171722 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of individual semiconductor devices; Circuits therefor for testing field effect transistors, i.e. FET's
Sub-classes:SYSTEM AND METHOD FOR DETECTING FAILURES OF SOLID-STATE SWITCHES IN A MAIN CIRCUIT
#2SEMICONDUCTOR TEST DEVICE AND SEMICONDUCTOR WAFER
#3CURRENT CONTROLLED OSCILLATOR (CCO) BASED PARASITIC INDEPENDENT PROCESS MONITORING BLOCK
#4METHODS AND APPARATUS TO IDENTIFY A STATE CHANGE OF A SWITCH
#5Device and Method SSR Leakage Detection
#6ELECTRONIC CIRCUIT
#7METHODS FOR DETERMINING REMAINING USEFUL LIFE IN ELECTRONIC DEVICES AND SYSTEMS (RULAS)
#8SYSTEM AND METHOD FOR GATE THRESHOLD VOLTAGE MEASUREMENT
#9DEVICE AND METHOD FOR TESTING CHARACTERISTICS OF BARE CHIPS
#10METHOD FOR MEASURING AN INTERNAL CAPACITANCE OF A TRANSISTOR DEVICE
#11TIME-DEPENDENT DIELECTRIC BREAKDOWN (TDDB) TEST UNIT, MEASUREMENT CIRCUIT AND METHOD THEREOF
#12ADVANCED POWER MOS RDS-ON DRIVEN LIFETIME PREDICTION
#13Package with Functional Chip and with Physically Separate Sense Chip
#14DEVICE FOR CONTROLLING, PROTECTING AND MONITORING THE STATE OF HEALTH OF A POWER TRANSISTOR
#15APPARATUS FOR MEASURING A GATE LEAKAGE CURRENT OF A TRANSISTOR
#16TEST AND MEASUREMENT INSTRUMENTS AND PROBES HAVING AN ISOLATED OUTPUT
#17PROTECTING A POWER INVERTER BY SENSING A PHASE NODE VOLTAGE
#18DEVICE AND METHOD FOR CHARACTERIZING THE CURRENT COLLAPSE OF GAN TRANSISTORS
#19DYNAMIC ON-RESISTANCE AND THRESHOLD VOLTAGE INSTABILITY EVALUATION CIRCUIT FOR POWER DEVICES AND OPERATION METHOD THEREOF
#20QUASISTATIC C-V METHOD WITH FIXED FORCE DC CURRENT AND LEAKAGE CORRECTION
#21DIE CRACK DETECTION SYSTEM
#22CIRCUIT FOR STRESS TESTING POWER TRANSISTOR GATES
#23DETECTING MOTHERBOARD POWER SWITCH DEFECTS AND LCD CABLE SHORTS
#24SEARCH FUNCTION WITH DEVICE MODELING
#25INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM
#26SEMICONDUCTOR TEST APPARATUS
#27SMART POWER SEMICONDUCTOR SWITCH DEVICE WITH SELF-DIAGNOSTIC FUNCTION AND METHOD THEREOF
#28MEASUREMENT METHOD OF FLATBAND VOLTAGE OF POWER SEMICONDUCTOR MODULE
#29ELECTRONIC DEVICE AND METHOD THAT APPLIES STRESS TO TRANSISTORS
#30SEMICONDUCTOR MEASUREMENT DEVICE AND SEMICONDUCTOR MEASUREMENT METHOD
#31TRANSISTOR ARRANGEMENT AND METHOD FOR MEASURING AN ON- RESISTANCE OF A TRANSISTOR ARRANGEMENT
#32POWER TRANSISTOR AGE DETECTION
#33FAILURE DETECTION DEVICE
#34SYSTEM AND METHOD FOR MEASURING RDSon, RDSoff AND CURRENT COLLAPSE ON SEMICONDUCTOR DEVICES
#35Systems and Methods for Calibrating a Wireless Harness Automated Measurement System
#36GAN RELIABILITY BUILT-IN SELF TEST (BIST) APPARATUS AND METHOD FOR QUALIFYING DYNAMIC ON-STATE RESISTANCE DEGRADATION
#37METHOD FOR CHECKING THE SWITCH-OFF CAPABILITY OF A MOSFET
#38ELECTRONIC DEVICES RELATED TO MONITORING OF INTERNAL NODES
#39METHOD AND APPARATUS FOR DETERMINING TURN-OFF NEGATIVE VOLTAGE OF SWITCHING TRANSISTOR, AND SWITCHING TRANSISTOR DRIVE CONTROL CIRCUIT
#40PROTECTING A POWER INVERTER BY SENSING A PHASE NODE VOLTAGE
#41STRESS CALIBRATION METHOD, CORRESPONDING ELECTRONIC DEVICE
#42WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR
#43METHOD FOR TESTING TOTAL DOSE EFFECT OF SIC MOSFET DEVICE
#44Wafer-level semiconductor high-voltage reliability test fixture
#45RESISTIVE-NETWORK CELL REGION, BUILT-IN SELF-TESTER INCLUDING SAME, SEMICONDUCTOR DEVICE INCLUDING SAME, METHOD OF OPERATING SAME AND METHOD OF MANUFACTURING SAME
#46ALGORITHM FOR ASSESSMENT OF FORWARD BIASED JUNCTIONS DETECTED DURING CIRCUIT OPERATION
#47MONITORING CIRCUIT AND CORRESPONDING METHOD
#48CONTACT RESISTANCE TEST STRUCTURE FOR STACKED FETS
#49SYSTEM FOR SENSING CURRENT THROUGH A PASS FET
#50TEST METHOD
#51SYSTEM AND METHODS TO ACCURATELY MEASURE DYNAMIC RESISTANCE FOR POWER DEVICES
#52METHOD FOR MEASURING CURRENT-VOLTAGE CHARACTERISTIC
#53DEGRADATIONS DETECTION FOR MOS-TRANSISTORS AND GATE-DRIVERS
#54Methods, Systems, and Devices for Wireless Power Modules
#55SEMICONDUCTOR STRUCTURE
#56MEASUREMENT METHOD AND MEASUREMENT DEVICE
#57UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION OF A DEVICE UNDER TEST
#58SEMICONDUCTOR SWITCH ASSEMBLY HAVING A MONITORING FUNCTION, ENERGY SYSTEM AND VEHICLE
#59SYSTEM FOR DETERMINING LEAKAGE CURRENT OF A FIELD EFFECT TRANSISTOR OVER TEMPERATURE
