199935 ⎘
Indexing scheme relating to for features not covered by this group; Resistive cell structure aspects Structure characterized by the electrode material, shape, etc.
Phase change random access memory and method of operating the same
#302Phase change random access memory devices and methods of operating the same
#303Resistive memory cells and devices having asymmetrical contacts
#304Phase change memory cell with high read margin at low power operation
#305Thin film layer, heating electrode, phase change memory including thin film layer and methods for forming the same
#306Side wall active pin memory and manufacturing method
#307Method for manufacturing a small pin on integrated circuits or other devices
#308Variable resistance device made of a material which has an electric resistance value changing in accordance with an applied electric field and maintains the electric resistance value after being changed in a nonvolatile manner, and a semiconductor apparatus including the same
#309Vertical elevated pore phase change memory
#310Phase change memory device and method for forming the same
#311Phase change memory with extra-small resistors
#312Process for manufacturing integrated resistor and phase-change memory element including this resistor
#313Memory cell with an asymmetrical area
#314Phase-change memory cell and method of fabricating the phase-change memory cell
#315Method to selectively increase the top resistance of the lower programming electrode in a phase-change memory cell and structures obtained thereby
#316Forming tapered lower electrode phase-change memories
#317Phase-change memory cell and method of fabricating the phase-change memory cell
#318Nonvolatile semiconductor memory device comprising a variable resistive element containing a perovskite-type crystal structure
#319Asymmetric-area memory cell
#320Phase changeable layers including protruding portions in electrodes thereof and methods of forming same
#321Multilayered phase change memory
#322Stacked nanosheet 4T2R unit cell for neuromorphic computing
#323Semiconductor memory device
#324Resistive memory device having a retention layer
#325Resistive memory device having a template layer
#326Three-dimensional resistive random access memory device containing selectively grown amorphous silicon-containing barrier and method of making the same