171722 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of individual semiconductor devices; Circuits therefor for testing field effect transistors, i.e. FET's
Planar metrology pad adjacent a set of fins of a fin field effect transistor device
#302Test method and system for cut-in voltage
#303System and method for converging current with target current in device under test
#304Overcurrent detector
#305Method of characterizing and modeling leakage statistics and threshold voltage for ensemble devices
#306Examination device and examination method
#307Equi-resistant probe distribution for high-accuracy voltage measurements at the wafer level
#308Current regulation for accurate and low-cost voltage measurements at the wafer level
#309Method for testing a CMOS transistor
#310Electro-Optic Modulators and Thin Film Transistor Array Test Apparatus Including the Same
#311Fault detection assembly
#312Method for the characterization and monitoring of integrated circuits
#313Circuit device and electronic apparatus
#314Semiconductor device
#315Display apparatus including dummy display element for TFT testing
#316Methods of predicting unity gain frequency with direct current and/or low frequency parameters
#317Test device for testing plurality of samples and operating method thereof
#318Restoring OFF-state stress degradation of threshold voltage
#319Low gds measurement methodology for MOS
#320Sensorless current sensing methods for power electronic converters
#321Atom probe tomography sample preparation for three-dimensional (3D) semiconductor devices
#322Apparatus and methods for qualifying HEMT FET devices
#323Load detection circuit and method
#324Planar metrology pad adjacent a set of fins of a fin field effect transistor device
#325Ultra fast transistor threshold voltage extraction
#326APPARATUS OF MEASURING SEMICONDUCTOR DEVICE
#327Negative bias thermal instability stress testing of transistors
#328Correction for stress induced leakage current in dielectric reliability evaluations
#329APPARATUS FOR DETECTING A FAILED TRANSISTOR
#330Fast high-side power FET gate sense circuit for high voltage applications
#331Detecting faults in hot-swap applications
#332SEMICONDUCTOR LAYOUT STRUCTURE AND TESTING METHOD THEREOF
#333SILICON-ON-INSULATOR (SOI) BODY-CONTACT PASS GATE STRUCTURE
#334Method for deriving characteristic values of MOS transistor
#335Signal processing device and measuring method
#336Gate-stress test circuit without test pad
#337Testing structure and method for interface trap density of gate oxide
#338Current application device and manufacturing method of semiconductor element
#339In-Line Transistor Bandwidth Measurement
#340Probe card for power device
#341Analysis circuit for field effect transistors having a displaceable gate structure
#342ELECTRONIC DEVICE RELIABILITY MEASUREMENT SYSTEM AND METHOD
#343Circuits for self-reconfiguration or intrinsic functional changes of chips before vs. after stacking
#344Voltage detecting circuit and method for measuring characteristic of transistor
#345APPARATUS AND METHOD FOR SENSING TRANSISTOR MISMATCH
#346Electrical device with a pulsed power supply and method for testing the power supply of the electrical device
#347State of health estimation of power converters
#348Method and Measuring Device for Determining a State of a Semiconductor Material of a Chemosensitive Field-Effect Transistor that has been Tested and Delivered by a Manufacturer
#349Circuit and method for overcurrent detection of power switch
#350Method and apparatus for feedback-based resistance calibration
#351System and method for testing an integrated circuit
#352Circuit and method for measuring voltage
#353Method and device for measuring changes over time of the electrical performance of an FDSOI transistor
#354Method for testing density and location of gate dielectric layer trap of semiconductor device
#355Method and apparatus for accelerating device degradation and diagnosing the physical changes of the device during the degradation process
#356METHOD AND APARATUS FOR HIGH SIDE TRANSISTOR PROTECTION
#357Method and apparatus for identifying defects in a chemical sensor array
#358Oscillation circuit and test circuit
#359POWER MEASURING SYSTEM
#360Voltage clamping circuit and use thereof
#361METHODS FOR RELIABILITY TESTING OF SEMICONDUCTOR DEVICES
#362Damage reduction method and apparatus for destructive testing of power semiconductors
#363METHOD FOR OBTAINING DISTRIBUTION OF CHARGES ALONG CHANNEL IN MOS TRANSISTOR
#364Electronic circuit and method for testing and keeping a MOS transistor switched-off
#365On-chip measurement of AC variability in individual transistor devices
#366Closed loop feedback control of integrated circuits
#367Threshold voltage detection circuit
#368Circuit device having a semiconductor component
#369Correction for stress induced leakage current in dielectric reliability evaluations
#370Method of testing reliability of semiconductor device
#371High frequency characteristic measuring device
#372Systems and methods for adjusting threshold voltage
#373On-chip measurement of AC variability in individual transistor devices
#374Method for testing trap density of gate dielectric layer in semiconductor device having no substrate contact
