171725 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of individual semiconductor devices; Circuits therefor for testing field effect transistors, i.e. FET's for measuring noise
DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZATION
#2SYSTEMS AND METHOD TO TEST SEMICONDUCTOR DEVICES
#3Machine Learning-based Tool to Characterize Individual Oxide Defects
#4INSPECTION DEVICE AND ELECTRONIC CONTROL DEVICE
#5IMPROVED DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZATION
#6DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZATION
#7SYSTEMS AND METHOD TO TEST SEMICONDUCTOR DEVICES
#8Direct current measurement of 1/f transistor noise
#9Methods and systems to test semiconductor devices based on dynamically updated boundary values
#10Noise parameter determination of scalable devices
#11Direct measurement test structures for measuring static random access memory static noise margin
#12Evaluation method, estimation method, evaluation apparatus, and combined evaluation apparatus
#13Random number generation
#14Direct current measurement of 1/f transistor noise
#15Evaluation method, estimation method, evaluation apparatus, and combined evaluation apparatus
#16Semiconductor device and method of inspecting a semiconductor device
#17Non-contact method to monitor and quantify effective work function of metals
#18Using a shared local oscillator to make low-noise vector measurements
#19Noise temperature extraction procedure for characterization of on-wafer devices
#20Variable impedance device
#21Method of extracting a time constant from complex random telegraph signals
#22Semiconductor Device and Testing Method Thereof, and Resistance Measurement Apparatus
#23Method for asynchronous impulse response measurement between separately clocked systems