JITTER INJECTION GENERATOR FOR MEASURING PHASE NOISE AND JITTER TRANSFER FUNCTION

APPARATUS AND METHODS FOR JITTER TESTING OF CLOCK SIGNALS

JITTER SENSOR CIRCUIT

TEST AND/OR MEASUREMENT INSTRUMENT FOR MEASURING AN ELECTRICAL SIGNAL

ADHESIVE COMPOSITION AND METHODS OF FORMING THE SAME

APPARATUSES AND METHODS FOR JITTER MEASUREMENT

JITTER MEASUREMENT CIRCUIT AND JITTER MEASUREMENT METHOD

RECEIVING CIRCUIT IN TEST DEVICE, TEST SYSTEM HAVING THE SAME, AND OPERATING METHOD THEREOF

SUB-SAMPLED BASED INSTRUMENT NOISE CORRECTION FOR JITTER MEASUREMENTS

CLASSIFYING COMPARATORS BASED ON COMPARATOR OFFSETS

MULTIPLE PULSE EXTRACTION FOR TRANSMITTER CALIBRATION

METHOD FOR SEPARATING AND MODELING N-UI JITTER BASED ON SPECTRUM

TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION

JITTER MEASURING CIRCUIT, JITTER ANALYZING APPARATUS INCLUDING THE SAME, AND RELATED METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES

PERIODIC JITTER DETERMINATION FOR A PHASE NOISE MEASUREMENT

Inspection device for a semiconductor device

Hybrid solver for integrated circuit diagnostics and testing

On-die clock period jitter and duty cycle analyzer

SYSTEMS AND METHODS FOR ON-CHIP NOISE MEASUREMENTS

Jitter noise detector

Sub-sampled based instrument noise correction for jitter measurements

System and method for receiver equalization and stressed eye testing methodology for DDR5 memory controller

Apparatuses, Methods and Computer Programs for Executing an Executable, andMethod for Distributing Software or Firmwares

Method and Apparatus for Analyzing Phase Noise in a Signal from an Electronic Device

SYSTEMS AND METHODS FOR JITTER INJECTION WITH PRE- AND POST- EMPHASIS CIRCUITS IN AUTOMATIC TESTING EQUIPMENT (ATE)

System testing using partitioned and controlled noise

Method of updating firmware of chip stably and effectively, firmware updating apparatus, and computer readable storage medium applying method

Jitter noise detector

JITTER DETERMINATION METHOD AND MEASUREMENT INSTRUMENT

Circuits and methods to alter a phase speed of an output clock

Data recovery method and measurement instrument

Noise-compensated jitter measurement instrument and methods

Built-in self test circuit for measuring phase noise of a phase locked loop

Jitter self-test using timestamps

Method and apparatus for analyzing phase noise in a signal from an electronic device

Time and frequency domain signal conditioning device for switching noise jitter (SNJ) reduction, and methods of making the same

Electronic circuit for online monitoring a clock signal

Time measurement of a clock-based signal

Systems and methods for testing jitter tolerance

Measuring error in signal under test (SUT) using multiple channel measurement device

Measuring error in signal under test (SUT) using multiple channel measurement device

Instrument noise correction for jitter measurements

Modulating jitter frequency as switching frequency approaches jitter frequency

Integrated circuit having receiver jitter tolerance (“JTOL”) measurement

Temporal jitter analyzer and analyzing temporal jitter

Jitter monitoring circuit

Jitter self-test using timestamps

Built-in self test circuit for measuring phase noise of a phase locked loop

Signal analysis method and measurement instrument

Noise injection circuit

Jitter noise detector

Vehicle control device and control method thereof

Method and apparatus for analyzing phase noise in a signal from an electronic device

System and method for receiver equalization and stressed eye testing methodology for DDR5 memory controller

