177018 ⎘
Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor; Photosensitive materials; Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having a backbone with alicyclic moieties
Sub-classes:POLYMER, METHOD OF PRODUCING THE SAME, RESIST COMPOSITION INCLUDING THE POLYMER, AND PATTERN FORMATION METHOD USING THE RESIST COMPOSITION
#2PHOTORESIST COMPOSITIONS AND PATTERN FORMATION METHODS
#3RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, COMPOUND AND ACID DIFFUSION CONTROL AGENT
#4COMPOSITION FOR FORMING ORGANIC FILM, METHOD FOR FORMING ORGANIC FILM, PATTERNING PROCESS, AND COMPOUND
#5SULFONIUM SALT MONOMER, POLYMER, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERN FORMING PROCESS
#6RADIATION-SENSITIVE COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
#7RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
#8POLYMER, RESIST COMPOSITION INCLUDING THE SAME, AND PATTERN FORMATION METHOD USING THE RESIST COMPOSITION
#9ONIUM SALT MONOMER, POLYMER, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERN FORMING PROCESS
#10RADIATION-SENSITIVE COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMER
#11RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, AND COMPOUND
#12RESIN COMPOSITION, CURED PRODUCT, ELECTRONIC COMPONENT, AND DISPLAY DEVICE
#13RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
#14RADIATION-SENSITIVE COMPOSITION AND PATTERN FORMING METHOD
#15RADIATION-SENSITIVE COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
#16METHOD FOR IMPROVING HARDNESS OF BAKED PRODUCT
#17RESIST UNDERLAYER COMPOSITION AND METHOD OF FORMING PATTERNS USING THE COMPOSITION
#18CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS
#19COMPOSITION FOR FORMING RESIST UNDERLAYER FILM HAVING SACCHARIN SKELETON
#20BOTTOM ANTI-REFLECTIVE COATING FOR DEEP ULTRAVIOLET LITHOGRAPHY, PREPARATION METHOD THEREFOR AND USE THEREOF
#21RADIATION-SENSITIVE COMPOSITION, PATTERN FORMATION METHOD, AND PHOTO-DEGRADABLE BASE
#22MICRO PATTERN MANUFACTURING METHOD USING PHOTOSENSITIVE RESIN COMPOUND
#23POLYMER COMPOSITIONS HAVING PHOTOACID GENERATORS AND PHOTORESISTS
#24RESIST UNDERLAYER FILM-FORMING COMPOSITION CONTAINING PROTECTED BASIC ORGANIC GROUP
#25RESIST COMPOSITION AND PATTERN FORMING PROCESS
#26RESIST UNDERLAYER FILM FORMATION COMPOSITION
#27CHEMICALLY AMPLIFIED POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING PROCESS
#28Bismaleimide Compound, Composition Containing Same, Polybenzoxazole, And Semiconductor Device
#29POLYMER, COMPOSITION, METHOD FOR PRODUCING POLYMER, COMPOSITION, COMPOSITION FOR FILM FORMATION, RESIST COMPOSITION, RADIATION-SENSITIVE COMPOSITION, COMPOSITION FOR UNDERLAYER FILM FORMATION FOR LITHOGRAPHY, RESIST PATTERN FORMATION METHOD, METHOD FOR PRODUCING UNDERLAYER FILM FOR LITHOGRAPHY, CIRCUIT PATTERN FORMATION METHOD, AND COMPOSITION FOR OPTICAL MEMBER FORMATION
#30RESIST UNDERLAYER FILM-FORMING COMPOSITION CONTAINING REACTION PRODUCT OF HYDANTOIN COMPOUNDS
#31POSITIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION AND CURED FILM PREPARED THEREFROM
#32PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING PATTERNED CURED FILM, PATTERNED CURED FILM AND SEMICONDUCTOR ELEMENT
#33ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE
#34PHOTOACID GENERATOR, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERNING PROCESS
#35PHOTOSENSITIVE RESIN COMPOSITION AND MANUFACTURING METHOD OF DISPLAY DEVICE USING THE SAME
#36Radiation-sensitive resin composition and method for forming resist pattern
#37Positive resist composition and patterning process
#38Resist composition and patterning process
#39Positive tone photosensitive compositions containing amic acid as latent base catalyst
#40Extreme ultraviolet photoresist and method
#41Sulfonium compound, positive resist composition, and resist pattern forming process
#42Composition for resist underlayer film formation, resist underlayer film and formation method thereof, and patterned substrate production method
#43Photosensitive resin composition
#44RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
#45Photoimageable polyolefin compositions containing photobase generators
#46Onium salt, chemically amplified positive resist composition, and resist pattern forming process
#47Permanent dielectric compositions containing photoacid generator and base
#48Resist composition and patterning process
#49METHOD FOR MANUFACTURING MEMS DEVICES USING MULTIPLE PHOTOACID GENERATORS IN A COMPOSITE PHOTOIMAGEABLE DRY FILM
#50Photoresist polymers, methods of forming patterns and methods of manufacturing semiconductor devices
#51Resist composition and resist patterning process
#52Fluorine free photopatternable phenol functional group containing polymer compositions
#53Photosensitive compositions, color filter and microlens derived therefrom
#54Material for lithography, production method therefor, composition for lithography, pattern formation method, compound, resin, and method for purifying the compound or the resin
#55Photoimageable polyolefin compositions containing photobase generators
#56Resin film, coloring photosensitive composition, resin film production method, color filter, light shielding film, solid-state imaging element, and image display device
#57Resist composition and patterning process
