171227 ⎘
Details of instruments or arrangements of the types included in groups - and; General constructional details; Measuring leads; Measuring probes; Measuring probes; Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins; Elastic Spring-loaded
SEMICONDUCTOR MANUFACTURING DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#2TEST SOCKET AND TEST PROBE OF A MINIATURIZED PACKAGE-ON-PACKAGE DEVICE
#3APPARATUS AND A METHOD FOR TESTING AN ELECTRONIC DEVICE
#4ENERGIZING TEST DEVICE
#5TEST SOCKET
#6Method and System for Determining the Structural Integrity of Materials
#7Interposer Assembly for System-Level Failure Analysis
#8ELECTRICALLY CONDUCTIVE CONTACT PIN
#9PROBE
#10POGO PIN AND TEST SOCKET INCLUDING THE SAME
#11TEST PIN DEVICE
#12PROBE AND SOCKET
#13TEST PROBE DEVICE
#14ELECTRICALLY CONDUCTIVE CONTACT PIN
#15PROBE FOR MEASURING A SIGNAL AND A REFERENCE SIGNAL AND METHOD OF MANUFACTURING A PROBE FOR MEASURING A SIGNAL AND A REFERENCE SIGNAL
#16CONDUCTIVE PIN AND ELECTRONIC DEVICE TEST SOCKET EQUIPPED WITH SAME
#17PROBE UNIT AND CONTACT PROBE
#18TEST PIN WITH POGO PIN AND SURROUNDING COIL SPRING FOR TESTING DEVICES UNDER TEST
#19POGO PIN PROBE AND POGO PIN INCLUDING SAME
#20PROBE PIN FOR INSPECTION APPARATUS
#21PROBE
#22CONTACT PROBE, PROBE HOLDER AND PROBE UNIT
#23PROBE
#24POGO PIN WITH MULTI-STAGE BRUSH SETS
#25REMOVABLE HIGH-SPEED SIGNAL MEASUREMENT DEVICE
#26PROBE HEAD
#27INSPECTION SOCKET
#28CONTACT PIN ASSEMBLY FOR KELVIN TEST AND KELVIN TEST DEVICE COMPRISING SAME
#29Electrical and Optical Semiconductor Probe Head
#30PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF
#31TEST SOCKET AND PROBE WITH STEPPED COLLAR FOR SEMICONDUCTOR INTEGRATED CIRCUITS
#32PROBE AND INSPECTION SOCKET
#33PROBE CARD AND SEMICONDUCTOR DEVICE INSPECTION SYSTEM INCLUDING THE SAME
#34HYBRID SHIELDING SOCKETS WITH IMPEDANCE TUNING FOR INTEGRATED CIRCUIT DEVICE TEST TOOLING
#35PROBE MODULE FOR TESTING OF ELECTRICAL RESISTIVITY OF CONDUCTIVE FIBER MATERIALS
#36CONTACT PROBE AND SOCKET FOR ELECTRICAL COMPONENT TESTING
#37AUTOMATIC WIRE CONNECTION APPARATUS FOR CIRCUIT BOARD TESTING
#38SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOARD INTERFACES
#39PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVEL RELIABILITY TEST
#40UNIVERSAL PROBE CARD AND TESTING METHOD
#41PROBE HEAD WITH REPLACEABLE PROBE BOARD
#42MEASUREMENT UNIT
#43SOCKET
#44TEST PIN
#45METHOD OF MANUFACTURING CONTACT PROBE AND CONTACT PROBE
#46POGO PIN WITH ADJUSTABLE ELASTIC FORCE
#47CONTACT PROBE AND PROBE UNIT
#48SPRING PROBE CONTACT ASSEMBLY
#49SOCKET DEVICE FOR TESTING ICs
#50Testing apparatus
#51SPRING CONTACT IN A TESTING APPARATUS FOR INTEGRATED CIRCUITS
#52POGO PIN COOLING SYSTEM AND METHOD AND ELECTRONIC DEVICE TESTING APPARATUS HAVING THE SYSTEM
#53VOICE COIL LEAF SPRING PROBER
#54Socketed Probes
#55PROBE HEAD HAVING SPRING PROBES
#56Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes
#57TEST TOOL WITH PROFILING CONNECTOR AND BATTERY TESTING METHOD
#58Compliant Probes with Enhanced Pointing Stability and Including At Least One Flat Extension Spring, Methods for Making, and Methods for Using
#59Probe Arrays and Improved Methods for Making and Using Longitudinal Deformation of Probe Preforms
#60Multi-beam probes with decoupled structural and current carrying beams and methods of making
#61Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes
#62Probes with planar unbiased spring elements for electronic component contact, methods for making such probes, and methods for using such probes
#63Probes with planar unbiased spring elements for electronic component contact, methods for making such probes, and methods for using such probes
#64Probes with planar unbiased spring elements for electronic component contact and methods for making such probes
#65TEST SOCKET
#66Compliant probes including dual independently operable probe contact elements including at least one flat extension spring, methods for making, and methods for using
#67Compliant pin probes with extension springs, methods for making, and methods for using
#68Probe joint and spring probe comprising the same
#69Probes with Multiple Springs, Methods for Making, and Methods for Using
