CLOSED LOOP ADAPTIVE GENERATIVE ADVERSARILY NETWORK FILTER

SYSTEM AND METHODS FOR CRITICAL PATH TRACKING SYSTEM-ON-CHIP

COMMUNICATION CIRCUITS WITH REDUCED KICKBACK NOISE OF EYE OPENING MONITOR

HIGH PERFORMANCE TEST INTERFACES FOR SEMICONDUCTOR DEVICES

NOISE MODEL GENERATING METHOD AND NOISE MODEL GENERATING DEVICE

Interactive DRAM signal analyzer and method of analyzing and calibrating DRAM signal using the same

USE OF A DATA SYMBOL ERROR BOUNDARY VIOLATION AS A TRIGGER SOURCE FOR SIGNAL CAPTURE AND STORAGE

METHOD FOR ANALYZING A DEMODULATED MEASUREMENT SIGNAL, COMPUTER-READABLE STORAGE MEDIUM, AND TEST INSTRUMENT

GENERATING A TEST PROGRAM

MEASUREMENT APPLICATION DEVICE AND METHOD

SIGNAL ABNORMALITY DETECTION SYSTEM AND METHOD THEREOF

OSCILLATION HANDLING METHOD, APPARATUS USING THE SAME, AND STORAGE MEDIUM

TECHNIQUE FOR ENABLING ON-DIE NOISE MEASUREMENT DURING ATE TESTING AND IST

Method and system for detecting glitch at high sampling rate

ELECTRICAL OPERATING DEVICE AND METHOD FOR RECOGNIZING MALFUNCTIONS

Identifying data valid windows

Transition fault testing of functionally asynchronous paths in an integrated circuit

TEST METHOD FOR HIGH-SPEED SIGNAL FREQUENCY MEASUREMENT AND SIGNAL INTEGRITY

Signal processing apparatus and method for mixing a high frequency signal

System and method for separation and classification of signals using cyclic loop images

SYSTEM AND METHOD FOR MULTI-LEVEL SIGNAL CYCLIC LOOP IMAGE REPRESENTATIONS FOR MEASUREMENTS AND MACHINE LEARNING

Cyclic loop image representation for waveform data

Measurement of internal wire delay

Signal analyzer and method of analyzing a signal

Signal analysis method and measurement instrument

MEASUREMENT SYSTEM AND METHOD FOR AUTOMATED MEASUREMENT OF SEVERAL CONTRIBUTIONS TO SIGNAL DEGRADATION

Low frequency S-parameter measurement

Test apparatuses including probe card for testing semiconductor devices and operation methods thereof

Noise source monitoring apparatus and noise source monitoring method

Tester and method for testing a device under test and tester and method for determining a single decision function

System and method for providing automation of microprocessor analog input stimulation

Crosstalk generation and detection for digital isolators

Transistion fault testing of funtionally asynchronous paths in an integrated circuit

Systems and methods for duty cycle measurement, analysis, and compensation

Semiconductor device and semiconductor system

Technique for determining performance characteristics of electronic devices and systems

Test circuits for integrated circuit counterfeit detection

Signal quality detection circuit for generating signal quality detection result according to two-dimensional nominal sampling point pattern and associated signal quality detection method

Eye pattern measurement apparatus, and clock and data recovery system and method of the same

Processing method and electronic apparatus for digital signal

Enhancing spectral purity in high-speed testing

NOISE DETECTION CIRCUIT AND SEMICONDUCTOR SYSTEM USING THE SAME

Technique for determining performance characteristics of electronic devices and systems

Method, device and article to test digital circuits

Semiconductor device and semiconductor system

Backplane testing system

Semiconductor chip, test system, and method of testing the semiconductor chip

Method and apparatus for injecting fault and analyzing fault tolerance

On-chip eye diagram capture

Noise detection circuit and semiconductor system using the same

Multi-wire electrical parameter measurements via test patterns

Apparatus and method for self-testing a component for signal recovery

On-chip eye diagram capture

Radio-frequency ion channel antenna

Adaptive digital delay line for characterization of clock uncertainties

Apparatus and method for self-testing a component for signal recovery

Technique for determining performance characteristics of electronic devices and systems

METHODS AND STRUCTURE FOR ANALYZING DIFFERENT SIGNALING PATHWAYS THROUGH A TEST SIGNAL SELECTION HIERARCHY

Method of analyzing coupling effect between signal lines in an integrated circuit

ON-CHIP SIGNAL WAVEFORM MEASUREMENT CIRCUIT

Method and a device for preventing signal-edge losses

Methods and structure for on-chip clock jitter testing and analysis

Technique for determining performance characteristics of electronic devices and systems

