ClassID:

199935

G11C2213/52 - page 2 - CPC Classification

Classification description:

Indexing scheme relating to for features not covered by this group; Resistive cell structure aspects Structure characterized by the electrode material, shape, etc.

Recent Application in this class:
#301
20070051935
2007-03-08

Phase change random access memory and method of operating the same

#302
20060266993
2006-11-30

Phase change random access memory devices and methods of operating the same

#303
20060215445
2006-09-28

Resistive memory cells and devices having asymmetrical contacts

#304
20060175599
2006-08-10

Phase change memory cell with high read margin at low power operation

#305
20060145199
2006-07-06

Thin film layer, heating electrode, phase change memory including thin film layer and methods for forming the same

#306
20060110878
2006-05-25

Side wall active pin memory and manufacturing method

#307
20060108667
2006-05-25

Method for manufacturing a small pin on integrated circuits or other devices

#308
20060081962
2006-04-20

Variable resistance device made of a material which has an electric resistance value changing in accordance with an applied electric field and maintains the electric resistance value after being changed in a nonvolatile manner, and a semiconductor apparatus including the same

#309
20060054878
2006-03-16

Vertical elevated pore phase change memory

#310
20060011902
2006-01-19

Phase change memory device and method for forming the same

#311
20060006472
2006-01-12

Phase change memory with extra-small resistors

#312
20050269667
2005-12-08

Process for manufacturing integrated resistor and phase-change memory element including this resistor

#313
20050243630
2005-11-03

Memory cell with an asymmetrical area

#314
20050227177
2005-10-13

Phase-change memory cell and method of fabricating the phase-change memory cell

#315
20050194620
2005-09-08

Method to selectively increase the top resistance of the lower programming electrode in a phase-change memory cell and structures obtained thereby

#316
20050180191
2005-08-18

Forming tapered lower electrode phase-change memories

#317
20050167656
2005-08-04

Phase-change memory cell and method of fabricating the phase-change memory cell

#318
20050145910
2005-07-07

Nonvolatile semiconductor memory device comprising a variable resistive element containing a perovskite-type crystal structure

#319
20050124112
2005-06-09

Asymmetric-area memory cell

#320
20050045915
2005-03-03

Phase changeable layers including protruding portions in electrodes thereof and methods of forming same

#321
20050030800
2005-02-10

Multilayered phase change memory

#322
16576551
2020-12-29

Stacked nanosheet 4T2R unit cell for neuromorphic computing

#323
16040671
2019-06-04

Semiconductor memory device

#324
15924014
2019-08-13

Resistive memory device having a retention layer

#325
15923992
2019-06-11

Resistive memory device having a template layer

#326
15920793
2019-07-16

Three-dimensional resistive random access memory device containing selectively grown amorphous silicon-containing barrier and method of making the same