#70PROBE PIN
#71PROBE HEAD, PROBE ASSEMBLY AND SPRING PROBE STRUCTURE INCLUDING THE SAME
#72PROBE UNIT
#73Compliant Pin Probes with Multiple Spring Segments and Compression Spring Deflection Stabilization Structures, Methods for Making, and Methods for Using
#74PROBE HEAD AND PROBE ASSEMBLY
#75TEST PROBES AND TEST SOCKET FOR USE WITH THE SAME
#76CONTACT PIN AND SOCKET FOR INSPECTION
#77IC socket includes a base part with a contact pin and a sheet member for electrical connection between the IC package and the wiring board
#78IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENCY ELECTRONIC DEVICES AND RELATING PROBE HEAD
#79CONTACT PIN AND TEST SOCKET HAVING THE SAME
#80PROBE HEAD AND VERTICAL PROBE CARD COMPRISING THE SAME
#81CONTACT PROBE
#82PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES
#83METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE
#84Contact, inspection jig, inspection device, and method of manufacturing contact
#85PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES
#86TUBULAR BODY, CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS
#87Pin-Type Probes for Contacting Electronic Circuits and Methods for Making Such Probes
#88PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES
#89Elastic electrical contact device and contact conductor thereof
#90SPRING PROBE ASSEMBLY FOR A KELVIN TESTING SYSTEM
#91Contact probe, probe holder and probe unit
#92Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes
#93PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES
#94PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES
#952 POGO PIN DESIGN FOR TWS HEADPHONE
#96INSPECTION DEVICE
#97TESTING APPARATUS AND METHOD
#98Contact terminal, inspection jig, and inspection apparatus
#99CONTACT PROBE, INSPECTION APPARATUS, AND INSPECTION METHOD
#100Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment
#101Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment
#102Methods and compositions for increasing the potency of antifungal agents
#103INSPECTION SOCKET
#104Spring contact and test socket with same
#105High performance outer cylindrical spring pin
#106Probe pin
#107Contact probe and probe unit
#108Contact pin with individually movable contact elements
#109Contact probe and socket for testing electrical component
#110Coaxial contact having an open-curve shape
#111REDUCED IMPEDANCE VARIATION IN A MODULAR 2-TERMINAL TERMINAL CONTACTING ELECTRICAL MEASUREMENT SYSTEM
#112Testing holders for chip unit and die package
#113Contact probe and probe unit
#114Hybrid shielding sockets with impedance tuning for integrated circuit device test tooling
#115Spring contact and socket having spring contact embedded therein
#116Method for assembling ultrahigh-frequency spring probe test assembly
#117MEASUREMENT UNIT
#118Inspection jig, and inspection device
#119CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION DEVICE
#120Automated method to check electrostatic discharge effect on a victim device
#121Contact terminal, inspection jig, and inspection device
#122Contact pin and socket
#123Electrical component inspection instrument
#124Integrated circuit device test tooling with dual angle cavities
#125PLUNGER AND CONTACT PROBE
#126INSPECTION JIG SUPPORT TOOL, SUPPORT TOOL, AND INSPECTION JIG
#127Electrical connecting device
#128Probe assembly
#129Probe pin inspection mechanism and inspection apparatus
#130Probe unit
#131CONTACT PIN AND SOCKET
#132Probe unit
#133Electric connection socket connecting a circuit board and an integrated circuit package
#134Inspection jig, inspection device, and contact terminal
#135Thermal test head for an integrated circuit device
#136Thermal test head for an integrated circuit device
#137Testing apparatus and method of controlling testing apparatus
#138Contact pin, in particular spring contact pin
#139Contacting device, head unit for the same, and methods for manufacturing a contacting device and a head unit
#140Probe for characteristic inspection of a connector
#141IC socket
#142Insulation resistance measurement device and insulation resistance measurement method
#143Integrated pogo pin enabling integrated housing