#58Resist composition and patterning process
#59Positive resist composition, resist pattern forming process, and photomask blank
#60Nadic anhydride polymers and photosensitive compositions derived therefrom
#61Pattern forming method, photo mask manufacturing method, and electronic device manufacturing method
#62Resist composition and method for forming resist pattern
#63Resist composition and patterning process
#64Positive type resist composition for use in liquid immersion exposure and a method of forming the pattern using the same
#65Active-light-sensitive or radiation-sensitive resin composition, active-light-sensitive or radiation-sensitive film, pattern forming method, and method for manufacturing electronic device
#66Permanent dielectric compositions containing photoacid generator and base
#67Resist composition and patterning process
#68Fluorine free photopatternable phenol functional group containing polymer compositions
#69Chemically amplified positive resist composition and pattern forming process
#70Resist composition and patterning process using the same
#71Polymer, chemically amplified positive resist composition and patterning process
#72Positive type resist composition for use in liquid immersion exposure and a method of forming the pattern using the same
#73Sulfonium salt, chemically amplified resist composition, and patterning process
#74Active light sensitive or radiation sensitive resin composition, pattern forming method, method for manufacturing electronic device, and electronic device
#75Thermo-oxidatively stable, side chain polyether functionalized polynorbornenes for microelectronic and optoelectronic devices and assemblies thereof
#76Chemically amplified positive resist composition and pattern forming process
#77Photoresist additive for outgassing reduction and out-of-band radiation absorption
#78Photoimageable polyolefin compositions containing photobase generators
#79Positive type resist composition for use in liquid immersion exposure and a method of forming the pattern using the same
#80Photoimageable compositions containing thermal base generators
#81Resist composition and method for producing resist pattern
#82Resist composition
#83Photoresist compositions and methods of forming photolithographic patterns
#84Resist composition and patterning process
#85Photoresist composition to reduce photoresist pattern collapse
#86Photosensitive composition, photocurable composition, chemical amplification resist composition, resist film, pattern forming method, method of manufacturing electronic device and electronic device
#87Chemically amplified resist composition and pattern forming process
#88Photoresist having improved extreme-ultraviolet lithography imaging performance
#89Chemically-amplified positive resist composition and resist patterning process using the same
#90Positive type resist composition for use in liquid immersion exposure and a method of forming the pattern using the same
#91Fluorine-containing sulfonic acid salt, fluorine-containing sulfonic acid salt resin, resist composition, and pattern forming method using same
#92Positive resist composition, resin used for the positive resist composition, compound used for synthesis of the resin and pattern forming method using the positive resist composition
#93Positive-tone, chemically amplified, aqueous-developable, permanent dielectric
#94Photoresist system and method
#95Self-assembled structures, method of manufacture thereof and articles comprising the same
#96Photoresist composition, coated substrate, and method of forming electronic device
#97Photoresists and methods for use thereof
#98Water soluble norbornene-type polymers and photoimageable compositions thereof
#99Fluorine-containing sulfonate, fluorine-containing sulfonate resin, resist composition and pattern formation method
#100Patterning process and resist composition
#101Patterning process and resist composition
#102Sub-diffraction-limited patterning and imaging via multi-step photoswitching
#103Positive resist composition, monomer, polymer, and patterning process
#104Photosensitive polymer, resist composition including the photosensitive polymer and method of preparing resist pattern using the resist composition
#105Positive resist composition, resin used for the positive resist composition, compound used for synthesis of the resin and pattern forming method using the positive resist composition
#106Positive resist composition and patterning process
#107Photoacid generator, photoresist, coated substrate, and method of forming an electronic device
#108Sulfonium salt, polymer, resist composition, and patterning process
#109Resist composition and patterning process
#110Lithographic printing plate precursor
#111Monomer, polymer, positive resist composition and patterning process
#112Resist composition and method of forming resist pattern
#113BLOCK COPOLYMER OF POLYMIDE AND POLYAMIC ACID, METHOD FOR PRODUCING THE BLOCK COPOLYMER, PHOTOSENSITIVE RESIN COMPOSITION COMPRISING THE BLOCK COPOLYMER AND PROTECTIVE FILM FORMED USING THE BLOCK COPOLYMER
#114Radiation-sensitive resin composition, polymer and compound
#115Thermo-oxidatively stable, side chain polyether functionalized polynorbornenes for microelectronic and optoelectronic devices and assemblies thereof