#375Semiconductor device evaluation apparatus and semiconductor device evaluation method
#376Test apparatus and test method
#377Voltage driver for a voltage-driven intelligent characterization bench for semiconductor
#378Semiconductor device including body connected FETs
#379Test apparatus
#380Post silicide testing for replacement high-k metal gate technologies
#381SILICON-ON-INSULATOR (SOI) BODY-CONTACT PASS GATE STRUCTURE
#382Method and apparatus for device parameter measurement
#383VOLTAGE DROP ANALYSIS APPARATUS, VOLTAGE DROP ANALYSIS METHOD, AND SYSTEM
#384Measuring floating body voltage in silicon-on-insulator (SOI) metal-oxide-semiconductor-field-effect-transistor (MOSFET)
#385EVALUATION METHOD, EVALUATION APPARATUS, AND SIMULATION METHOD OF SEMICONDUCTOR DEVICE
#386MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
#387Methods and system for electrostatic discharge protection of thin-film transistor backplane arrays
#388Frequency specific closed loop feedback control of integrated circuits
#389METHODS AND APPARATUS FOR TESTING ISFET ARRAYS
#390Switching device and testing apparatus
#391Corner detector
#392Alternating current (AC) stress test circuit, method for evaluating AC stress induced hot carrier injection (HCI) degradation, and test structure for HCI degradation evaluation
#393Fatal failure diagnostics circuit and methodology
#394Operating parameter monitoring circuit and method
#395Integrated smart power switch
#396Method and circuit for testing integrated circuit
#397Circuit, system, and method for degradation detection
#398Method and device for evaluating electric performances of an FDSOI transistor
#399Measurement of partially depleted silicon-on-insulator CMOS circuit leakage current under different steady state switching conditions
#400Semiconductor integrated circuit and method of testing circuit
#401Method of extracting a time constant from complex random telegraph signals
#402Method and system for assessing reliability of integrated circuit
#403Measurement methodology and array structure for statistical stress and test of reliabilty structures
#404Method for measuring interface traps in thin gate oxide MOSFETS
#405Circuit configuration for protecting a circuit element having overcurrent and overtemperature detection
#406Apparatus for controlling substrate voltage of semiconductor device
#407SEMICONDUCTOR DEVICE MEASURING VOLTAGE APPLIED TO SEMICONDUCTOR SWITCH ELEMENT
#408Leakage current detection circuit and leakage current comparison circuit
#409Monitoring NFET/PFET Skew in Complementary Metal Oxide Semiconductor Devices
#410Methods and apparatus to test electronic devices
#411Closed loop feedback control of integrated circuits
#412Frequency specific closed loop feedback control of integrated circuits
#413Semiconductor device and method for measuring analog channel resistance thereof
#414Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing method
#415Systems and methods for adjusting threshold voltage
#416Systems and methods for adjusting threshold voltage
#417Electronic circuit for measurement of transistor variability and the like
#418Switching device and testing apparatus
#419Switch Module for Semiconductor Characteristic Measurement and Measurement Method of Semiconductor Characteristics
#420TECHNIQUES FOR CHARACTERIZING PERFORMANCE OF TRANSISTORS IN INTEGRATED CIRCUIT DEVICES
#421Array-based early threshold voltage recovery characterization measurement
#422MOS capacitance test structure and associated method for measuring a curve of capacitance as a function of the voltage
#423Diagnostic method for root-cause analysis of FET performance variation
#424Method of measuring on-resistance in backside drain wafer
#425Device for Measuring a Load Current
#426Circuit assemblage and method for functional checking of a power transistor
#427Diagnostic method for root-cause analysis of FET performance variation
#428Method to accurately estimate the source and drain resistance of a MOSFET
#429Semiconductor device test system having reduced current leakage
#430Method and apparatus to measure threshold shifting of a MOSFET device and voltage difference between nodes
#431Multi-purpose poly edge test structure
#432Method and test system for determining gate-to-body current in a floating body FET
#433Measuring the On-Resistance of a Transistor Load Path
#434Semiconductor device including semiconductor evaluation element, and evaluation method using semiconductor device
#435Methods of operating an electronic circuit for measurement of transistor variability and the like
#436Voltage clamp circuit and semiconductor device, overcurrent protection circuit, voltage measurement probe, voltage measurement device and semiconductor evaluation device respectively using the same
#437Multi-pin CV measurement
#438Stress detection circuit and semiconductor chip including same
#439Method for determining threshold voltage variation using a device array
#440Test system and computer program for determining threshold voltage variation using a device array
#441Apparatus and method for measuring effective channel
#442Measuring threshold voltage of transistors in a circuit
