Semiconductor device and system

Communication channel calibration with nonvolatile parameter store for recovery

Method and apparatus for programming flash memory

Compensation of non-volatile memory chip non-idealities by program pulse adjustment

Nonvolatile semiconductor memory device

Non-volatile semiconductor memory device with a resistance adjusting circuit and an operation method thereof

System and method for controlling timing of output signals

Memory control apparatus and mask timing adjusting method

Memory programming for a phase change memory cell

Semiconductor memory device

Memory systems and methods for dynamically phase adjusting a write strobe and data to account for receive-clock drift

Delay-lock loop and method adapting itself to operate over a wide frequency range

System and Method of Testing an Error Correction Module

Programming rate identification and control in a solid state memory

Recalibration systems and techniques for electronic memory applications

Semiconductor device

Delay locked loop semiconductor apparatus that models a delay of an internal clock path

Semiconductor device and method of detecting abnormality on semiconductor device

SEMICONDUCTOR DEVICE AND CIRCUIT BOARD HAVING THE SEMICONDUCTOR DEVICE MOUNTED THEREON

Adjustment of write timing based on a training signal

Semiconductor integrated circuit device

Apparatus, system, and method for determining a read voltage threshold for solid-state storage media

Memory module including memory buffer and memory system having the same

Semiconductor device semiconductor device testing method, and data processing system

Structure and method for decoding read data-bus with column-steering redundancy

Semiconductor device and semiconductor system including the same

Integrated solution for identifying malfunctioning components within memory devices

Skew detector and semiconductor memory device using the same

Semiconductor device capable of detecting defect of column selection line

Memory and boundary searching method thereof

Semiconductor memory device for reading out data stored in memory

Data channel test apparatus and method thereof

Output slew rate control

Semiconductor apparatus and local skew detecting circuit therefor

Circuit for testing internal voltage of semiconductor memory apparatus

Voltage regulation circuitry

SEMICONDUCTOR INTEGRATED CIRCUIT SYSTEM AND ELECTRONIC EQUIPMENT

Leakage compensated reference voltage generation system

Semiconductor memory device and inspecting method of the same

Circuits and methods for calibrating offset in an amplifier

Semiconductor memory device changing refresh interval depending on temperature

Apparatus and method for trimming static delay of a synchronizing circuit

Method for decoding data in non-volatile storage using reliability metrics based on multiple reads

Method and system for evaluating effects of signal phase difference on a memory system

Test circuit, nonvolatile semiconductor memory appratus using the same, and test method

Test circuit, semiconductor memory apparatus using the same, and test method of the semiconductor memory apparatus

Memory interface circuit

Impedance adjusting device

Method for adjusting memory signal phase

Bitline precharge voltage generator, semiconductor memory device comprising same, and method of trimming bitline precharge voltage

Trim circuit and semiconductor memory device comprising same

Circuit for controlling an enabling time of an internal control signal according to an operating frequency of a memory device and the method thereof

Control voltage tracking circuits, methods for recording a control voltage for a clock synchronization circuit and methods for setting a voltage controlled delay

Self-refresh test circuit of semiconductor memory apparatus

Compensating for aging in integrated circuits

Dynamic sense current supply circuit and associated method for reading and characterizing a resistive memory array

Semiconductor memory device, method of adjusting the same and information processing system including the same

Semiconductor device, semiconductor device testing method, and data processing system

High speed multiple memory interface I/O cell

Method and apparatus providing final test and trimming for a power supply controller

Efuse devices, correction methods thereof, and methods for operating efuse devices

Memory cell programming

Memory system and method using stacked memory device dice, and system using the memory system

Memory controller comprising adjustable transmitter impedance

Memory device bit line sensing system and method that compensates for bit line resistance variations

Semiconductor apparatus and calibration method thereof

System and method for controlling timing of output signals

Phase shift adjusting method and circuit

Deliberate destruction of integrated circuits

Voltage regulation method and memory applying thereof

Semiconductor device having fuse circuit and control method thereof

Advanced memory device having improved performance, reduced power and increased reliability

Control component for controlling a delay interval within a memory component

Digital filters with memory

Sense amplifier circuit and related configuration and operation methods

Methods and systems to calibrate push-pull drivers

Memory chip and method for operating the same

Continuously variable resistor

Systems and devices including memory with built-in self test and methods of making and using the same

Fully-buffered dual in-line memory module with fault correction

Semiconductor integrated circuit and method of testing circuit

Fully-buffered dual in-line memory module with fault correction

Semiconductor memory device performing refresh operation and method of testing the same

Semiconductor devices having ZQ calibration circuits and calibration methods thereof

Circuit arrangement and method for testing a reset circuit

Semiconductor memory device

Apparatus and method for detecting word line leakage in memory devices

Low cost high density rectifier matrix memory

Reconfigurable connections for stacked semiconductor devices

Method for performing data pattern management regarding data accessed by a controller of a flash memory, and associated memory device and controller thereof

Apparatus and method for testing sense amplifier thresholds on an integrated circuit

Electronic equipment system and semiconductor integrated circuit controller

Operational method of a controller of a flash memory, and associated memory device and controller thereof

Computer memory test structure

Semiconductor memory device having memory block configuration

Threshold voltage digitizer for array of programmable threshold transistors

Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit

METHOD OPTIMIZING DRIVING VOLTAGE AND ELECTRONIC SYSTEM

Fast data eye retraining for a memory

Circuit apparatus with memory and power control responsive to circuit-based deterioration characteristics