#60METHOD OF MONITORING A HEALTH STATE OF A POWER SEMICONDUCTOR DEVICE
#61APPARATUS AND METHOD FOR MEASURING DYNAMIC ON-RESISTANCE OF NITRIDE-BASED SWITCHING DEVICE
#62MEASUREMENT PATTERN, MEASUREMENT PATTERN SET, CALCULATION METHOD, NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM AND CALCULATION DEVICE
#63System and method for identifying non-switching semiconductor switches
#64CALCULATION METHOD AND CALCULATION DEVICE
#65Gate charge and leakage measurement test sequence for solid state devices
#66EVALUATION CIRCUIT, SEMICONDUCTOR DEVICE, AND EVALUATION METHOD
#67CURRENT MEASUREMENT FOR DEFECT DETECTION
#68TEST KEY TRANSISTOR FOR DEEP TRENCH ISOLATION DEPTH DETECTION
#69CORRECTING FOR LOAD RESISTANCE WHEN MAKING I-V MEASUREMENTS WITH CONSTANT DRAIN VOLTAGE ON POWER MOSFETS
#70METHOD FOR MEASURING AN INTERFACE RESISTANCE OF A FIELD EFFECT TRANSISTOR
#71SEMICONDUCTOR DEVICE
#72LOW CURRENT LEAKAGE MEASUREMENT ON A HIGH CURRENT UNIFIED STATIC AND DYNAMIC CHARACTERIZATION PLATFORM
#73GALLIUM NITRIDE-BASED DEVICES AND METHODS OF TESTING THEREOF
#74GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradation
#75Method and apparatus for determining gate capacitance
#76SYSTEMS AND METHODS FOR REMAINING USEFUL LIFE PREDICTION IN ELECTRONICS
#77METHOD AND DEVICE FOR DETECTING LAYOUT OF INTEGRATED CIRCUIT, AND STORAGE MEDIUM
#78Test circuit and testing method
#79Onboard circuits and methods to predict the health of critical elements
#80Ultra-low leakage test verification circuit
#81Test method for tolerance against the hot carrier effect
#82System and method for identifying non-switching semiconductor switches
#83Internal device sequencer for testing mode
#84Driver device having an NMOS power transistor and a blocking circuit for stress test mode, and method of stress testing the driver device
#85POWER SUPPLY CONTROL APPARATUS AND SEMICONDUCTOR FAILURE DETECTION METHOD
#86Semiconductor structure and method of manufacturing the same
#87Deterioration checking apparatus and deterioration checking
#88Apparatus and method for measuring dynamic on-resistance of GaN-based device
#89Switch system
#90Fault detection circuits and methods for drivers
#91UNIFIED MEASUREMENT SYSTEM FOR STATIC AND DYNAMIC CHARACTERIZATION OF A DEVICE UNDER TEST
#92Diagnosis circuit of parallel-structure MOSFETs including MUX and diagnosis method using the same
#93HIGH VOLTAGE TRANSISTOR WITH A FIELD PLATE
#94EVALUATION METHOD FOR HOT CARRIER EFFECT DEGRADED PERFORMANCE
#95Testing switches in a power converter
#96Method of inspecting silicon carbide semiconductor device
#97Method for checking a semiconductor switch for a fault
#98TFT panel and test method
#99Test method and device for contact resistor
#100GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradation
#101Semiconductor device
#102METHODS AND APPARATUS FOR TESTING ISFET ARRAYS
#103Integrated circuit and semiconductor device
#104Ultra-low leakage test verification circuit
#105High electron mobility transistor
#106Method and apparatus for analysis of interface state of MIS-HEMT device
#107IGBT module reliability evaluation method and device based on bonding wire degradation
#108Method and apparatus for calculating kink current of SOI device
#109Method and device for automatically testing a switching member
#110SEMICONDUCTOR DEVICE, DETECTION METHOD, ELECTRONIC APPARATUS, AND ELECTRONIC APPARATUS CONTROL METHOD
#111Method and apparatus for determining electrical characteristics of organic transistor, and storage medium
#112System for determining leakage current of a field effect transistor over temperature
#113Test apparatus and testing method using the same
#114Transistor characterization
#115IGBT/MOSFET fault protection
#116In situ monitoring of field-effect transistors during atomic layer deposition
#117System and process for implementing accelerated test conditions for high voltage lifetime evaluation of semiconductor power devices
#118Method and circuit for testing the functionality of a transistor component
#119Testing method of a semiconductor device
#120Integrated circuit with current limit testing circuitry
#121DISPLAY PANEL AND DISPLAY DEVICE