#116Hydrophilic photoacid generator and resist composition comprising same
#117Patterning process, resist composition, polymer, and polymerizable ester compound
#118Patterning process and resist composition
#119Patterning process and resist composition
#120Fluorine-containing sulfonate, fluorine-containing sulfonate resin, resist composition and pattern formation method
#121Sulfonium compound, photoacid generator, and resist composition
#122Patterning process and resist composition
#123Pattern forming method and resist composition
#124Patterning process and resist composition
#125Polymers, photoresist compositions and methods of forming photolithographic patterns
#126Photoresist compositions and methods of use in high index immersion lithography
#127Patterning process
#128Actinic ray-sensitive or radiation-sensitive resin composition, film formed using the composition and pattern forming method using the same
#129Photoresist having improved extreme-ultraviolet lithography imaging performance
#130Photoacid generator, method for producing the same, and resist composition comprising the same
#131Photoacid generator, method for producing the same, and resist composition comprising the same
#132Sulfonium compound, photo-acid generator, and method for manufacturing the same
#133Polymer, method for producing the same, and resist composition containing the same
#134COMPOSITIONS COMPRISING SUGAR COMPONENT AND PROCESSES FOR PHOTOLITHOGRAPHY
#135Pattern forming method, chemical amplification resist composition and resist film
#136Resist composition and patterning process
#137Self-imageable film forming polymer, compositions thereof and devices and structures made therefrom
#138RESIST COMPOSITION, RESIST FILM THEREFROM AND METHOD OF FORMING PATTERN THEREWITH
#139Positive type resist composition for use in liquid immersion exposure and a method of forming the pattern using the same
#140Monomer, polymer, chemically amplified positive resist composition, and patterning process
#141Photoresist compositions and methods of forming photolithographic patterns
#142Photoacid generators and photoresists comprising same
#143Photoresists and methods for use thereof
#144ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE SAME
#145Chemically amplified positive resist composition for EB or EUV lithography and patterning process
#146Chemically amplified positive resist composition and pattern forming process
#147Polymer, resist composition, and patterning process
#148Positive photosensitive composition and pattern forming method using the same
#149Polymerizable fluorine-containing compound
#150Method of forming patterns
#151Positive resist composition for immersion exposure and pattern-forming method using the same
#152Norbornene-type polymers, compositions thereof and lithographic processes using such compositions
#153Ester compounds and their preparation, polymers, resist compositions and patterning process
#154Positive resist composition and pattern forming process
#155(Meth)acrylate derivative, intermediate thereof, and polymer compound
#156Positive resist composition for immersion exposure and pattern-forming method using the same
#157Photosensitive composition and pattern-forming method using the photosensitive composition
#158Positive photosensitive composition and method of forming resist pattern
#159Actinic-ray- or radiation-sensitive resin composition and method of forming pattern using the composition
#160Method for using compositions containing fluorocarbinols in lithographic processes
#161Photosensitive composition, and pattern-forming method and resist film using the photosensitive composition
#162Positive resist composition for immersion exposure and method of forming resist pattern
#163Exposure system and pattern formation method
#164Chemically amplified positive resist composition and resist patterning process
#165Photoacid generator, copolymer, chemically amplified resist composition, and method of forming pattern using the chemically amplified resist composition
#166Resist composition and patterning process
#167Positive resist composition and patterning process
#168Polymer for resist and resist composition manufactured using the same
#169Block copolymer of polyimide and polyamic acid, method for producing the block copolymer, photosensitive resin composition comprising the block copolymer and protective film formed using the block copolymer
#170POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS
#171POSITIVE RESIST COMPOSITION AND PATTERNING PROCESS
#172Positive resist composition and patterning process
#173Chemically amplified positive resist composition
#174Polymerizable anion-containing sulfonium salt and polymer, resist composition, and patterning process
#175Oxime compound and resist composition containing the same
#176Chemically-amplified positive resist composition and patterning process thereof
#177Actinic ray-sensitive or radiation-sensitive resin composition and pattern forming method using same
#178Resist composition and patterning process
#179POSITIVE PHOTOSENSITIVE COMPOSITION AND METHOD OF FORMING PATTERN THEREWITH
#180Chemically amplified positive resist composition
#181Chemically amplified positive resist composition
#182Method for manufacturing a semiconductor device
