199647 ⎘
Erasable programmable read-only memories electrically programmable; Auxiliary circuits, e.g. for writing into memory; Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention; Arrangements for verifying correct programming or erasure Arrangements for verifying correct erasure or for detecting overerased cells
Sub-classes:NONVOLATILE MEMORY DEVICE SUPPORTING GIDL ERASE OPERATION
#2MEMORY DEVICE, STORAGE DEVICE, AND OPERATING METHOD OF STORAGE DEVICE
#3RESUMING AN ERASE OPERATION SUSPENDED DURING A PRE-PROGRAM PHASE BASED ON A VERIFY OPERATION RESULT
#4CURRENT MONITORING IN A MEMORY DEVICE TO IMPROVE SHORT DETECTION
#5END-TO-END OBJECT TRACKING USING NEURAL NETWORKS WITH ATTENTION
#6NONVOLATILE SEMICONDUCTOR MEMORY DEVICE WHICH PERFORMS IMPROVED ERASE OPERATION
#7Nonvolatile semiconductor memory device
#8NONVOLATILE MEMORY DEVICE SUPPORTING GIDL ERASE OPERATION
#9Memory device and method for operating selective erase scheme
#10Non-volatile storage system with hybrid SLC wear leveling
#11Nonvolatile semiconductor memory device which performs improved erase operation
#12Erase power loss indicator (EPLI) implementation in flash memory device
#13Nonvolatile semiconductor memory device
#14Semiconductor memory device having insulating layers disposed between a plurality of memory string structures
#15Methods and devices for erasing non-volatile memory
#16Memory device for passing verify operation and operating method of the same
#17Nonvolatile semiconductor memory device which performs improved erase operation
#18Data arranging method, memory control circuit unit and memory storage device for flash memory for improving the performance of valid data merging operation
#19Power-on over-erasure correction method and memory device utilizing same
#20Operating method of a storage device including a nonvolatile memory device and a controller
#21Memory device for passing verify operation and operating method of the same
#22Memory system and method of operating the same
#23Nonvolatile semiconductor memory device
#24Nonvolatile semiconductor memory device
#25Nonvolatile semiconductor memory device which performs improved erase operation
#26Verify before program resume for memory devices
#27Nonvolatile memory device including a plurality of input/output units and an operating method thereof
#28Nonvolatile semiconductor memory device
#29Memory device and memory system
#30Bloom filters in a flash memory
#31ERASING METHOD USED IN FLASH MEMORY
#32Data erasure device for erasing data from non-volatile semiconductor memory device and method for manufacturing non-volatile semiconductor memory device
#33Erasing method for flash memory using a memory management apparatus
#34Semiconductor memory device
#35Nonvolatile semiconductor memory device which performs improved erase operation
#36Bloom filters in a flash memory
#37System and method for string-based erase verify to create partial good blocks
#38Nonvolatile semiconductor memory device
#39Memory device and memory system
#40Semiconductor memory device and method of operating the same
#41Nonvolatile memory device including a plurality of input/output units and an operating method thereof
#42Memory device and method of operating the same to prevent occurrence of read fail by adjusting bit line voltage
#43Nonvolatile semiconductor memory device
#44Nonvolatile semiconductor memory device which performs improved erase operation
#45Semiconductor device, pre-write program, and restoration program
#46Non-volatile semiconductor memory and erasing method thereof
#47Nonvolatile semiconductor storage device including a discharge transistor for discharging a bit line to a source line
#48Nonvolatile semiconductor memory device
#49Semiconductor device and method of driving semiconductor device
#50Nonvolatile semiconductor memory device which performs improved erase operation
#51Nonvolatile memory device and memory system including the same
#52Methods of operating nonvolatile memory devices including variable verification voltages based on program/erase cycle information
#53Non-volatile memory device, memory system, and methods of operating the device and system
#54Semiconductor device, pre-write program, and restoration program
#55Nonvolatile semiconductor memory device
#56Charge redistribution during erase in charge trapping memory
#57Semiconductor memory device and method of operating the same
#58Data storing method, memory control circuit unit and memory storage apparatus
#59Nonvolatile semiconductor memory device which performs improved erase operation
#60Nonvolatile memory and erasing method thereof
#61Adaptive erase of a storage device
#62Detecting programmed word lines based on NAND string current
#63Nonvolatile semiconductor memory device capable of improving retention/disturb characteristics of memory cells and method of operating the same
#64Method and apparatus for reducing erase disturb of memory by using recovery bias
#65Group word line erase and erase-verify methods for 3D non-volatile memory
#66Method and apparatus for reducing erase time of memory by using partial pre-programming
#67Nonvolatile semiconductor memory device
#68Nonvolatile memory and related reprogramming method