#122Aging detector for an electrical circuit component, method for monitoring an aging of a circuit component, component and control device
#123Adaptive blanking of over current fault detection circuits in power conversion gate drivers
#124Device and method for measuring high electron mobility transistor
#125Method for measuring current-voltage characteristic
#126Semiconductor test apparatus, semiconductor device test method, and semiconductor device manufacturing method
#127Audio playback under short circuit conditions
#128Body-contacted field effect transistors configured for test and methods
#129Method for measurement of current-voltage characteristics
#130Apparatus and method to achieve fast-fault detection on power semiconductor devices
#131Power transistor junction temperature determination using a desaturation voltage sensing circuit
#132Temperature-adaptive short circuit protection for semiconductor switches
#133Gate driver with Vand Vmeasurement capability for the state of health monitor
#134Methods of determining operating conditions of silicon carbide power MOSFET devices associated with aging, related circuits and computer program products
#135Method for testing a high voltage transistor with a field plate
#136Methods of monitoring conditions associated with aging of silicon carbide power MOSFET devices in-situ, related circuits and computer program products
#137On-line monitoring system for measuring on-state voltage drop of power semiconductor devices
#138Method for rapidly gathering sub-threshold swing from thin film transistor
#139Power semiconductor device with integrated current measurement
#140System and method of monitoring a switching transistor
#141Electrically confined ballistic devices and methods
#142METHOD AND APPARATUS FOR IDENTIFYING DEFECTS IN A CHEMICAL SENSOR ARRAYMETHOD AND APPARATUS FOR IDENTIFYING DEFECTS IN A CHEMICAL SENSOR ARRAY
#143Analysis method for semiconductor device
#144Analysis method for semiconductor device
#145Analysis method for semiconductor device
#146Unclamped inductor switching test at wafer probe
#147Short-circuit protection of power semiconductor device by sensing current injection from drain to gate
#148Monitoring an operating condition of a transistor-based power converter
#149Temperature measurement member, inspection apparatus, and temperature measurement method
#150Charge trap evaluation method and semiconductor element
#151Semiconductor device
#152Methods and apparatuses for threshold voltage measurement and related semiconductor devices and systems
#153Power transistor leakage current with gate voltage less than threshold
#154Semiconductor device, manufacture thereof, and a radiation measurement method
#155System and method for testing radio frequency switches
#156Semiconductor device and method for measuring current of semiconductor device
#157Magnetic field transducer mounting methods for MTJ device testers
#158Simulation circuit and simulation method
#159Test structures connected with the lowest metallization levels in an interconnect structure
#160Method of manufacturing a semiconductor device
#161Constant power circuit with variable heating and measurement current capability
#162Semiconductor device
#163Solid state power switch device
#164Test assembly and test device
#165HEMT wafer probe current collapse screening
#166Sensor for gate leakage detection
#167Method and arrangement for checking a control circuit of an inductive load
#168Device for measuring surface characteristics of a material
#169Damage predicting device and damage predicting method for power semiconductor switching element, AC-DC converter, and DC-DC converter
#170Testing switches in a power converter
#171Semiconductor fault analysis device and fault analysis method thereof
#172MULTIPLEXED DLTS AND HSCV MEASUREMENT SYSTEM
#173Assessment method, and semiconductor device manufacturing method
#174Method for the characterization and monitoring of integrated circuits
#175Gate charge measurements using two source measure units
#176Voltage sampling circuits
#177Load drive apparatus
#178Skew detection circuit and input circuit using the same
#179Method for the characterization and monitoring of integrated circuits
#180Method of characterizing and modeling leakage statistics and threshold voltage for ensemble devices
