171770 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Specific tests of electronic circuits not provided for elsewhere; Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
Sub-classes:METHOD AND APPARATUS OF PREDICTING ENDURANCE OF CHIP, MEDIUM, AND ELECTRONIC DEVICE
#2ELECTRONIC COMPONENT TEST METHOD OPTIMIZED BY A LEARNING ALGORITHM
#3TEST AND/OR MEASUREMENT INSTRUMENT, METHOD FOR PROCESSING AN ELECTRICAL SIGNAL, AND COMPUTER-IMPLEMENTED METHOD FOR TRAINING
#4CHIP QUALITY TESTING OPTIMIZATION
#5ENTROPY BASED SOFTWARE CLOCK RECOVERY FOR REAL-EQUIVALENT-TIME OSCILLOSCOPES
#6ELECTRICAL DEVICE CONDITION DETERMINING SENSOR AND METHOD
#7Method and System of Developing and Executing Test Program for Verifying DUT
#8PARTIAL DISCHARGE DETERMINATION APPARATUS AND PARTIAL DISCHARGE DETERMINATION METHOD
#9METHOD FOR PREDICTING A REMAINING FAILURE OR LIFETIME OF AN ELECTRICAL COMPONENT OF AN ELECTRICAL CIRCUIT
#10SYSTEMS AND METHODS FOR REMAINING USEFUL LIFE PREDICTION IN ELECTRONICS
#11Onboard circuits and methods to predict the health of critical elements
#12Recipe information presentation system and recipe error inference system
#13Managing health condition of a rotating system
#14Signal detection and monitoring
#15SEMICONDUCTOR PRODUCT GRADING METHOD AND GRADING SYSTEM
#16Electrical power analyzer for large and small scale devices for environmental and ecological optimization
#17Collaborative AI on transactional data with privacy guarantees
#18Degradation estimation apparatus, computer program, and degradation estimation method
#19Solar array fault detection, classification, and localization using deep neural nets
#20Analog-circuit fault diagnosis method based on continuous wavelet analysis and ELM neural network
#21Method and electronic system for detecting rail switch degradation and failures
#22Tester and method for testing a device under test and tester and method for determining a single decision function
#23Recording medium recording via lifetime calculation program, via lifetime calculation method, and information processing device
#24Automated analog fault injection
#25Information processing system and information processing method
#26Multilevel fault simulations for integrated circuits (IC)
#27Inspection-guided critical site selection for critical dimension measurement
#28Universal automated testing of embedded systems
#29DEVICE, SYSTEM AND METHOD FOR DETECTING DEGRADATION OF A FLEXIBLE CIRCUIT
#30Battery simulator
#31Programmable actuator simulation card
#32Closed loop simulation of a computer model of a physical system and an actual real-time hardware component of the physical system
#33Computer systems and computer-implemented methods for warning users of overload conditions in power distribution systems
#34Method for recognizing partial discharges emitted inside or outside an electrical apparatus
#35Substrate inspection apparatus
#36System and method for testing vehicle traction battery components
#37Techniques for determining a fault probability of a location on a chip
#38Probe card analysis system and method
#39METHOD AND APPARATUS FOR DETECTING DEVICE ANOMALY
#40Fault diagnosis based on design partitioning
#41AUTOMATIC FAULT INSERTION, CALIBRATION AND TEST SYSTEM
#42METHOD FOR ANALYZING CORRELATIONS AMONG DEVICE ELECTRICAL CHARACTERISTICS AND METHOD FOR OPTIMIZING DEVICE STRUCTURE
#43SIMULATING AN UMBILICAL
#44Method and apparatus for de-embedding
#45Thread allocation and clock cycle adjustment in an interleaved multi-threaded processor
#46Transformer within wafer test probe
#47Computer program and computer system for producing test flow
#48Probe card analysis system and method
#49Method and apparatus for determining relevance values for a detection of a fault on a chip and for determining a fault probability of a location on a chip
#50Method and apparatus of deembedding
#51TESTING APPARATUS FOR COMPUTER MOTHERBOARD DESIGN
#52Failure analysis method, apparatus, and program for semiconductor integrated circuit
#53Test Time Calculator
#54Circuit card assembly testing system for a missile and launcher test set
#55Dynamically estimating lifetime of a semiconductor device
#56LOAD SIMULATOR
#57DETERMINING AND ANALYZING INTEGRATED CIRCUIT YIELD AND QUALITY
#58Proactive detection of metal whiskers in computer systems
#59Multi-site probe
#60Method for performing failure mode and effects analysis of an integrated circuit and computer program product therefor
#61Defect localization based on defective cell diagnosis
#62Methods and apparatus for diagnosing a degree of interference between a plurality of faults in a system under test
#63Fault detection method and apparatus for analog to digital converter circuits
#64Variable-Structure diagnostics approach achieving optimized low-frequency data sampling for EMA motoring subsystem
#65Using neighborhood functions to extract logical models of physical failures using layout based diagnosis
#66Using a virtual profile library
#67System and method for determining probing locations on IC
#68Apparatus for testing a chip and methods of making and using the same
#69Variable-structure diagnostics approach achieving optimized low-frequency data sampling for EMA motoring subsystem
#70Logic circuit for board power-supply evaluation and board power-supply evaluating method
#71State-of-health monitoring and fault diagnosis with adaptive thresholds for integrated vehicle stability system
#72Flexible hybrid defect classification for semiconductor manufacturing
#73Fault detecting method and layout method for semiconductor integrated circuit
#74Simulator cart
#75Fault detecting method and layout method for semiconductor integrated circuit
#76Detection of pump cavitation/blockage and seal failure via current signature analysis
#77Determining and analyzing integrated circuit yield and quality
#78Fault dictionaries for integrated circuit yield and quality analysis methods and systems
#79Integrated circuit yield and quality analysis methods and systems
#80System of simulating resistive loads
#81Method and apparatus for configuration of automated debug of in-circuit tests
#82Apparatus and method for detecting photon emissions from transistors
#83Variable-structure diagnostics approach achieving optimized low-frequency data sampling for EMA motoring subsystem
#84Circuit board diagnostic operating center
#85Systems and methods for defining acceptable device interconnect, and for evaluating device interconnect
#86Modeling process for integrated circuit film resistors
#87Semiconductor test data analysis system
#88Method of diagnosing a fault on a transformer winding
#89Transformer testing
#90Extracting semiconductor device model parameters
#91Method and a system for evaluating aging of components, and computer program product therefor
#92Electrical device condition determining sensor and method
#93Protocol analysis and visualization during simulation
#94Arc plasma-generating systems and methods thereof