#69Semiconductor memory device and method of operating the same
#70Nonvolatile semiconductor memory device
#71Soft erase operation for 3D non-volatile memory with selective inhibiting of passed bits
#72Nonvolatile semiconductor memory device
#73Memory system performing multi-step erase operation based on stored metadata
#74Solid state drive and data erasing method thereof
#75Non-volatile memory device with an EPLI comparator
#76Memory device, memory system, and control method performed by the memory system
#77Flash multi-level threshold distribution scheme
#78Non-volatile memory device and operating method thereof
#79Vertical nonvolatile memory devices and methods of operating same
#80Nonvolatile memory device and method of operating the same
#81Latent slow bit detection for non-volatile memory
#82Erased page confirmation in multilevel memory
#83Semiconductor memory device
#84Nonvolatile semiconductor memory device which performs improved erase operation
#85Optimized erase operation for non-volatile memory with partially programmed block
#86Method and apparatus for reducing erase time of memory by using partial pre-programming
#87Soft erase operation for 3D non-volatile memory with selective inhibiting of passed bits
#88Method and apparatus for reducing erase disturb of memory by using recovery bias
#89Erase inhibit for 3D non-volatile memory
#90Erase operation with controlled select gate voltage for 3D non-volatile memory
#91Verify before program resume for memory devices
#92Nonvolatile memory and erasing method thereof
#93System and method for managing erase operations in a non-volatile memory
#94Nonvolatile semiconductor storage device
#953D semiconductor memory device
#96Semiconductor memory system and method for driving the same
#97Semiconductor device and erase methods thereof
#98Non-volatile semiconductor memory device
#99Non-volatile semiconductor memory with page erase
#100Nonvolatile semiconductor storage device
#101Semiconductor memory device comprising memory cell having charge accumulation layer and control gate and method of erasing data thereof
#102NON-VOLATILE MEMORY DEVICE, MEMORY CONTROLLER, AND METHODS THEREOF
#103Semiconductor storage device
#104Nonvolatile semiconductor memory device
#105Semiconductor memory device and data erase method thereof
#106Nonvolatile semiconductor memory device
#107SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF
#108Vertical nonvolatile memory devices and methods of operating same
#109Nonvolatile semiconductor storage device
#110Systems and methods for erasing a memory
#111Flash multi-level threshold distribution scheme
#112E/P durability by using a sub-range of a full programming range
#113Nonvolatile semiconductor memory device
#114Nonvolatile memory device, operating method thereof and memory system including the same
#115Nonvolatile semiconductor memory device which performs improved erase operation
#116Erase voltage reduction in a non-volatile memory device
#117Semiconductor device
#118Erase completion recognition
#119Erase cycle counter usage in a memory device
#120NONVOLATILE MEMORY DEVICE AND METHOD OF ERASING THE SAME
#121Non-volatile semiconductor memory with page erase
#122Semiconductor memory device and method of operating the same
#123Nonvolatile semiconductor memory device
#124Verifying an erase threshold in a memory device
#125NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND OPERATION METHOD THEREOF
#126Memory devices and methods of their operation including selective compaction verify operations
#127Data retention of last word line of non-volatile memory arrays
#128Dynamic soft program trims
#129Erase verification method of flash memory by selectively assigning deselected sectors
#130Semiconductor storage device capable of reducing erasure time
#131Nonvolatile memory with a unified cell structure
#132Method and apparatus of performing an erase operation on a memory integrated circuit
#133E/P durability by using a sub-range of a full programming range
#134Non-volatile semiconductor memory with page erase
#135Nonvolatile semiconductor memory device
#136Method and apparatus for operation of a NAND-like dual charge retaining transistor NOR flash memory device
#137Method for identifying a page of a block of flash memory, and associated memory device
#138Erase degradation reduction in non-volatile memory
#139Methods of erase verification for a flash memory device
#140Dynamically adjustable erase and program levels for non-volatile memory
#141Method of programming/erasing the nonvolatile memory
#142Nonvolatile memory device including circuit formed of thin film transistors
#143Flash multi-level threshold distribution scheme
#144Semiconductor memory device and erase method in the same
#145Semiconductor device
#146Flash memory device and flash memory programming method equalizing wear-level
#147Two pass erase for non-volatile storage
#148Flash memory and data erasing method of the same
#149Erase cycle counter usage in a memory device
#150NOR flash memory device and related methods of operation
#151Partial block erase architecture for flash memory
#152Nonvolatile semiconductor memory device