Jitter monitoring circuit

Modulating jitter frequency as switching frequency approaches jitter frequency

Testing device and testing method for testing a device under test

Classifying comparators based on comparator offsets

Real-time jitter impairment insertion for signal sources

Adhesive composition and methods of forming the same

Built-in self test circuit for measuring phase noise of a phase locked loop

Integrated circuit that injects offsets into recovered clock to simulate presence of jitter in input signal

Millimeter wave active load pull using low frequency phase and amplitude tuning

Measuring error in signal under test (SUT) using multiple channel measurement device

On-chip spread spectrum characterization

Method of measuring clock jitter, clock jitter measurement circuit, and semiconductor devices including the same

Techniques and circuits for time-interleaved injection locked voltage controlled oscillators with jitter accumulation reset

Method and apparatus for analyzing phase noise in a signal from an electronic device

Test apparatus and test method

Variable ISI transmission channel apparatus

Jitter monitoring circuit

Eye pattern generator

Apparatus and method for generating clock signal with low jitter and constant frequency while consuming low power

Techniques and circuits for on-chip jitter and phase noise measurement in a digital test environment

Equalizer for limited intersymbol interference

Circuit arrangement for switching noise jitter (SNJ) reduction in feedback control loop circuits, and methods of making the same

Method of measuring clock jitter, clock jitter measurement circuit, and semiconductor device including the same

Determining ambient noise in a device under test electromagnetic compatibility test environment

Modulating jitter frequency as switching frequency approaches jitter frequency

Time and frequency domain signal conditioning device for switching noise jitter (SNJ) reduction, and methods of making the same

Jitter noise detector

Apparatus for adding jitters to the edges of a pulse sequence

Integrated RF circuit with phase-noise test capability

Jitter measurement circuit and jitter measurement system

Receiver clock test circuitry and related methods and apparatuses

Modulating jitter frequency as switching frequency approaches jitter frequency

C-PHY training pattern for adaptive equalization, adaptive edge tracking and delay calibration

Apparatus and method for controllably injecting jitter into recovered clock to simulate presence of jitter in input signal

Determining ambient noise in a device under test electromagnetic compatibility test environment

Clock jitter measurement circuit and semiconductor device including the same

Phase noise measurement and filtering circuit

Debugging method executed via scan chain for scan test and related circuitry system

Circuit for introducing signal jitter

Integrated circuit having receiver jitter tolerance (“JTOL”) measurement

Tuning a testing apparatus for measuring skew

Tuning a testing apparatus for measuring skew

On-chip apparatus and method for jitter measurement

Jitter control circuit within chip and associated jitter control method

DFE margin test methods and circuits that decouple sample feedback timing

Phase noise measurement and filtering circuit

Receiver clock test circuitry and related methods and apparatuses

Controlling clock measurement with transistors, capacitor, OPAMP, ADC, external enable

Selectable phase or cycle jitter detector

Double quadrature with adaptive phase shift for improved phase reference performance

Phase noise correction system for discrete time signal processing

Sensor data damping

Dynamic control of signaling power based on an error rate

Distortion measurement for limiting jitter in PAM transmitters

Adaptive voltage scaling mechanism based on voltage shoot measurement

Clock jitter and power supply noise analysis

HIGH RESOLUTION CURRENT PULSE ANALOG MEASUREMENT

Receiver circuit, semiconductor integrated circuit, and test method

Determining worst-case bit patterns based upon data-dependent jitter

Method and apparatus for generating jitter-related data

Signal processing apparatus and signal processing method thereof

Selectable phase or cycle jitter detector

Digitally controlled jitter injection for built in self-testing (BIST)

Universal jitter meter and phase noise measurement

On-chip interferers for standards compliant jitter tolerance testing

Receiver clock test circuitry and related methods and apparatuses

Jitter measuring trigger generator, jitter measuring apparatus using the same, method of generating jitter measuring trigger, and method of measuring jitter

Apparatus for determining a number of successive equal bits preceding an edge within a bit stream and apparatus for reconstructing a repetitive bit sequence

