive part protecting member for signal transmission connector
#73PROBE
#74Probe card device
#75Contact and test socket device for testing semiconductor device
#76Contact and test socket device for testing semiconductor device
#77Metal probe structure and method for fabricating the same
#78High-performance probe card in high-frequency
#79Electrical contactor and electrical connecting apparatus
#80Testing apparatus
#81High speed probe card device and rectangular probe
#82Interface element for a testing apparatus of electronic devices and corresponding manufacturing method
#83Contact element system with at least two contact elements having different cross-sectional areas, differently shaped strips in an intermediate region, and a same bending rigidity
#84Test device
#85SHORT CONTACT WITH MULTIFUNCTIONAL ELASTOMER
#86Electrical test probes having decoupled electrical and mechanical design
#87Probe card device and three-dimensional signal transfer structure thereof
#88Probe card device
#89Probe pin and inspection unit
#90Flying probe electronic board tester, and test method thereof
#91Probe card device and rectangular probe thereof
#92Contact for testing semiconductor device, and test socket device therefor
#93Wafer Scale Test Interface Unit: Low Loss and High Isolation Devices and Methods for High Speed and High Density Mixed Signal Interconnects and Contactors
#94Vertical probe card
#95Probe pin, inspection jig, inspection unit and inspection device
#96Electrical probe structure
#97Contact pin and test base having contact pins
#98Kelvin contact finger for high current testing
#99Contact system and contact module
#100Probe card, test apparatus including the probe card, and related methods of manufacturing
#101MEMS probe and test device using the same
#102Test device
#103Test probe and test device using the same
#104Probe card system for testing an integrated circuit
#105Chevron interconnect for very fine pitch probing
#106Contact and test socket device for testing semiconductor device
#107Short contact with multifunctional elastomer
#108METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#109Electrical connector
#110Evaluation apparatus of semiconductor device and method of evaluating semiconductor device using the same
#111Absorption testing apparatus
#112Coaxial probe structure
#113Probe for a contact inspection device
#114Semiconductor micro probe array having compliance
#115Testing head comprising vertical probes for reduced pitch applications
#116Contact probe and corresponding testing head
#117Contact probe
#118Electrical probe with a probe head and contacting pins
#119Testing probe for testing liquid crystal screen and testing device comprising the same
#120Contact probe for testing head
#121TESTING OF ELECTRONIC DEVICES THROUGH CAPACITIVE INTERFACE
#122Method of manufacturing semiconductor device
#123TESTING HEAD COMPRISING VERTICAL PROBES
#124Contact probe for a testing head
#125TESTING UNIT AND TESTING APPARATUS USING THE SAME
#126Probe-pad qualification
#127Testing probe and testing apparatus for ensuring good contact between testing probe and surface of test sample
#128Wafer scale test interface unit and contactors
#129Testing device and assembling method thereof
#130Probe structure
#131FAULT DETECTION FOR A FLEXIBLE PROBE TIP
#132Method for manufacturing semiconductor device
#133Multiplexing, switching and testing devices and methods using fluid pressure
#134Small form factor pressure sensor
#135Electrochemical fabrication process for forming multilayer multimaterial microprobe structures
#136PROBE AND METHOD FOR MANUFACTURING THE PROBE
#137Contact probe
#138Contact and electrical connection testing apparatus using the same
#139Multiple contact probes
#140Test socket with hook-like pin contact edge
#141Test probe coated with conductive elastomer for testing of backdrilled plated through holes in printed circuit board assembly
#142Probe member for pogo pin
#143Current applying device
#144Probe card assembly for testing electronic devices
#145Semiconductor module system having encapsulated through wire interconnect (TWI)
#146Contactor
#147Coaxial probe
#148Fine pitch probes for semiconductor testing, and a method to fabricate and assemble same
#149Fine pitch probes for semiconductor testing, and a method to fabricate and assemble same
#150Apparatus for the automated testing and validation of electronic components
#151Contact inspection device
#152Probe card
#153Multiple contact test probe
#154Laterally driven probes for semiconductor testing
#155Contact and connector
#156Probe and probe card
#157Oblique parts or surfaces
