Modular Measuring Device using Interface Members for Testing Devices Under Test

Wafer scale test interface unit and contactors

Contact

Known good die testing for high frequency applications

PROBE, SEMICONDUCTOR INSPECTION APPARATUS, METHOD FOR PRODUCING PROBE, METHOD FOR PRODUCING SEMICONDUCTOR INSPECTION APPARATUS, SEMICONDUCTOR INSPECTION METHOD, AND SEMICONDUCTOR PRODUCTION METHOD

Integrated circuit test temperature control mechanism

High impedance compliant probe tip

Test assembly and method of manufacturing the same

Probe structure

Electrical Spring Probe with Stabilization

High impedance compliant probe tip

Semiconductor test apparatus having pogo pins coated with conduction films

Inspection unit

Testing device for testing an under-test object

Testing probe and semiconductor testing fixture, and fabrication methods thereof

Electrical contactor and electrical connecting apparatus

Test probe, test probe component and test platform

Semiconductor evaluation apparatus and semiconductor evaluation method

Electroformed component production method

Cable assembly

Charging and discharging inspection device and charging and discharging inspection method for thin secondary battery

Probe pin having a first plunger with a guide projection slidingly movable in a guide slot of a second plunger

Electric contact and electric component socket

Test fixture with thermoelectric cooler and spring-operated holding pin

PROBES AND PROBE ASSEMBLIES FOR WAFER PROBING

Contact Device for Test and Test Socket

Spring contact

Contact probe and semiconductor element socket provided with same

Test socket assembly and related methods

Measuring apparatus and measuring method utilizing insulating liquid

Probe unit

Probe device having spring probe

Probe device having spring probe

TESTING OF ELECTRONIC CIRCUITS USING AN ACTIVE PROBE INTEGRATED CIRCUIT

CONDUCTIVE TEST PROBE INCLUDING CONDUCTIVE, CONFORMABLE COMPONENTS

Spring probe

Spring probe

Alloy material, contact probe, and connection terminal

Compressible layer with integrated bridge in IC testing apparatus

Kelvin contact probe structure and a Kelvin inspection fixture provided with the same

MEASURING ELECTRONICS COMPRISING A CONTACT STRUCTURE

Electric contact and socket for electric parts

Contact terminal having a plunger pin

Test probe assembly and related methods

Pogo pin and probe card, and method of manufacturing a semiconductor device using the same

Probe and method of manufacturing probe

Probe-connection-type pogo pin and manufacturing method thereof

Probe member for pogo pin

Parallelism adjusting device and parallelism adjusting method

Probe member for pogo pin

Electrical probe for testing electronic device

PROBE NEEDLE

SEMICONDUCTOR TESTING PROBE NEEDLE

Inspection probe and an IC socket with the same

Probe unit

Bellows body contactor having a fixed touch piece

Bellows body contactor having a fixed touch piece

Contactor and probe using same

Contactor

TESTING DEVICE FOR ELECTRONIC DEVICE TESTING

Connector / cable assembly

Coaxial probe

Compressible pin assembly having frictionlessly connected contact elements

Probe head

Contact structure unit

Fine pitch probes for semiconductor testing, and a method to fabricate and assemble same

Fine pitch probes for semiconductor testing, and a method to fabricate and assemble same

COMPRESSIBLE PIN ASSEMBLY HAVING FRICTIONLESSLY CONNECTED CONTACT ELEMENTS

Mechanism for facilitating a dynamic electro-mechanical interconnect having a cavity for embedding electrical components and isolating electrical paths

Compliant electrical contact

Electric contact pin and socket for electrical parts

Coaxial probe

SPRING ASSEMBLY AND TEST SOCKET USING THE SAME

Contact and connector

Contact test device

Probe card

PROBE PIN AND METHOD OF MANUFACTURING THE SAME

Contact terminal having a plunger pin

Electrical connector with insulation member

METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE

Ceramic member, probe holder, and manufacturing method of ceramic member

Test probe for test and fabrication method thereof

Contact probe and probe unit

CONTACT TERMINAL FOR A PROBE CARD, AND THE PROBE CARD

Probe

Probe for inspecting electronic component

Manufacturing method for contact for current inspection jig, contact for current inspection jig manufactured using said method, and current inspection jig provided with said contact