Method and system for testing jitter compatibility

Integrated circuit having receiver jitter tolerance (“JTOL”) measurement

Low-power and low-cost adaptive self-linearization system with fast convergence

CHARACTERIZATION OF THE JITTER OF A CLOCK SIGNAL

TEST CHIP AND CHIP TEST SYSTEM USING THE SAME

Apparatus comprising a recursive delayer and method for measuring a phase noise

System and method for on-chip jitter and duty cycle measurement

Test device and test method for measuring a phase noise of a test signal

Variable inter symbol interference generator

Measurement of Parameters Within an Integrated Circuit Chip Using a Nano-Probe

SerDes jitter tolerance BIST in production loopback testing with enhanced spread spectrum clock generation circuit

Optical signal output apparatus, electrical signal output apparatus, and test apparatus

System for independently modifying jitter and noise components in a signal digitizing instrument

Circuit and method for on-chip jitter measurement

Apparatus and method for generating a test signal with emulated crosstalk

Methods and structure for on-chip clock jitter testing and analysis

MEASUREMENT APPARATUS, MEASUREMENT METHOD, TEST APPARATUS AND RECORDING MEDIUM

CLOCK JITTER ANALYZING METHOD AND APPARATUS

Method for decomposing and analyzing jitter using spectral analysis and time-domain probability density

Data signal quality evaluation apparatus

Apparatus and Method for Generating a Waveform Test Signal Having Crest Factor Emulation of Random Jitter

TEST APPARATUS, MEASUREMENT APPARATUS, AND ELECTRONIC DEVICE

Generating a jittered digital signal using a serializer device

Time measurement circuit

DLL for period jitter measurement

Method and device for analyzing the behavior of a power supply in a circuit

Estimating bit error rate performance of signals

Ultrasensitive detection platform for sensing magnetic and/or electrical energy change

System for Independently Modifying Jitter and Noise Components in a Signal Measurement Device

Method and device for clock data recovery

OPTICAL DISC DRIVE, OPTICAL STORAGE MEDIUM, OPTICAL STORAGE MEDIUM INSPECTION APPARATUS, AND OPTICAL STORAGE MEDIUM INSPECTION METHOD

Method and system for correcting error in a PLL generated clock signal using a system clock of lower frequency and/or accuracy

Signal analyzing apparatus

Jitter calculating device, jitter calculating method and jitter calculating program

APPARATUS AND METHOD FOR MEASURING PHASE NOISE/JITTER IN DEVICES UNDER TEST

Method for speeding up serial data tolerance testing

Semiconductor device and data processing system

SYSTEMS AND METHODS FOR A PHASE LOCKED LOOP BUILT IN SELF TEST

TEST APPARATUS, TEST METHOD, AND DEVICE

Correcting apparatus, PDF measurement apparatus, jitter measurement apparatus, jitter separation apparatus, electric device, correcting method, program, and recording medium

Jitter measuring apparatus

Noise suppression techniques in high precision long-term frequency/timing measurements

System that measures characteristics of output signal

Fast SERDES I/O characterization

Systems and methods for built in self test jitter measurement

Jitter generating circuit

Evaluation apparatus, evaluation method, program, recording medium and electronic device

System and method for on-chip jitter and duty cycle measurement

Jitter addition apparatus and test apparatus

Jitter generation apparatus, device test system using the same, and jitter generation method

Noise measurement apparatus and test apparatus

Method and device for clock-data recovery

Signal Integrity Measurement Systems and Methods Using a Predominantly Digital Time-Base Generator

Calculation apparatus, calculation method, program, recording medium, test system and electronic device

DETERMINISTIC COMPONENT MODEL JUDGING APPARATUS, JUDGING METHOD, PROGRAM, RECORDING MEDIUM, TEST SYSTEM AND ELECTRONIC DEVICE

Integrated circuit having receiver jitter tolerance (“JTOL”) measurement

Test apparatus and test method

Jitter measurement apparatus, jitter calculator, jitter measurement method, program, recording medium, communication system and test apparatus