#144Contact probe and probe unit
#145Spring probe
#146Probe pin and electronic device using the same
#147PROBE PIN HAVING OUTER SPRING
#148SOCKET
#149Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment
#150Contact device for electrical test
#151MULTI-LAYER MEMS SPRING PIN
#152Electrical connection socket
#153SPRING PROBE WITH HIGH STABILITY
#154HIGH FREQUENCY PAWL SPRING PROBE APPLIED TO 5G
#155High-frequency test connector device, high frequency testing system and use of same
#156Contact probe and probe unit
#157PROBE
#158Contact and test socket device for testing semiconductor device
#159Contact and test socket device for testing semiconductor device
#160Vehicular camera testing system using spring-loaded electrical connectors
#161Testing apparatus for singulated semiconductor dies with sliding layer
#162Spring contact and test socket with same
#163Electrical contactor, electrical connecting structure and electrical connecting apparatus
#164Conductive Member Using Copper-Silver Alloy, Contact Pin and Device
#165Inspection jig, and inspection device including the same
#166Probe head for high frequency signal test and medium or low frequency signal test at the same time
#167Probe head for high frequency signal test and medium or low frequency signal test at the same time
#168Method for upgrading an automatic testing system
#169Cylindrical body and method for producing same
#170Spring Pin-Based Electrical Interconnect System
#171Plate spring-type connecting pin
#172REPLACEABLE DOUBLE-TYPE PROBE PIN
#173REPLACEABLE SINGLE-TYPE PROBE PIN
#174Electrical connection assembly
#175Method of manufacturing electrical connection socket, and electrical connection socket
#176Electric connection socket
#177Testing holders for chip unit and die package
#178Electric connection device
#179Electrical test probe and testing system using the same
#180Probe device
#181Method for cleaning and coating a tip of a test probe utilized in a test system for an integrated circuit package
#182Test probe assembly and test socket
#183Deflecting device for a probe
#184Probe unit
#185INSPECTION JIG, METHOD FOR MANUFACTURING INSPECTION JIG, AND INSPECTION APPARATUS INCLUDING INSPECTION JIG
#186Electrical connecting apparatus
#187Probe member for pogo pin, manufacturing method therefor and pogo pin comprising same
#188METHOD AND APPARATUS FOR TESTING SEMICONDUCTOR DEVICES WITH PREHEATING
#189Probe
#190PROBE PIN
#191Inspection device and inspection method
#192Conductive contactor unit
#193INSTRUMENT FOR TESTING TERMINAL CONNECTORS
#194Probe member for pogo pin, method of manufacturing the probe member, pogo pin comprising the probe member
#195CONTACT MODULE FOR MAKING ELECTRICAL TACTILE CONTACT WITH A COMPONENT, AND CONTACT SYSTEM
#196Resistivity probes with curved portions
#197Spring-loaded probe having folded portions and probe assembly
#198Jig
#199Probe and electric connecting apparatus
#200Contact probe and electrical connection jig
#201Hybrid probe head assembly for testing a wafer device under test
#202Resistive test-probe tips
#203Surface-mountable apparatus for coupling a test and measurement instrument to a device under test
#204Contact terminal, inspection jig, and inspection device
#205Clamp probe for non-contact electrical parameter measurement
#206Circuit test system and method
#207Inspection jig and inspection device
#208CONTACT CONDUCTION JIG AND INSPECTION DEVICE
#209Wafer Scale Test Interface Unit: Low Loss and High Isolation Devices and Methods for High Speed and High Density Mixed Signal Interconnects and Contactors
#210Method and kit for cleaning and coating a tip of a test probe utilized in a test system for an integrated circuit package
#211Probe
#212Interconnect structure with varying modulus of elasticity
#213Testing method for testing wafer level chip scale packages
#214Electrical probe
#215Circuit adapter board
#216Inspection jig
#217Contact terminal, inspection jig, and inspection device
#218Contact pin and electric component socket
#219High speed chip substrate test fixture
#220Elastomer structure of conductivity probe
#221MEMS probe card assembly having decoupled electrical and mechanical probe connections