Connection terminal and connection jig

CONTACT STRUCTURE AND METHOD OF MANUFACTURING CONTACT STRUCTURE

Inspection contact element and inspecting jig

Structure for a spring contact

Inspection jig and contact

Spring contact assembly

Connection terminal

Contact probe and semiconductor device socket including contact probe

Spring contact and a socket embedded with spring contacts

SYSTEMS AND METHODS OF TESTING SEMICONDUCTOR DEVICES

Contact and electrical connecting apparatus

HIGH-FREQUENCY VERTICAL SPRING PROBE CARD STRUCTURE

Contact probe and socket

CONTACT ASSEMBLY

Test contact system for testing integrated circuits with packages having an array of signal and power contacts

Contact and electrical connecting apparatus

Contact head, probe pin including the same, and electrical connector using the probe pin

Socket for a semiconductor device

PROBE DEVICE FOR TESTING

Ceramic member, probe holder, and method for manufacturing ceramic member

SPRING WIRE ROD, CONTACT PROBE, AND PROBE UNIT

Test Probe

Switch probe and device and system for substrate inspection

Electrical connector having passageway with hard stop preventing over-compression during downward operation

Probe connector

Probe pin and an IC socket with the same

Probe-unit base member and probe unit

CONTACT PROBE AND SOCKET, AND MANUFACTURING METHOD OF TUBE PLUNGER AND CONTACT PROBE

CONTACT-TYPE ELECTRONIC INSPECTION MODULE

Terminal for flat test probe

Probe element having a substantially zero stiffness and applications thereof

ELECTRICAL CONTACT MEMBER AND CONTACT PROBE

Flat plate folding type coil spring, pogo pin and manufacturing method

Spring structure and test socket using thereof

Probe pin

TEST SOCKET ELECTRICAL CONNECTOR, AND METHOD FOR MANUFACTURING THE TEST SOCKET

Universal spring contact pin and IC test socket therefor

Vertical micro contact probe having variable stiffness structure

Probe and method of manufacturing probe

Spring contact assembly

Probe unit

Probe Connector

Sensing probe for measuring device performance

Wafer prober for semiconductor inspection and inspection method

CIRCUIT TEST JIG AND CIRCUIT TESTING METHOD

Contact base

Probe for a socket, socket for a semiconductor integrated circuit and electronic device

PROBE PIN COMPOSED IN ONE BODY AND THE METHOD OF MAKING IT

Spring contact pin for an ic test socket and the like

Contact probe and socket

Probe Connector

Scrub inducing compliant electrical contact

INSPECTION SOCKET AND METHOD OF PRODUCING THE SAME

PROBE FOR ELECTRICAL INSPECTION, METHOD FOR FABRICATING THE SAME, AND METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE

Conductive contact and conductive contact unit

Pogo pin, the fabrication method thereof and test socket using the same

Probe card electrically connectable with a semiconductor wafer

Flat plunger round barrel test probe

Testing of electronic circuits using an active probe integrated circuit

Probe card for a semiconductor wafer

CONDUCTIVE CONTACT

Environmentally sealed contact

DEVICE, METHOD AND PROBE FOR INSPECTING SUBSTRATE

Probe connector

ELECTRICAL CONTACT PROBE

CONTACT TERMINAL FOR BURN-IN-TEST-SOCKET

Inspection unit

Precision printed circuit board testing tool

Conductive contact holder and conductive contact unit

SOCKET FOR DOUBLE ENDED PROBE, DOUBLE ENDED PROBE, AND PROBE UNIT

Probe card

Burn-in socket with improved contacts

Electrical contact with overlapping structure

Test contact system for testing integrated circuits with packages having an array of signal and power contacts

Conductive contact unit and conductive contact

Test apparatus having pogo probes for chip scale package

SPRING PROBE

Vertical Microprobes for Contacting Electronic Components and Method for Making Such Probes

CONDUCTIVE CONTACT PIN AND SEMICONDUCTOR TESTING EQUIPMENT

Conductive contact unit

Conductive contact holder and conductive contact unit

Probe for testing integrated circuit devices

Printed circuit board for coupling probes to a tester, and apparatus and test system using same