#158High performance compliant wafer test probe
#159Probe module with interleaved serpentine test contacts for electronic device testing
#160METHOD AND APPARATUS FOR IMPLEMENTING PROBES FOR ELECTRONIC CIRCUIT TESTING
#161Method for fabricating stacked semiconductor system with encapsulated through wire interconnects (TWI)
#162Probes with high current carrying capability and laser machining methods
#163Testing head for a test equipment of electronic devices
#164Non-linear vertical leaf spring
#165Interconnection interface using twist pins for testing and docking
#166Fine pitch guided vertical probe array having enclosed probe flexures
#167Connector, probe, and method of manufacturing probe
#168INTERPOSER
#169Test contact system for testing integrated circuits with packages having an array of signal and power contacts
#170SOCKET CONTACT FOR TESTING A SEMICONDUCTOR
#171Method of manufacturing a plurality of miniaturized spring contacts
#172Probe block
#173Elastic contact device for electronic components with buckling columns
#174Electrical test probe and probe assembly with improved probe tip
#175Methods of creating probe structures from a plurality of planar layers
#176Methods of creating probe structures from a plurality of planar layers
#177Probe devices formed from multiple planar layers of structural material with tip regions formed from one or more intermediate planar layers
#178Methods of creating probe structures from a plurality of planar layers
#179Probe Card for Testing Semiconductor Devices and Vertical Probe Thereof
#180Semiconductor module system having stacked components with encapsulated through wire interconnects (TWI)
#181Probes formed from semiconductor region vias
#182Interconnect system
#183High performance compliant wafer test probe
#184Probe and method of manufacturing probe
#185High frequency vertical spring probe
#186Electronic component contactor, apparatus for testing electronic component, and method for testing electronic component
#187Socket for electric component
#188Probe apparatus assembly and method
#189Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes
#190Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes
#191Multi-layer, multi-material fabrication methods for producing micro-scale and millimeter-scale devices with enhanced electrical and/or mechanical properties
#192Testing of electronic devices through capacitive interface
#193Multiple contact probes
#194Vertical micro contact probe having variable stiffness structure
#195System with semiconductor components having encapsulated through wire interconnects (TWI)
#196Method to build robust mechanical structures on substrate surfaces
#197MEMS interconnection pins fabrication on a reusable substrate for probe card application
#198Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes
#199MEMS probe for probe cards for integrated circuits
#200Microprobe Tips and Methods for Making
#201Oblique parts or surfaces
#202Oblique parts or surfaces
#203Fabrication Process for Co-Fabricating a Multilayer Probe Array and a Space Transformer
#204Probe with bi-directional electrostatic actuation
#205Printing of redistribution traces on electronic component
#206LITHOGRAPHIC CONTACT ELEMENTS
#207Probe needle, method for manufacturing the probe needle and method for constructing a three-dimensional structure
#208Probe tip
#209Probe card
#210Method of Forming Electrically Isolated Structures Using Thin Dielectric Coatings
#211Manufacturing method for probe contact
#212Method for fabricating semiconductor component having encapsulated through wire interconnect (TWI)
#213MEMS probe fabrication on a reusable substrate for probe card application
#214Electrochemical Fabrication Process for Forming Multilayer Multimaterial Microprobe Structures
#215Test contact system for testing integrated circuits with packages having an array of signal and power contacts
#216INTERCONNECT SYSTEM
#217Probe card
#218PROBE CARD HAVING REDISTRIBUTED WIRING PROBE NEEDLE STRUCTURE AND PROBE CARD MODULE USING THE SAME
#219Providing an electrically conductive wall structure adjacent a contact structure of an electronic device
#220Probe for testing electrical properties of a test sample
#221Carbon nanotube spring contact structures with mechanical and electrical components
#222Conductive contact and method of manufacturing conductive contact
#223Versatile materials probe
#224Component assembly and alignment
#225Self-releasing spring structures and methods
#226Probe card assembly with carbon nanotube probes having a spring mechanism therein
#227ELECTROCHEMICALLY FABRICATED MICROPROBES