Enforcing Worst-Case Behavior During Transmit Channel Analysis

Method and apparatus for determining a calibration signal

Method and device for predicting a figure of merit from a distribution

Cancellation of crosstalk energy in communication loops

Apparatus and method for eye margin calculating, and computer-readable recording medium recording program therefof

System and Method for Sample Point Analysis with Threshold Setting

Technique for measuring power source noise generated inside integrated circuit

Signal measuring device and signal measuring method

Probability density function separating apparatus, probability density function separating method, noise separating apparatus, noise separating method, testing apparatus, testing method, calculating apparatus, calculating method, program, and recording medium

Apparatus for generating clock signal with jitter and test apparatus including the same

In-situ jitter tolerance testing for serial input output

Semiconductor integrated circuit, control method, and information processing apparatus

Programmable duty cycle distortion generation circuit

Methods and apparatus for determining a switching history time constant in an integrated circuit device

Method and apparatus for synchronizing signals in a testing system

Signal measuring device

Technique for determining performance characteristics of electronic devices and systems

Generating worst case test sequences for non-linearly driven channels

Signal measurement apparatus and test apparatus

Radio frequency integrated circuit with on-chip noise source for self-test

Analog signal test using a-priori information

On-chip frequency response measurement

System and method for removal of frequency-dependent timing distortion

Probability density function separating apparatus, probability density function separating method, program, testing apparatus, bit error rate measuring apparatus, electronic device, and jitter transfer function measuring apparatus

Apparatus and method for determining the slew rate of a signal produced by an integrated circuit

System and method for automation of hardware signal characterization and signal integrity verification

TEST APPARATUS FOR TESTING A CIRCUIT UNIT

Method and apparatus for adaptive power adjustment based on reduction of cross-talk between DSLs

Probability density function separating apparatus, probability density function separating method, program, testing apparatus, bit error rate measuring apparatus, electronic device, and jitter transfer function measuring apparatus

On-chip self test circuit and self test method for signal distortion

ON-CHIP HIGH-SPEED SERIAL DATA ANALYZERS, SYSTEMS, AND ASSOCIATED METHODS

Device for Measurement and Analysis of Electrical Signals of an Integrated Circuit Component

Power source noise measuring device, integrated circuit, and semiconductor device

Probability density function separating apparatus, probability density function separating method, testing apparatus, bit error rate measuring apparatus, electronic device, and program

Adaptive self-linearization with separation filter

Anti-tamper enclosure system comprising a photosensitive sensor and optical medium

Integrated circuit wearout detection

Performing a signal analysis based on digital samples in conjunction with analog samples

Analog-type measurements for a logic analyzer

Measuring apparatus, measuring method, testing apparatus, testing method, and electronic device

Semiconductor integrated circuit system, semiconductor integrated circuit, operating system, and control method for semiconductor integrated circuit

Digital data signal analysis by evaluating sampled values in conjunction with signal bit values

Method and apparatus for synchronizing signals in a testing system

Method and apparatus for quantitatively determining severity of degradation in a signal

Digital data signal testing using arbitrary test signal

Power supply history monitor

Method and device for verifying timing in a semiconductor integrated circuit

Modeling device variations in integrated circuit design

Timing, noise, and power analysis of integrated circuits

Test data generator, test system and method thereof

Apparatus and method for verifying glitch-free operation of a multiplexer

System and method for measuring on-chip supply noise

Cancellation of crosstalk energy in communication loops

System, method and device for reducing electromagnetic emissions and susceptibility from electrical and electronic devices

System and method for on/off-chip characterization of pulse-width limiter outputs

Semiconductor device test method using an evaluation LSI

System and method of determining the speed of digital application specific integrated circuits

On-chip high-speed serial data analyzers, systems, and associated methods

Method and system for timing measurement of embedded macro module

Device for measurement and analysis of electrical signals of an integrated circuit component

Method for testing the sensitive input range of Byzantine filters

Error detection apparatus and method and signal extractor

On-chip self test circuit and self test method for signal distortion

Technique for determining performance characteristics of electronic devices and systems

Method and apparatus for deferred decision signal quality analysis

Method and apparatus for visually indicating mask violation locations

Graphical test development tool for use with automated test equipment

Test system with differential signal measurement

Method and apparatus for creating performance limits from parametric measurements

Electromagnetic interface module for balanced data communication

Method and apparatus for synchronizing signals in a testing system

Systems and methods for non-intrusive testing of signals between circuits

Device for measurement and analysis of electrical signals of an integrated circuit component

Device for measurement and analysis of electrical signals of an integrated circuit component

Cross-correlation measurements for modulation quality measurements