Method for manufacturing conductive contact holder

Double ended contact probe

Method of manufacturing a probe card

IC socket having contact devices with low impedance

PROBE

Spring contact assembly

Conductive contact unit

Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit

Massively parallel interface for electronic circuit

Test pin, method of manufacturing same, and system containing same

Spring loaded microwave interconnector

Spring loaded probe pin

Spring loaded probe pin assembly

Vertical Microprobes for Contacting Electronic Components and Method for Making Such Probes

COMPLIANT ELECTRICAL CONTACT HAVING MAXIMIZED THE INTERNAL SPRING VOLUME

Contact pin probe card and electronic device test apparatus using same

Electric connector and electrical connecting apparatus using the same

Replaceable probe

Device under test pogo pin type contact element

Pin-Type Probes for Contacting Electronic Circuits and Methods for Making Such Probes

Vertical Microprobes for Contacting Electronic Components and Method for Making Such Probes

Test probe with hollow tubular contact with bullet-nosed configuration at one end and crimped configuration on other end

POGO PINS AND CONTACT-TYPE OF TEST DEVICE HAVING POGO PINS FOR TESTING SEMICONDUCTOR DEVICE

Contact probe with reduced voltage drop and heat generation

Probe with contact ring

Probe card having vertical probes

Test probe and manufacturing method thereof

Electrical contact and socket for electrical parts

Kelvin contact measurement device and kelvin contact measurement method

PROBE, TESTING HEAD HAVING A PLURALITY OF PROBES, AND CIRCUIT BOARD TESTER HAVING THE TESTING HEAD

Arcuate blade probe with means for aligning the barrel and the shaft

Methods of using a blade probe for probing a node of a circuit

Electrically-conductive-contact holder, electrically-conductive-contact unit, and method for manufacturing electrically-conductive-contact holder

Self-cleaning socket pin

Needle-like member, conductive contact, and conductive contact unit

Vertically spaced plural microsprings

Pin-type probes for contacting electronic circuits and methods for making such probes

Massively parallel interface for electronic circuit

LSI test socket for BGA

Spring contact pin for an IC chip tester

Dual tapered spring probe

Socket and electronic appliances using socket

Electrical contact probe with compliant internal interconnect

Contact probe, probe socket, electrical characteristic measuring device, and method for pushing the contact probe against object to be measured

Interconnecting apparatus and a contact element therefor

Resilient contact probe apparatus

Methods of making a resilient contact apparatus and resilient contact probes

Interconnect Cartridge

Method for pushing a contact probe against object to be measured

Vertical microprobes for contacting electronic components and method for making such probes

Arcuate blade probe

Microcontactor probe assembly having a plunger and electric probe unit using the same

Elastic micro probe and method of making same

Method and apparatus for a twisting fixture probe for probing test access point structures

POGO pin and test socket including the same

LSI test socket for BGA

Massively parallel interface for electronic circuit

Apparatus and method for testing semiconductor chip

Method and apparatus for a wobble fixture probe for probing test access point structures

Contact for electronic devices

Inspection unit

Resilient contact probes

Electrical test probes, methods of making, and methods of using

Probe card and the production method

Planar electroconductive contact probe holder

Probe for high electric current

Resilient contact probe apparatus, methods of using and making, and resilient contact probes

Compliant electrical contact assembly

High-density electroconductive contact probe with uncompressed springs

Probe device for electrical testing an integrated circuit device and probe card using the same

Pin-type probes for contacting electronic circuits and methods for making such probes

Spring plunger probe

Pin-type probes for contacting electronic circuits and methods for making such probes

Testing probe and testing jig

Apparatus for interfacing electronic packages and test equipment

Semiconductor device tester with slanted contact ends

Capacity load type probe, and test jig using the same

Cable terminal with air-enhanced contact pins

Massively parallel interface for electronic circuit

Contact pin, connection device and method of testing

Support member assembly for conductive contactor

Compliant pin probes with flat extension springs, methods for making, and methods for using

Probes with multiple springs, methods for making, and methods for using

Compliant pin probes with multiple spring segments and compression spring deflection stabilization structures, methods for making, and methods for using

Probes with planar unbiased spring elements for electronic component contact and methods for making such probes

Apparatus for interfacing with a display panel compatible with a mobile industry processor interface

Microspring probe card with insulation block

Test signals conduction device

Current sensor having microwave chip resistors in parallel radial arrangement

Groundless radio frequency test probe

Biasing method and device construction for a spring probe

Methods and apparatus for reducing electrostatic discharge during integrated circuit testing