#183Photoacid generator, resist composition, and patterning process
#184Polymer, polymer preparation method, resist composition and patterning process
#185Resin for hydrophobitizing resist surface, method for manufacturing the resin, and positive resist composition containing the resin
#186FLUORINATED COMPOUND, AND FLUOROPOLYMER, PROCESS FOR ITS PRODUCTION AND RESIST COMPOSITION CONTAINING IT
#187Photosensitive dielectric resin compositions, films formed therefrom and semiconductor and display devices encompassing such films
#188Ring-opening metathesis polymer, hydrogenated product thereof, method for preparing the same, and use thereof
#189Method for manufacturing a semiconductor device
#190Hydrogenated ring-opening metathesis polymer, resist composition and patterning process
#191Positive type resist composition for use in liquid immersion exposure and a method of forming the pattern using the same
#192Photoresist compositions and methods of use in high index immersion lithography
#193Photoresist compositions and methods of use in high index immersion lithography
#194Si-polymers and photoresists comprising same
#195Positive resist composition for immersion lithography and method for forming resist pattern
#196Positive resist composition and pattern forming method using the same
#197Positive resist composition and pattern forming method using the same
#198Resist composition and patterning process
#199Norbornene polymer for photoresist and photoresist composition comprising the same
#200Photosensitive composition, compound for use in the photosensitive composition, and method of pattern formation with the photosensitive composition
#201Method of forming patterns
#202Positive photosensitive composition
#203Fluorine-containing compound, fluorine-containing polymer, postive-type resist composition, and patterning process using same
#204POSITIVE WORKING PHOTOSENSITIVE COMPOSITION AND PATTERN FORMING METHOD USING THE SAME
#205Chemical amplification type resist composition
#206Resist composition and patterning process
#207Negative resists based on acid-catalyzed elimination of polar molecules
#208Method of controlling the differential dissolution rate of photoresist compositions, polycyclic olefin polymers and monomers used for making such polymers
#209Copolymer for use in chemical amplification resists
#210Hydrogenated ring-opening metathesis polymer, resist composition comprising the same and patterning method
#211Resist composition and pattern forming method using the same
#212Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same
#213Resist composition, resin for use in the resist composition, compound for use in the synthesis of the resin, and pattern-forming method using the resist composition
#214Chemically amplified resist material and pattern formation method using the same
#215Cyclodextrin derivative, photoresist composition including the cyclodextrin derivative and method of forming a pattern using the photoresist composition
#216INCLUSION COMPLEX, PHOTORESIST COMPOSITION HAVING THE INCLUSION COMPLEX AND METHOD OF FORMING A PATTERN USING THE PHOTORESIST COMPOSITION
#217Polymer, positive resist composition and method for forming resist pattern
#218Polyester compound and resist material using the same
#219Method for using compositions containing fluorocarbinols in lithographic processes
#220Ester compounds and their preparation, polymers, resist compositions and patterning process
#221Polymerizable ester compounds, polymers, resist compositions and patterning process
#222Positive resist compositions and patterning process
#223Negative resists based on acid-catalyzed elimination of polar molecules
#224Resist composition and patterning process
#225Resist composition and patterning process using the same
#226Photo sensitive composition, pattern-forming method using the photosensitive composition and compound for use in the photosensitive composition
#227Photoresists comprising polymers derived from fluoroalcohol-substituted polycyclic monomers
#228Fluorinated compound, and fluoropolymer, process for its production and resist composition containing it
#229Branching self-assembling photoresist with decomposable backbone
#230Photosensitive composition, pattern-forming method using the photosensitive composition and compounds used in the photosensitive composition
#231Photoresist composition and method of forming resist pattern
#232Fluoroalcohol preparation method, fluorinated monomer, polymer, resist composition and patterning process
#233Photoresist composition for deep ultraviolet lithography
#234Photosensitive polymer and photoresist composition having the same
#235Polymer compound, photoresist composition including the polymer compound, and resist pattern formation method
#236Lactone-containing compound, polymer, resist composition, and patterning process
#237Fluorinated compound, fluoropolymer, resist composition, and composition for resist protective film
#238Photoresist composition for deep ultraviolet lithography
#239Positive resist composition and pattern forming method using the same
#240Photosensitive composition, pattern-forming method using the photosensitive composition and compounds used in the photosensitive composition
