SYSTEM AND METHOD FOR TESTING IDENTICAL CORES

COMPARATOR PATH LOSS COMPENSATION WITH ATTENUATOR

FAULT DETECTION CIRCUIT

SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE

FAULT DETECTION CIRCUIT

Test time reduction in circuits with redundancy flip-flops

MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL CIRCUITS

Integrated circuit with timing correction circuitry

Test load circuit

DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE

METHOD AND APPARATUS FOR INTEGRATED CIRCUIT TESTING

SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE

DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE

FUNCTIONAL SAFETY MECHANISMS FOR INPUT/OUTPUT (IO) CELLS

Semiconductor integrated circuit device and operating method thereof

Test method for control chip and related device

Power consumption measurement assembly and method, and chip power consumption measurement device

Systems and methods for ground fault detection

Method and apparatus for testing artificial intelligence chip, device and storage medium

Built-in self-test circuits and related methods

Detection of performance degradation in integrated circuits

Speaker load diagnostics

Semiconductor device, semiconductor system, and control method of semiconductor device

Fault detection

Automatic device detection and connection verification

Semiconductor device, semiconductor system, and control method of semiconductor device to monitor a power supply voltage

Method for making a semiconductor device including threshold voltage measurement circuitry

Semiconductor test system and method

Semiconductor test system and method

System and method for scan-testing of idle functional units in operating systems

Semiconductor test system and method

Automated test system with event detection capability

Comparison device and method for comparing test pattern files of a wafer tester

IC test circuitry with tri-state buffer, comparator, and scan cell

Apparatuses and methods for compressing data received over multiple memory accesses

Methods and systems for testing electronic circuits

Semiconductor test system and method

Test apparatus

TEST APPARATUS AND TEST METHOD

TEST APPARATUS

I/O and comparator circuitry with compare gate and mask circuitry

High speed test circuit and method

Measurement circuit and test apparatus

Comparison device and method for comparing test pattern files of a wafer tester

RECEIVING APPARATUS, TEST APPARATUS, RECEIVING METHOD, AND TEST METHOD

Pass/fail scan memory with AND, OR and trinary gates

Methods and systems for testing electronic circuits

Test apparatus, transmission apparatus, receiving apparatus, test method, transmission method and receiving method

Semiconductor test apparatus and test method

Chip testing circuit

TEST APPARATUS AND METHOD FOR MODULATED SIGNAL

Test apparatus

Test apparatus, demodulation apparatus, test method, demodulation method and electric device

APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT

Test apparatus and test method

Self-trim and self-test of on-chip values

Test apparatus, calibration method, program, and recording medium

Comparator with latching function

Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same

Monitoring circuit having a self test function

Method for monitoring whether the switching threshold of a switching transducer lies within a predefined tolerance range

Test Device and Test Method for Semiconductor Device

Systems and methods for filter based media defect detection

Signal generation and detection apparatus and tester

Test apparatus and performance board

Test device, test method and computer readable media

Voltage margin testing for proximity communication

Oscillation circuit, test apparatus and electronic device

REGULATOR CIRCUIT FOR TESTING INHERENT PERFORMANCE OF AN INTEGRATED CIRCUIT

On-chip test circuit for an embedded comparator

Semiconductor device, semiconductor device testing apparatus, and semiconductor device testing method

Semiconductor test device

Test apparatus

Integrated circuit arrangement and design method

Apparatus and method for determining the slew rate of a signal produced by an integrated circuit

Circuit testing apparatus for testing a device under test

TEST APPARATUS AND ELECTRONIC DEVICE

Pattern controlled, full speed ATE compare capability for deterministic and non-deterministic IC data

Test system for integrated circuits

Sub-instruction repeats for algorithmic pattern generators

Circuit testing apparatus

Test apparatus and test method

Digital apparatus and method of testing the same

Test apparatus and test method

Threshold voltage control apparatus, test apparatus, and circuit device

Evaluation circuit and method for detecting and/or locating faulty data words in a data stream T

Tester for testing semiconductor device

Systems and methods for continuity testing using a functional pattern

Test protocol manager for massive multi-site test

High-speed signal testing system having oscilloscope functionality

Method and system for trimming voltage or current references

Testing of embedded systems

Method for test of electronic component

TEST APPARATUS

Asynchronous digital data capture

Data capture in automatic test equipment

Apparatus and method for reducing test resources in testing drams

Evaluation of an output signal of a device under test

Semiconductor test apparatus

Comparator circuitry connected to input and output of tristate buffer

Strobe technique for test of digital signal timing

Strobe technique for time stamping a digital signal

Test apparatus and test method

Ternary search process

Testing apparatus and testing method

Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatus

Test apparatus, test method, electronic device manufacturing method, test simulator and test simulation method

Measurement of output voltage characteristics on dynamic logic signals

System and method for signal integrity testing of electronic circuits

Semiconductor test instrument

Method and apparatus for discharging voltages from a circuit under test

Integrated circuit capable of reduced error calibration

System for discharging electronic circuitry

Test apparatus

Apparatus and method for testing non-deterministic device data

Edge selecting triggering circuit

Test apparatus

System for measuring characteristics of a digital signal

Dynamically adjustable signal detector

Measuring apparatus and program

Test apparatus and test method

Target value search circuit, taget value search method, and semiconductor test device using the same

Integrated circuit apparatus having improved test circuit and method of testing the integrated circuit apparatus

Semiconductor testing apparatus and method of testing semiconductor

Microcode-initiated high speed comparator

Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices

Comparator and method for amplifying an input signal

Apparatus and method for reducing test resources in testing DRAMs

Detection apparatus, detection method, and program

Method and apparatus for bit error rate test

Electrical circuit and method for testing integrated circuits

ATE measurement technique for comparator threshold voltage

Low cost test option using redundant logic

Apparatus and method for testing circuit units to be tested

Voltage spike detector and system for detecting voltage spikes in semiconductor devices

Protocol analysis and visualization during simulation