ELECTRONIC DEVICE AND TEST METHOD OF ELECTRONIC DEVICE

Clock Jitter Analysis

Technique for measuring power source noise generated inside integrated circuit

System and circuit for determining data signal jitter via asynchronous sampling

System and method for on-chip jitter injection

DFE Margin Test Methods and Circuits that Decouple Sample and Feedback Timing

SYSTEM, METHOD AND APPARATUS FOR ACCURATE SIGNAL ANALYSIS

Probability density function separating apparatus, probability density function separating method, noise separating apparatus, noise separating method, testing apparatus, testing method, calculating apparatus, calculating method, program, and recording medium

Method and system of testing device sensitivity

Method and apparatus for on-chip phase error measurement to determine jitter in phase-locked loops

Method and apparatus for on-chip phase error measurement to determine jitter in phase-locked loops

Programmable jitter generation circuit

Skew measurement apparatus, skew measurement method, recording media and test apparatus

Jitter measurement apparatus, jitter measurement method, recording media, communication system and test apparatus

Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method

Clock jitter measurement circuit and integrated circuit having the same

Measurement apparatus and measurement method

Sequential equivalent—time sampling with an asynchronous reference clock

Measurement and Display for Video Peak Jitter with Expected Probability

Switched length match transmission path instrument

Signal generator producing intersymbol interference effects on serial data

Jitter injection circuit, pattern generator, test apparatus, and electronic device

Jitter injection circuit, pattern generator, test apparatus, and electronic device

Noise separating apparatus, noise separating method, probability density function separating apparatus, probability density function separating method, testing apparatus, electronic device, program, and recording medium

Jitter amount estimating method, method for calculating correlation between amount of simultaneously operating signal noise and jitter amount, and recording medium

JITTER APPLYING CIRCUIT AND TEST APPARATUS

System and method for electronic testing of devices

System and method for electronic testing of devices

Jitter generator for generating jittered clock signal

Timing generator and semiconductor testing apparatus

Fast low frequency jitter rejection methodology

SEMICONDUCTOR INTEGRATED CIRCUIT APPARATUS, MEASUREMENT RESULT MANAGEMENT SYSTEM, AND MANAGEMENT SERVER

TIMEBASE VARIATION COMPENSATION IN A MEASUREMENT INSTRUMENT

SPECTRAL DECOMPOSITION OF LARGE SIGNALS IN A NARROW-RANGE SAMPLING SYSTEM

Device for jitter measurement and method thereof

AUTOMATIC JITTER MEASUREMENT METHOD

Circuit and method for on-chip jitter measurement

Built-in jitter measurement circuit

Jitter measuring system and method

Waveform signal generator with jitter or noise on a desired bit

Electronic circuit comprising a device to measure phase noise of an oscillating and/or resonant device

Electromagnetic tracking employing scalar-magnetometer

Determining a time interval based on a first signal, a second signal, and a jitter of the first signal

Ring oscillation circuit, delay time measuring circuit, testing circuit, clock generating circuit, image sensor, pulse generating circuit, semiconductor integrated circuit, and testing method thereof

Probability density function separating apparatus, probability density function separating method, program, testing apparatus, bit error rate measuring apparatus, electronic device, and jitter transfer function measuring apparatus

Jitter injection circuit, electronics device, and test apparatus

Test apparatus

Circuit device and method of measuring clock jitter

Method, system and apparatus for quantifying the contribution of inter-symbol interference jitter on timing skew budget

Periodic jitter (PJ) measurement methodology

Electronic device and method for on chip skew measurement

Electronic device and method for on chip jitter measurement

Test apparatus, and device for calibration

Phase measurement apparatus

Calibrating jitter

On-chip jitter measurement circuit

Low-power and low-cost adaptive self-linearization system with fast convergence

Periodic jitter (PJ) measurement methodology

Creation of clock and data simulation vectors with periodic jitter

Noise checking method and apparatus, and computer-readable recording medium in which noise checking program is stored