#153NON-VOLATILE MEMORY DEVICE AND ERASE AND READ METHODS THEREOF
#154Semiconductor memory device and method of erasing data therein
#155Dynamic soft program trims
#156Verifying an erase threshold in a memory device
#157All-bit-line erase verify and soft program verify
#158Data storage in analog memory cell arrays having erase failures
#159Method and apparatus for management of over-erasure in NAND-based NOR-type flash memory
#160Erase verify in memory devices
#161Erase completion recognition
#162Nonvolatile memory device and programming method
#163All-bit-line erase verify and soft program verify
#164Systems and methods for erasing a memory
#165Erase voltage reduction in a non-volatile memory device
#166METHOD OF ERASING FLASH MEMORY DEVICE
#167Method of erasing data in flash memory device
#168METHOD OF PERFORMING ERASE OPERATION IN NON-VOLATILE MEMORY DEVICE
#169Method of operating nonvolatile memory device and memory system
#170Semiconductor memory device
#171Data retention of last word line of non-volatile memory arrays
#172Non-volatile semiconductor memory device
#173Adjusting programming or erase voltage pulses in response to a rate of programming or erasing
#174Erase operation in a flash memory device
#175Methods of erase verification for a flash memory device
#176Erase method and non-volatile semiconductor memory
#177Non-volatile semiconductor memory device
#178Flash memory programming and verification with reduced leakage current
#179Method and apparatus for adaptive memory cell overerase compensation
#180Nonvolatile semiconductor memory device
#181Nonvolatile semiconductor storage device and method of erase verifying the same
#182Flash memory devices that utilize age-based verify voltages to increase data reliability and methods of operating same
#183Method for programming of memory cells, in particular of the flash type, and corresponding programming architecture
#184Selective threshold voltage verification and compaction
#185Non-volatile semiconductor memory device and erasing method thereof
#186Nonvolatile semiconductor memory device and method for controlling the same
#187Method for erasing flash memory
#188Method of erasing a nonvolatile memory device
#189Method of erasing a nonvolatile memory device
#190SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF OPERATION FOR SEMICONDUCTOR INTEGRATED CIRCUIT
#191Non-volatile semiconductor storage device and memory system
#192Nonvolatile memory device including circuit formed of thin film transistors
#193Method for reducing lateral movement of charges and memory device thereof
#194Erase degradation reduction in non-volatile memory
#195Semiconductor memory device comprising memory cell having charge accumulation layer and control gate and method of erasing data thereof
#196Adjusting programming or erase voltage pulses in response to the number of programming or erase failures
#197Non-volatile semiconductor memory with page erase
#198Semiconductor memory device and erase method in the same
#199Flash multi-level threshold distribution scheme
#200Reference-free sampled sensing
#201Verifying an erase threshold in a memory device
#202Non-volatile semiconductor storage device with address search circuit used when writing
#203Erase operation in a flash drive memory
#204Non-volatile memory having a dynamically adjustable soft program verify voltage level and method therefor
#205NONVOLATILE MEMORY DEVICE INCLUDING CIRCUIT FORMED OF THIN FILM TRANSISTORS
#206Erased sector detection mechanisms
#207Non-volatile storage with source bias all bit line sensing
#208Erase verify for memory devices
#209Flash memory device
#210Erase verifying method of NAND flash memory device
#211Nonvolatile memory with a unified cell structure
#212Flash memory device capable of overcoming fast program/slow erase phenomenon and erase method thereof
#213Partial block erase architecture for flash memory
#214Erase verify method for NAND-type flash memories
#215Method, apparatus, and system for improved erase operation in flash memory
#216Flash EEPROM System
#217Method for erasing data of NAND flash memory device
#218Selective threshold voltage verification and compaction
#219Repetitive erase verify technique for flash memory devices
#220NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE ALLOWING EFFICIENT PROGRAMMING OPERATION AND ERASING OPERATION IN SHORT PERIOD OF TIME
#221Method and apparatus for adaptive memory cell overerase compensation
#222Nonvolatile semiconductor memory device
#223Semiconductor memory device and method of erasing data therein
#224Semiconductor memory device and method for erasing the same
#225Apparatus with segmented bitscan for verification of programming
#226Flash memory devices that utilize age-based verify voltages to increase data reliability and methods of operating same
#227Array source line (AVSS) controlled high voltage regulation for programming flash or EE array
#228Nonvolatile memory with a unified cell structure
#229System for partitioned erase and erase verification in a non-volatile memory to compensate for capacitive coupling
#230Flash memory device and erase method thereof
#231Nonvolatile memory device including circuit formed of thin film transistors