#181Test circuit and semiconductor device
#182Current sensing circuit for sensing current flowing through load switch
#183Gate driver with VGTH and VCESAT measurement capability for the state of health monitor
#184Adaptive voltage clamps and related methods
#185Magnetic field transducer mounting apparatus for MTJ device testers
#186Method for estimating resistances of a source contact and a drain contact of a MOS transistor
#187Skew detection circuit and input circuit using the same
#188Pixel inspection method, pixel inspection device, and display device
#189Test circuits for monitoring NBTI or PBTI
#190SEMICONDUCTOR DEVICE
#191Evaluating a gate-source leakage current in a transistor device
#192HIGH-RESOLUTION POWER ELECTRONICS MEASUREMENTS
#193Semiconductor test equipment
#194Method, test line and system for detecting semiconductor wafer defects
#195Testing MOS power switches
#196Current sensing circuit and method
#197Semiconductor device
#198Methods and apparatus for testing ISFET arrays
#199Semiconductor failure prognostication
#200Embedded photodetector as device health monitor for hot carrier injection (HCI) in power semiconductors
#201Semiconductor device, measurement device, measurement method, and semiconductor system for plasma induced damage (PID) measurement
#202Semiconductor integrated device and gate screening test method of the same
#203SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
#204Measuring individual device degradation in CMOS circuits
#205Double-pulse test systems and methods
#206Method for determining the output voltage of a transistor
#207Semiconductor device, manufacture thereof, and a radiation measurement method
#208Transistor work function adjustment by laser stimulation
#209Solid state power controller
#210Testkey structure and method of measuring device defect or connection defect by using the same
#211Test circuit, test method, array substrate and manufacturing method thereof
#212Method of characterizing and modeling leakage statistics and threshold voltage for ensemble devices
#213Tool Lifespan Parameter Detector
#214Ring oscillator test circuit
#215Method of manufacturing a semiconductor device and semiconductor device
#216Device including a compound semiconductor chip
#217Systems and methods for detecting switching circuitry failure
#218CIRCUIT ARRANGEMENT FOR A SECURE DIGITAL SWITCHED OUTPUT, TEST METHOD FOR AND OUTPUT MODULE FOR THE SAME
#219Method for measuring current-voltage characteristic
#220Symmetrical lateral bipolar junction transistor and use of same in characterizing and protecting transistors
#221Computer implemented method for determining intrinsic parameter in a stacked nanowires MOSFET
#222Silicon carbide semiconductor device and method for manufacturing the same
#223FAILURE LOCATION SPECIFYING DEVICE AND FAILURE LOCATION SPECIFYING METHOD
#224Method for making thin film transistor
#225Method of ROI Encapsulation During Axis Conversion of Cross-Sectional TEM Lamellae
#226High speed and high precision characterization of VTsat and VTlin of FET arrays
#227Inspection device and inspection method for performing dynamic and static characteristics tests
#228Sanity monitor for power module
#229Driving circuit of display panel and the quality test method thereof
#230Test circuit for stress leakage measurements
#231Solid state circuit breaker and motor driving system
#232Method and device for temperature measurement of FinFET devices
#233Top contact resistance measurement in vertical FETs
#234Test of stacked transistors
#235Method for manufacturing semiconductor device
#236Method for estimating power system health
#237Test circuit to isolate HCI degradation
#238Monitoring device and monitoring method for a switching element
#239GATE PROTECTION FOR HV-STRESS APPLICATION
#240Method of characterizing and modeling leakage statistics and threshold voltage for ensemble devices
#241Semiconductor devices and methods for testing a gate insulation of a transistor structure
#242Open load detection in output stages
#243Method for measuring current-voltage characteristic
#244Methods of predicting unity gain frequency with direct current and/or low frequency parameters