#241Hyperbranched polymer, production method therefor and resist composition containing hyperbranched polymer
#242Photoresist composition and method of forming resist pattern
#243Positive photosensitive composition
#244Positive resist composition and pattern forming method using the same
#245Positive resist composition, resin used for the positive resist composition, compound used for synthesis of the resin and pattern forming method using the positive resist composition
#246Process for preparing fluorine-containing norbornene derivative
#247Chemical amplification type resist composition
#248Photoactive compounds
#249Positive resist composition and pattern formation method using the positive resist composition
#250Resist composition and patterning process
#251Salt suitable for an acid generator and a chemically amplified resist composition containing the same
#252Photoimageable, thermosettable fluorinated resists
#253Sulfonate and resist composition
#254Photosensitive composition, pattern forming method using the photosensitive composition and compound for use in the photosensitive composition
#255Pattern forming method and resist composition used therefor
#256Positive resist composition for immersion exposure and pattern forming method using the same
#257Positive resist composition and pattern forming method using the same
#258Positive resist composition and pattern-forming method using the same
#259Positive resist composition for immersion exposure and pattern-forming method using the same
#260Negative resists based on a acid-catalyzed elimination of polar molecules
#261Positive photosensitive composition and pattern forming method using the same
#262Photoresist monomer polymer thereof and photoresist composition including the same
#263Polymer for immersion lithography and photoresist composition
#264Photoresist polymer, and photoresist composition
#265Fluorine-containing polymer, resist composition prepared from same and novel fluorine-containing monomer
#266Norbornene-type polymers, compositions thereof and lithographic processes using such compositions
#267Norbornene-type polymers, compositions thereof and lithographic process using such compositions
#268Novel ester compounds, polymers, resist compositions and patterning process
#269Positive resist composition and pattern forming method using the resist composition
#270Photosensitive composition and pattern-forming method using the same
#271Photoresist composition, and low-molecular compound and high-molecular compound for the photoresist composition
#272Novel fluorine-containing polymer, resist composition prepared from same and novel fluorine-containing monomer
#273Modified cycloolefin copolymer, process for producing the same, and use of the polymer
#274Positive resist composition and pattern forming method using the same
#275Norbornene polymer for photoresist and photoresist composition comprising the same
#276Fluorinated monomers, fluorinated polymers having polycyclic groups with fused 4-membered heterocyclic rings, useful as photoresists, and processes for microlithography
#277Photoresist composition and resist pattern formation method by the use thereof
#278Fluorinated polymers useful as photoresists, and processes for microlithography
#279Photo acid generator, chemical amplification resist material
#280Photosensitive resin, photoresist composition having the photosensitive resin and method of forming a photoresist pattern by using the photoresist composition
#281Photoresist composition and method of forming resist pattern
#282Resist composition for liquid immersion exposure process and method of forming resist pattern therewith
#283Fluorinated copolymer process for its production and resist composition containing it
#284Fluorinated compound, and fluoropolymer, process for its production and resist composition containing it
#285Photoresist composition for deep UV and process thereof
#286Fluorinated monomer having cyclic structure, manufacturing method, polymer, photoresist composition and patterning process
#287Alicyclic unsaturated compound, polymer, chemically amplified resist composition and method for forming pattern using said composition
#288Resist composition and method of pattern formation with the same
#289Copolymer of alicyclic olefin having secondary hydroxyl group and acryl compound, and chemically amplified resist composition containing the same
#290Resist material and pattern formation method
#291Photosensitive composition, compound for use in the photosensitive composition, and method of pattern formation with the photosensitive composition
#292Positive resist composition and method of forming a resist pattern using the same
#293Polymeric compositions and uses therefor
#294Photoresist compositions
#295Photoresist polymer and photoresist composition containing the same
#296Chemically amplified polymer having pendant group with dicyclohexyl and resist composition comprising the same
#297Positive type resist composition for use in liquid immersion exposure and a method of forming the pattern using the same
#298Photosensitive dielectric resin compositions, films formed therefrom and semiconductor and display devices encompassing such films
#299Novel photoresist monomers and polymers
#300Monomers for photoresists bearing acid-labile groups of reduced optical density