171868 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits; Functional testing; Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
METHOD AND APPARATUS FOR DETERMINING SETTLING OF ANALOG SIGNAL IN SEMICONDUCTOR DEVICE TESTING
#2SCAN CHAIN CONTROL
#3Method and device for testing a chain of flip-flops
#4Sequential circuit, scan chain circuit including the same and integrated circuit including the same
#5Semiconductor chip, test system, and method of testing the semiconductor chip
#6One-shot circuit
#7Diagnostic device, diagnostic method, program, and recording medium
#8Methods for generating test patterns for sequential circuits
#9Single-pass, concurrent-validation methods for generating test patterns for sequential circuits
#10Method for detecting a malfunction in a state machine
#11Apparatus and method to force equivalent outputs at start-up for replicated sequential circuits