#222Tool for automatically replacing defective pogo pins
#223Tool for automatically replacing defective pogo pins
#224Probe pin
#225Transmission line
#226Test device and test method
#227Electrical meter probe contact verification system
#228Connector assembly
#229Testing probe, testing device and testing method
#230Contact terminal, inspection jig, and inspection apparatus
#231Contact probe and inspection jig
#232Testing holders for chip unit and die package
#233Method for providing multi-function back cover to mobile terminal and mobile terminal thereof
#234Contact and test socket device for testing semiconductor device
#235Method of manufacturing semiconductor device
#236Contact probe
#237Probe pin and inspection device including probe pin
#238CONTACT PROBE AND INSPECTION JIG
#239Compressible layer with integrated bridge in IC testing apparatus
#240Probe card and contact inspection device
#241VERTICALLY CURVED MECHANICALLY FLEXIBLE INTERCONNECTS, METHODS OF MAKING THE SAME, AND METHODS OF USE
#242METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#243Shielded interconnect array
#244MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AND INSPECTION APPARATUS FOR SEMICONDUCTOR DEVICE
#245Contactor with a plurality of springs and contact point portions urged by the springs
#246IC socket
#247Method for producing at least one spring contact pin or a spring contact pin arrangement, and corresponding devices
#248Testing device
#249Method and device for testing air tightness
#250Integrated circuit (IC) chip socket
#251Electrical connector having a high speed signal transmission with a high-density structure
#252Probing apparatus for tapping electric signals generated by a device-under-test
#253Differential test probe
#254Alloy material, contact probe, and connection terminal
#255Bolt type probe
#256Electric contact and electric component socket
#257Heatable interposer for temperature-controlled testing of semiconductor devices
#258Sliding rail type probe
#259Probe tip and probe assembly
#260Resistivity probe having movable needle bodies
#261Test handler head having reverse funnel design
#262Prober
#263Probe structure
#264Spring contact, socket including spring contact, and method for manufacturing spring contact
#265Spring contact and socket including spring contact
#266KELVIN PROBE AND KELVIN INSPECTION UNIT PROVIDED WITH SAME
#267Semiconductor inspection device
#268Probe unit
#269Probe for testing charging/discharging of secondary battery
#270Socket
#271Spring contact in a testing apparatus for integrated circuits
#272Connection terminal
#273Kelvin contact assembly in a testing apparatus for integrated circuits
#274Probe pin and manufacturing method thereof
#275Two-piece spring probe
#276PROBE STRUCTURE AND PROBE DEVICE
#277Force biased spring probe pin assembly
#278Force biased spring probe pin assembly
#279Coated probe tips for plunger pins of an integrated circuit package test system
#280Method of manufacturing semiconductor device
#281Electrical contactor and electrical connecting apparatus
#282Systems and methods for electrical inspection of flat panel displays using cell contact probing pads
#283Apparatus and method for evaluating semiconductor device
#284Probe pin and electronic device using the same
#285Evaluation apparatus for semiconductor device and evaluation method for semiconductor device
#286Probe head of vertical probe card
#287Test socket
#288Probe pin
#289Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection method
#290SPRING PROBE HAVING OUTER SLEEVE AND PROBE DEVICE HAVING THE SAME
#291Spring probe and probe card having spring probe
#292PROBE PIN AND ELECTRONIC DEVICE USING SAME
#293Voltage detecting probe and measuring device
#294Electrical contact and testing apparatus
#295Test and measurement probe with adjustable test point contact
#296PROBE
#297Socket apparatus for semiconductor device test
#298High bandwidth differential lead with device connection
#299Testing holders for chip unit and die package
#300Testing probe and testing apparatus for ensuring good contact between testing probe and surface of test sample