Estimating bit error rate performance of signals

Jitter generation

PLL with programmable jitter for loopback serdes testing and the like

Determining frequency components of jitter

Jitter measurement algorithm using locally in-order strobes

Jitter measuring apparatus, jitter measuring method and test apparatus

High-speed transceiver tester incorporating jitter injection

Jitter spectrum analysis using random sampling (RS)

Jitter measuring apparatus, jitter measuring method and test apparatus

Test apparatus, clock generator and electronic device

Serializer/deserializer circuit for jitter sensitivity characterization

Apparatus for low noise and jitter injection in test applications

Apparatus for and method of measuring clock skew

Jitter producing circuitry and methods

Method and system for determining noise components of an analog-to-digital converter

Jitter producing circuitry and methods

Sampling device and sampling method

Clock jitter estimation apparatus, systems, and methods

Device and method for measuring jitter

Semiconductor integrated circuit apparatus, measurement result management system, and management server

Jitter generator to simulate a closed data eye

Apparatus for measuring jitter and method of measuring jitter

Edge controlled fast data pattern generator

Switched length matched transmission path instrument

Jitter producing circuitry and methods

Source synchronous timing extraction, cyclization and sampling

Measuring components of jitter

Apparatus for measuring jitter and method of measuring jitter

Method and apparatus for measuring highly reflective channel performance

DFE margin test methods and circuits that decouple sample and feedback timing

Clock jitter calculation device, clock jitter calculation method, and clock jitter calculation program

Optical trigger for PICA technique

High performance signal generation

Test apparatus and test method for testing a device under test

Periodic jitter (PJ) measurement methodology

Waveform analyzer

Integrating time measurement circuit for a channel of a test card

Characterizing eye diagrams

System and method of generating test signals with injected data-dependent jitter (DDJ)

Modular numerical control having low-jitter synchronization

Method and apparatus for measuring jitter

Widening jitter margin for faster input pulse

Method and apparatus for estimating random jitter (RJ) and deterministic jitter (DJ) from bit error rate (BER)

System and method of obtaining data-dependent jitter (DDJ) estimates from measured signal data

System and method for analyzing jitter of signals

Method and system to measure data packet jitter

Jitter measuring apparatus, jitter measuring method and PLL circuit

Digital jitter synthesizer

Optical information device, optical storage medium, optical storage medium inspection device, and optical storage inspection method

Method and system for per-pin clock synthesis of an electronic device under test

Method of measuring jitter frequency response

System and method of obtaining random jitter estimates from measured signal data

Synchronization between low frequency and high frequency digital signals

Timing generator and semiconductor testing device

Wideband signal analyzing apparatus, wideband period jitter analyzing apparatus, and wideband skew analyzing apparatus

System and method for generating a jittered test signal

Measurement instrument and measurement method

Testing of integrated circuit receivers

Method and apparatus for creating performance limits from parametric measurements

Digital phase detector

Jitter measuring apparatus and a testing apparatus

Source synchronous timing extraction, cyclization and sampling

Built-in self test method and apparatus for jitter transfer, jitter tolerance, and FIFO data buffer

Apparatus for measuring jitter, method of measuring jitter and computer-readable medium storing a program thereof

Semiconductor integrated circuit apparatus, measurement result management system, and management server

Combination test method and test device

Testing apparatus and testing method

Circuit for producing a variable frequency clock signal having a high frequency low jitter pulse component

Testing device for testing electronic device and testing method thereof

Method and apparatus for measuring jitter

Method, system and apparatus for quantifying the contribution of inter-symbol interference jitter on timing skew budget

Programmable jitter signal generator

Circuit and method for measuring delay of high speed signals

Apparatus for jitter testing an IC

Device for testing LSI to be measured, jitter analyzer, and phase difference detector

Automated test of receiver sensitivity and receiver jitter tolerance of an integrated circuit

Spectral jitter analysis allowing jitter modulation waveform analysis

Fast-path implementation for an uplink double tagging engine

Programmable jitter generator

Method and apparatus for diagnosing jitter tolerance

On-chip jitter measurement circuit

Measuring apparatus and measuring method

Semiconductor device having PLL-circuit

Method and circuit for measuring on-chip, cycle-to-cycle clock jitter

Sigma-delta modulator with PWM output

Jitter injection generator for measuring phase noise and jitter transfer function

Phase noise measurement method and measurement system

Spur cancellation in a PLL system with an automatically updated target spur frequency

Clock recovery circuit and method of operating same

Measurement system and data transmission interface

System and method for jitter negation in a high speed serial interface

Method for asynchronous impulse response measurement between separately clocked systems

Using forward error correction coding to diagnose communication links

On-die jitter generator