#228Spiral Contactor
#229Conductive contact unit
#230Contact and connecting apparatus
#231CONTACT MADE OF CERAMIC AND ITS MANUFACTURING METHOD
#232Probe card including contactors formed projection portion
#233Probes for a wafer test apparatus
#234Vertical micro probes
#235Contact carriers (tiles) for populating larger substrates with spring contacts
#236PROBE ASSEMBLY WITH ROTARY TIP
#237METHOD TO CREATE FLEXIBLE CONNECTIONS FOR INTEGRATED CIRCUITS
#238Vertical-type electric contactor and manufacture method thereof
#239Adjustable force electrical contactor
#240Electrochemically fabricated microprobes
#241Probe and probe card
#242Rotating contact element and methods of fabrication
#243Method of making lithographic contact elements
#244Cantilever microprobes for contacting electronic components and methods for making such probes
#245Electrochemically fabricated microprobes
#246Versatile materials probe
#247Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same
#248Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same
#249METHOD TO CREATE FLEXIBLE CONNECTIONS FOR INTEGRATED CIRCUITS
#250Method to build robust mechanical structures on substrate surfaces
#251Probe card for inspecting electric properties of an object
#252Apparatus and method for the application of prescribed, predicted, and controlled contact pressure on wires
#253COMPLIANT ELECTRICAL CONTACTS
#254Microelectronic contact structure
#255Electronic components with plurality of contoured microelectronic spring contacts
#256Probe needle, method for manufacturing the probe needle and method for constructing a three-dimensional structure
#257Contactor and test method using contactor
#258Beam assembly method for large area array multi-beam DUT probe cards
#259Semiconductor components having encapsulated through wire interconnects (TWI)
#260Cantilever Microprobes For Contacting Electronic Components and Methods for Making Such Probes
#261Probe For Semiconductor Devices
#262Control system and method of semiconductor inspection system
#263Cantilever microprobes for contacting electronic components and methods for making such probes
#264Cantilever microprobes for contacting electronic components and methods for making such probes
#265Knee probe having increased scrub motion
#266A PROBE ARRAY STRUCTURE AND A METHOD OF MAKING A PROBE ARRAY STRUCTURE
#267Incorporation of Isolation Resistor(s) into Probes using Probe Tip Spring Pins
#268Contact carriers (tiles) for populating larger substrates with spring contacts
#269Method for fabricating a plurality of elastic probes in a row
#270Method for fabricating a plurality of elastic probes in a row
#271Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method
#272Test probe for finger tester and corresponding finger tester
#273Transmission-line spring structure
#274Method for fabricating a plurality of elastic probes in a row
#275Integral probe and method of transmitting signal therethrough
#276Interconnect Cartridge
#277Vertical microprobes for contacting electronic components and method for making such probes
#278Method of forming electrically isolated structures using thin dielectric coatings
#279High density interconnect system for IC packages and interconnect assemblies
#280Method to create flexible connections for integrated circuits
#281Compliant electrical contacts
#282Vertical probe card, probes for vertical probe card and method of making the same
#283Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the same
#284Method for making a planar suspended microstructure, using a sacrificial layer of polymer material and resulting component
#285Semiconductor inspection device and method for manufacturing contact probe
#286Electrochemically fabricated microprobes
#287Oblique parts or surfaces
#288Self-releasing spring structures and methods
#289Apparatus and test device for the application and measurement of prescribed, predicted and controlled contact pressure on wires
#290Microprobe tips and methods for making
#291Electrical connector design and contact geometry and method of use thereof and methods of fabrication thereof
#292Stacked tip cantilever electrical connector
#293Probe for semiconductor devices
#294Incorporation of isolation resistor(s) into probes using probe tip spring pins
#295Transmission-line spring structure
#296Method for forming microelectronic spring structures on a substrate
#297Electrochemically fabricated microprobes
#298Method to build robust mechanical structures on substrate surfaces
#299Fabrication process for co-fabricating multilayer probe array and a space transformer
#300Microprobe tips and methods for making