171866 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits; Functional testing; Generation of test inputs, e.g. test vectors, patterns or sequences of patterns for devices arranged in a network
APPARATUS AND METHOD FOR PERFORMING A NETWORK DIAGNOSIS PROCEDURE
#2Method and device for testing system-on-chip, electronic device using method, and computer readable storage medium
#3Equivalent time network analyzer
#4Panel driving circuit that generates panel test pattern and panel test method thereof
#5Panel driving circuit that generates panel test pattern and panel test method thereof
#6Panel driving circuit that generates panel test pattern and panel test method thereof
#7Panel Driving Circuit that Generates Panel Test Pattern and Panel Test Method Thereof
#8TEST PATTERN CUSTOMIZATION OF HIGH SPEED SAS NETWORKS IN A MANUFACTURING TEST SYSTEM
#9Generating scan test vectors for proprietary cores using pseudo pins
#10Measuring microprocessor susceptibility to internal noise generation
#11SYSTEM AND METHOD FOR TESTING A NAS
#12Panel driving circuit that generates panel test pattern and panel test method thereof
#13Single-pass methods for generating test patterns for sequential circuits
#14Test network for a network on a chip and a configuration network