199649 ⎘
Erasable programmable read-only memories electrically programmable; Auxiliary circuits, e.g. for writing into memory; Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention; Arrangements for verifying correct programming or erasure; Arrangements for verifying correct erasure or for detecting overerased cells Circuits or methods to detect overerased nonvolatile memory cells, usually during erasure verification
MEMORY DEVICE WEAR LEVELING
#2NONVOLATILE MEMORY DEVICE AND METHOD OF CONTROLLING THE SAME
#3Memory device wear leveling
#4Detecting latent defects in a memory device during an erase operation based on physical and logical segment fail bits
#5Method of erasing flash memory and electronic system
#6Semiconductor device and erasing method
#7Post over-erase correction method with auto-adjusting verification and leakage degree detection
#8STORAGE STRUCTURE AND ERASE METHOD THEREOF
#9Erasure of multiple blocks in memory devices
#10Erasing method
#11Erasure of multiple blocks in memory devices
#12Semiconductor memory device and operating method thereof
#13Data programming method and memory storage device
#14Low power high speed program method for multi-time programmable memory device
#15Non-volatile semiconductor memory and erasing method thereof
#16Flash memory counter
#17Flash memory counter
#18Extended protection for embedded erase of non-volatile memory cells
#19Nonvolatile semiconductor memory device
#20Systems and methods for adaptive soft programming for non-volatile memory using temperature sensor
#21Block and page level bad bit line and bits screening methods for program algorithm
#22Method and apparatus for the erase suspend operation
#23Semiconductor memory device and operating method thereof
#24NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND DATA ERASE METHOD OF THE SAME
#25Electrically rewriteable nonvolatile semiconductor memory device
#26Method and apparatus for the erase suspend operation
#27Nonvolatile semiconductor memory device
#28Operation method and leakage controller for a memory and a memory applying the same
#29Nonvolatile memory device including circuit formed of thin film transistors
#30Nonvolatile semiconductor memory device
#31Data storage in analog memory cell arrays having erase failures
#32Nonvolatile memory device including circuit formed of thin film transistors
#33NONVOLATILE MEMORY DEVICE INCLUDING CIRCUIT FORMED OF THIN FILM TRANSISTORS
#34Erasing non-volatile memory using individual verification and additional erasing of subsets of memory cells
#35Repetitive erase verify technique for flash memory devices
#36Nonvolatile memory device including circuit formed of thin film transistors
#37Nonvolatile semiconductor memory device
#38Method for operating non-volatile memory device
#39Nonvolatile semiconductor memory device
#40Flash memory device and related erase operation
#41Nonvolatile semiconductor memory device
#42Nonvolatile memory device including circuit formed of thin film transistors
#43Nonvolatile memory using a two-step cell verification process
#44Systems for erasing non-volatile memory using individual verification and additional erasing of subsets of memory cells
#45Erasing non-volatile memory utilizing changing word line conditions to compensate for slower erasing memory cells
#46Soft programming non-volatile memory utilizing individual verification and additional soft programming of subsets of memory cells
#47Systems for erasing non-volatile memory utilizing changing word line conditions to compensate for slower erasing memory cells
#48Systems for soft programming non-volatile memory utilizing individual verification and additional soft programming of subsets of memory cells
#49Erasing non-volatile memory using individual verification and additional erasing of subsets of memory cells
#50Method for erasing an NROM cell
#51Semiconductor memory device and method for writing to semiconductor memory device
#52Memory block erasing in a flash memory device
#53Nonvolatile semiconductor memory device
#54Overerase correction in flash EEPROM memory
#55Method for erasing an NROM cell
#56Method for erasing an NROM cell
#57Semiconductor memory device having memory cells with floating gates and memory cell threshold voltage control method
#58Memory block erasing in a flash memory device
#59Memory device and method using positive gate stress to recover overerased cell
#60Nonvolatile memory device including circuit formed of thin film transistors
#61Method for erasing an NROM cell
#62Nonvolatile semiconductor memory device
#63Erase voltage compensation mechanism for group erase mode with bit line leakage detection method
#64Memory device