#232Nonvolatile semiconductor memory device
#233Flash multi-level threshold distribution scheme
#234Method of monitoring an erase threshold voltage distribution in a NAND flash memory device
#235Method for compacting the erased threshold voltage distribution of flash memory devices during writing operations
#236Non-volatile memory device and associated method of erasure
#237Ramp gate erase for dual bit flash memory
#238Non-volatile memory erase verify
#239Flash memory device and multi-block erase method
#240Memory device and method for verifying information stored in memory cells
#241Systems for erase voltage manipulation in non-volatile memory for controlled shifts in threshold voltage
#242Erase voltage manipulation in non-volatile memory for controlled shifts in threshold voltage
#243Non-volatile semiconductor memory device allowing efficient programming operation and erasing operation in short period of time
#244Non-volatile semiconductor memory device having different erase pass voltages for respective memory sectors and associated erase method
#245Nonvolatile semiconductor memory device and method of operating the same which stably perform erase operation
#246Method of programming flash memory device
#247Method of verifying flash memory device
#248Reliable method for erasing a flash memory
#249Method of erasing data in non-volatile semiconductor memory device while suppressing variation
#250Flash memory programming and verification with reduced leakage current
#251Non-volatile semiconductor memory with page erase
#252Erase operation for use in non-volatile memory
#253Nonvolatile semiconductor memory device
#254Memory block erasing in a flash memory device
#255Erase operation in a flash memory device
#256Flash memory device capable of preventing an overerase of flash memory cells and erase method thereof
#257Memory block erasing in a flash memory device
#258High-speed writable semiconductor memory device
#259Method for programming of memory cells, in particular of the flash type, and corresponding programming architecture
#260Nonvolatile semiconductor memory device
#261Nonvolatile semiconductor memory device
#262Array source line (AVSS) controlled high voltage regulation for programming flash or EE array
#263Data processing device having flash ROM, and a flash ROM data erasing method
#264Method for operating a semiconductor memory device and semiconductor memory device
#265Nonvolatile semiconductor memory device performing erase operation that creates narrow threshold distribution
#266NAND flash memory and blank page search method therefor
#267Hole annealing methods of non-volatile memory cells
#268Read and erase verify methods and circuits suitable for low voltage non-volatile memories
#269Method for checking block erasing of a memory and circuit thereof
#270Selective threshold voltage verification and compaction
#271Method of erasing non-volatile memory cells
#272Background block erase check for flash memories
#273Nonvolatile memory device including circuit formed of thin film transistors
#274Erase verify for non-volatile memory
#275Memory device and method for erasing memory
#276Memory block erasing in a flash memory device
#277Memory block erasing in a flash memory device
#278Nonvolatile memory apparatus having a processor and plural memories one or more of which is a nonvolatile memory having circuitry which performs an erase operation and an erase verify operation when the processor specifies the erase operation mode to the nonvolatile memory
#279Memory block erasing in a flash memory device
#280Nonvolatile semiconductor memory device
#281Non-volatile semiconductor device and method for automatically recovering erase failure in the device
#282NAND flash memory with read and verification threshold uniformity
#283Monolithic, combo nonvolatile memory allowing byte, page and block write with no disturb and divided-well in the cell array using a unified cell structure and technology with a new scheme of decoder and layout
#284Recovery method of NAND flash memory device
#285Method for erasing an NROM cell
#286Nonvolatile memory device for storing data and method for erasing or programming the same
#287Non-volatile memory device with erase address register
#288Position based erase verification levels in a flash memory device
#289Methods for preventing fixed pattern programming
#290Non-volatile memory with erase verify circuit having comparators indicating under-erasure, erasure, and over-erasure of memory cells
#291Semiconductor memory device and method for writing to semiconductor memory device
#292Partial erase verify
#293Method of erasing data in non-volatile semiconductor memory device while suppressing variation
#294Method, circuit and systems for erasing one or more non-volatile memory cells
#295Erased sector detection mechanisms
#296Non-volatile semiconductor memory device
#297Non-volatile semiconductor memory device and memory system using the same
#298Non-volatile memory device and associated method of erasure
#299Erase-verifying method of NAND type flash memory device and NAND type flash memory device thereof
#300Method for setting erasing pulses and screening erasing defects of nonvolatile memory