MEASUREMENT APPARATUS, MEASUREMENT METHOD, TEST APPARATUS, ELECTRONIC DEVICE, AND RECORDING MEDIUM

Optical storage medium inspection method for determining if an optical storage medium is good or defective

Jitter detection circuit and jitter detection method

Transmitter/receiver device that converts serial and parallel signals and method of testing thereof

Synthesis and generation of arbitrary waveforms with ISI components for jitter tolerance

CHANGING POINT DETECTING CIRCUIT, JITTER MEASURING APPARATUS AND TEST APPARATUS

Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method

Semiconductor integrated circuit

Probability density function separating apparatus, probability density function separating method, program, testing apparatus, bit error rate measuring apparatus, electronic device, and jitter transfer function measuring apparatus

System and circuit for constructing a synchronous signal diagram from asynchronously sampled data

Semiconductor device, and test circuit and test method for testing semiconductor device

Time interval measuring apparatus and jitter measuring apparatus using the same

Method and apparatus for on-chip phase error measurement to determine jitter in phase-locked loops

Identifying periodic jitter in a signal

Jitter amplifier circuit, signal generation circuit, semiconductor chip, and test apparatus

Signal generation circuit, jitter injection circuit, semiconductor chip and test apparatus

Semiconductor device

Clock jitter detector

Quantized data-dependent jitter injection using discrete samples

Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method

Optical storage medium inspection apparatus for determining whether an optical storage medium is good or defective

Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method

Semiconductor Integrated Circuit Having Jitter Measuring Function

Method and apparatus for constructing a synchronous signal diagram from asynchronously sampled data

Jitter frequency determining system

Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method

Determining frequency components of jitter

Power source noise measuring device, integrated circuit, and semiconductor device

Probability density function separating apparatus, probability density function separating method, testing apparatus, bit error rate measuring apparatus, electronic device, and program

Delay circuit, jitter injection circuit, and test apparatus

Calibration apparatus, calibration method, and testing apparatus

Calibration apparatus, calibration method, and testing apparatus

Transport delay and jitter measurements

NOISE SEPARATING APPARATUS, NOISE SEPARATING METHOD, PROBABILITY DENSITY FUNCTION SEPARATING APPARATUS, PROBABILITY DENSITY FUNCTION SEPARATING METHOD, TESTING APPARATUS, ELECTRONIC DEVICE, PROGRAM, AND RECORDING MEDIUM

Jitter measurement apparatus, jitter measurement method, and recording medium

Signal integrity measurement systems and methods using a predominantly digital time-base generator

Efficient Characterization of High-Speed Circuits

Test circuit, system, and method for testing one or more circuit components arranged upon a common printed circuit board

Circuit and method for on-chip jitter measurement

Determining data signal jitter via asynchronous sampling

Semiconductor integrated circuit apparatus, measurement result management system, and management server

Characterizing jitter sensitivity of a serializer/deserializer circuit

Method and system for measuring band pass filtered phase noise of a repetitive signal

Calibration apparatus, calibration method, testing apparatus, and testing method

Method and apparatus for determining jitter and pulse width from clock signal comparisons

Jitter amplifier, jitter amplification method, electronic device, testing apparatus, and testing method

Calibration apparatus, calibration method, testing apparatus, and testing method

System and method for voltage noise and jitter measurement using time-resolved emission

Jitter measuring circuit

Estimating of the jitter of a clock signal

Digital signal analysis program and waveform display apparatus

Jitter measurement apparatus, electronic device, and test apparatus

Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device

Dynamic phase offset measurement

Jitter detection and reduction

Jitter measurements for repetitive clock signals

Digital jitter detector

Simultaneous display of eye diagram and jitter profile during device characterization

Timing analysis apparatus and method of timing analysis

Memory controller and method for operating a memory controller having an integrated bit error rate circuit