#245High-resolution power electronics measurements
#246Method for parameter extraction of a semiconductor device
#247Assessment method, and semiconductor device manufacturing method
#248Method for detecting substrate crack, substrate, and detection circuit
#249Field-effect transistor and associated fault detection device
#250Semiconductor apparatus and method of controlling MOS transistor
#251Apparatus for detecting variation in transistor threshold voltage
#252System and method for testing an integrated circuit
#253Circuits and techniques for voltage monitoring of a solid-state isolator
#254Semiconductor device and method of inspecting a semiconductor device
#255Method of evaluating semiconductor device and apparatus for evaluating semiconductor device
#256Semiconductor device and method for manufacturing the same
#257Method for the characterization and monitoring of integrated circuits
#258Method for manufacturing display device
#259Detection of gate-to-source/drain shorts
#260Addressable test circuit and test method for key parameters of transistors
#261Measuring individual device degradation in CMOS circuits
#262Circuit state sensing
#263Method for evaluating performance of plasma wave transistor
#264MOS transistor saturation region detector
#265Device for measuring threshold voltage of a transistor based on constant drain voltage and constant drain source current
#266Method for testing semiconductor dies
#267Closed loop feedback control of integrated circuits
#268Method and apparatus for high side transistor protection
#269Switch device
#270SEMICONDUCTOR DEVICE TESTING APPARATUS, SEMICONDUCTOR DEVICE TESTING METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
#271Silicon carbide semiconductor device and method for manufacturing the same
#272Compound semiconductor device including a sensing lead
#273Methods and apparatuses for SW programmable adaptive bias control for speed and yield improvement in the near/sub-threshold domain
#274Switch failure detection device, battery pack including the same, and method of detecting failure of electronic switch
#275Verification of gate driver protection logic
#276Peripheral test circuit of display array substrate and liquid crystal display panel
#277Non-contact method to monitor and quantify effective work function of metals
#278Extraction of resistance associated with laterally diffused dopant profiles in CMOS devices
#279Method for the characterization and monitoring of integrated circuits
#280Calculating circuit-level leakage using three dimensional technology computer aided design and a reduced number of transistors
#281System for the characterisation of a flash memory cell
#282Method of evaluating thin-film transistor, method of manufacturing thin-film transistor, and thin-film transistor
#283Display apparatus including dummy display element for TFT testing
#284Display substrate, its testing method and its manufacturing method
#285Device testing
#286Circuit and method for testing transistor(s)
#287SEMICONDUCTOR DEVICE
#288Semiconductor device for testing large number of devices and composing method and test method thereof
#289Symmetrical lateral bipolar junction transistor and use of same in characterizing and protecting transistors
#290Semiconductor inspection apparatus
#291SEMICONDUCTOR DEVICE TESTING APPARATUS, SEMICONDUCTOR DEVICE TESTING METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
#292Probe card and method for performing an unclamped inductive switching test using multiple equal-length interconnection lines emanating from a common connection node
#293Gate dielectric protection for transistors
#294Evaluation method for oxide semiconductor thin film, quality control method for oxide semiconductor thin film, and evaluation element and evaluation device used in the evaluation method
#295Circuit and method for detecting short circuit failure of a switching transistor
#296Method and strategy for multiplexing battery cycler hardware
#297Method and apparatus for identifying defects in a chemical sensor array
#298Atom probe tomography sample preparation for three-dimensional (3D) semiconductor devices
#299Method and apparatus for identifying defects in a chemical sensor array
#300High di/dt capacity measurement hardware