#443Method of measuring electronic device and measuring apparatus
#444Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests
#445Radar system
#446Electronic circuit for measurement of transistor variability and the like
#447TEST APPARATUS FOR DETERMINING PERFORMANCE DEGRADATION
#448INSPECTION DEVICE FOR INSPECTING TFT
#449Closed loop feedback control of integrated circuits
#450Characterization array circuit
#451Multi-purpose poly edge test structure
#452Current mirror with circuitry that allows for over voltage stress testing
#453Method for measuring intrinsic capacitance of a metal oxide semiconductor (MOS) device
#454Method for measuring interface traps in thin gate oxide MOSFETs
#455Method and system for detecting or reviewing open contacts on a semiconductor device
#456Multi-channel pulse tester
#457Method for measuring analog channel resistance of a semiconductor device having a gate, a source, a drain, a drain sense and a source sense
#458CHARACTERISTIC EVALUATION APPARATUS FOR INSULATED GATE TYPE TRANSISTORS
#459Characterization array and method for determining threshold voltage variation
#460Measurement apparatus for FET characteristics
#461MOS transistor characteristic detection apparatus and CMOS circuit characteristic automatic adjustment apparatus
#462Saturation detection circuits
#463Computing the characteristics of a field-effect-transistor (FET)
#464Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests
#465Method and an apparatus for measuring FET properties
#466Method of measuring flat-band status capacitance of a gate oxide in a MOS transistor device
#467METHOD OF MEASURING CAPACITANCE CHARACTERISTICS OF A GATE OXIDE IN A MOS TRANSISTOR DEVICE
#468Apparatus for detecting a current and temperature for an integrated circuit
#469Apparatus for controlling substrate voltage of semiconductor device
#470Method for testing power MOSFET devices
#471Leakage current detection circuit and leakage current comparison circuit
#472Semiconductor test device using leakage current and compensation system of leakage current
#473Method for measuring FET characteristics
#474Semiconductor device evaluation method
#475Electronic switching circuit, switching circuit test arrangement and method for determining the operativeness of an electronic switching circuit
#476System for measuring FET characteristics
#477System and method for determining channel mobility
#478Integrated smart power switch
#479Avalanche testing at final test of top and bottom FETs of a buck converter
#480Gate drive circuit for an insulated gate power transistor
#481Method of predicting high-k semiconductor device lifetime
#482Method for automatic measurement of failure in subthreshold region of metal-oxide-semiconductor transistor
#483Method for measuring characteristics of FETs
#484Power supply device and electric circuit
#485Evaluation device and circuit design method used for the same
#486System and method for accurate negative bias temperature instability characterization
#487Device and a method for biasing a transistor that is connected to a power converter
#488System and method for accurate negative bias temperature instability characterization
#489CMOS leakage current meter
#490Overvoltage detection apparatus, method, and system
#491Apparatus and method for detecting photon emissions from transistors
#492Capacitance measurement method of micro structures of integrated circuits
#493Method and apparatus for testing defective portion of semiconductor device
#494Method and apparatus for detecting semiconductor characterist variations
#495Automatic range finder for electric current testing
#496Apparatus and method for determining a current through a power semiconductor component
#497Predictive applications for devices with thin dielectric regions
#498Inspection device for inspecting TFT
#499Method of electrical characterization of a silicon-on-insulator (SOI) wafer
#500Method of dynamically switching voltage screen test levels based on initial device parameter measurements
#501Dynamically switched voltage screen
#502Method for measuring capacitance-voltage curves for transistors
#503Analysis methods of leakage current luminescence in CMOS circuits
#504Semiconductor test device using leakage current and compensation system of leakage current
#505Method for evaluating semiconductor device
#506GaN HEMT device for irradiation damage detection and detection and manufacturing method therefor
#507Device and method for monitoring a turn-off capability
#508Embedded system to characterize BTI degradation effects in MOSFETs
#509Measurement method for contact resistance of transistor test device and computer-readable medium
#510Diagnosis with double gate
#511Real-time, in-situ reliability monitoring in an integrated circuit
#512Semiconductor device and operating method thereof
#513Coplanar load pull test fixture for wave measurements
#514Transistor gate driver
#515Three level gate monitoring
#516Hybrid electronic tuner
#517Top contact resistance measurement in vertical FETs
#518Transistor work function adjustment by laser stimulation
#519Tuning method for hybrid active injection load pull system
#520Multi-source active injection load pull system and method