Word line defect detecting device and method thereof

Automatic internal trimming calibration method to compensate process variation

Semiconductor memory apparatus and probe test control circuit therefor

Semiconductor memory apparatus and test method thereof

Nonvolatile semiconductor memory device

Isolating faulty decoupling capacitors

Method of testing for a leakage current between bit lines of nonvolatile memory device

Semiconductor device having nonvolatile memory element and manufacturing method thereof

Nonvolatile semiconductor memory device

Fuse circuit and driving method thereof

Fuse circuit and redundancy circuit

Read Enable Signal Adjusting Flash Memory Device and Read Control Method of Flash Memory Device

Semiconductor memory device capable of optimizing signal transmission power and power initializing method thereof

Digital filters for semiconductor devices

Semiconductor memory device comprising variable delay unit

I/O circuit with phase mixer for slew rate control

Address control circuit of semiconductor memory apparatus

Erasing flash memory using adaptive drain and/or gate bias

Semiconductor integrated circuit

SEMICONDUCTOR INTEGRATED CIRCUIT, CIRCUIT FUNCTION VERYFICATION DEVICE AND METHOD OF VERYFYING CIRCUIT FUNCTION

Double data rate memory physical interface high speed testing using self checking loopback

Method and apparatus for evaluating and optimizing a signaling system

Method for testing a main memory

Semiconductor memory devices including burn-in test circuits

Integrated circuit memory having assisted access and method therefor

Integrated circuit having an embedded memory and method for testing the memory

Burn-In Test Method and System

Method and circuit of calibrating data strobe signal in memory controller

Quiescent testing of non-volatile memory array

Delay locked loop circuit including delay line with reduced sensitivity to variation in PVT

Method of testing electric fuse, and electric fuse circuit

Latency detection in a memory built-in self-test by using a ping signal

Integrated circuit memory power supply

Sensing characteristic evaluating apparatus for semiconductor device and method thereof

PROGRAMMABLE POWER SOURCE USING ARRAY OF RESISTIVE SENSE MEMORY CELLS

Semiconductor devices and methods for changing operating characteristics and semiconductor systems including the same

Phase-change random access memory

Iteratively writing contents to memory locations using a statistical model

Semiconductor test system with self-inspection of memory repair analysis

Apparatus and method for buffering data between memory controller and DRAM

Dynamic random access memory (DRAM) refresh

Semiconductor memory device, memory module including the same, and data processing system

Memory circuit including row and column selection for writing information

Memory controller and memory control method

Memory interface and operation method of it

Burn-in methods for static random access memories and chips

Reducing effects of program disturb in a memory device

Semiconductor memory device

SEMICONDUCTOR MEMORY DEVICE AND SELF-TEST METHOD OF THE SAME

Semiconductor memory apparatus and method of testing the same

Calibration of memory driver with offset in a memory controller and memory device interface in a communication bus

Setting controller VREF in a memory controller and memory device interface in a communication bus

Setting memory device termination in a memory device and memory controller interface in a communication bus

Setting memory device VREF in a memory controller and memory device interface in a communication bus

Nonvolatile semiconductor memory and method for detecting leakage defects of the same

Implementing enhanced SRAM stability and enhanced chip yield with configurable wordline voltage levels

POWER SWITCHING FOR PORTABLE APPLICATIONS

Semiconductor device

System and method for optimizing regulated voltage output point

Method and apparatus for testing a memory device

Memory and boundary searching method thereof

TECHNIQUES FOR IMPROVED TIMING CONTROL OF MEMORY DEVICES

Voltage regulation method and memory applying thereof

Semiconductor memory device and method for operating the same

Nonvolatile semiconductor memory capable of trimming an initial program voltage for each word line

Resistive memory

Semiconductor device

Self-refresh based power saving circuit and method

Semiconductor memory device having shared temperature control circuit

Flash storage device and method and system for testing the same

Circuit and method for correcting skew in a plurality of communication channels for communicating with a memory device, memory controller, system and method using the same, and memory test system and method using the same

Nonvolatile semiconductor memory and method for testing the same

Method and apparatus for testing the connectivity of a flash memory chip

Memory devices having programmable elements with accurate operating parameters stored thereon

Reservoir capacitor array circuit

Operating voltage tuning method for static random access memory

Apparatus and method for trimming static delay of a synchronizing circuit

Adjustable write pulse generator within a chalcogenide memory device

Nonvolatile nanotube programmable logic devices and a nonvolatile nanotube field programmable gate array using same

METHOD FOR DETERMINING QUALITY PARAMETER AND THE ELECTRONIC APPARATUS USING THE SAME

Bit line bridge detecting method in semiconductor memory device

Semiconductor apparatus

Automatic word line leakage measurement circuitry

Delay adjustment device, semiconductor device and delay adjustment method

DETECTING DATA-ACCESS-ELEMENT-SELECTION ERRORS DURING DATA ACCESS IN DATA-STORAGE ARRAYS

Bitline leakage detection in memories

Method and apparatus for programming flash memory

Nonvolatile memory device, memory system including the same, and memory test system

Semiconductor device

Semiconductor device, internal circuit control signal measurement circuit, and delay time measurement method

Method and semiconductor memory with a device for detecting addressing errors

Antifuse replacement determination circuit and method of semiconductor memory device

Tuning a variable resistance of a resistive sense element

Variable-loop-path ring oscillator test circuit and systems and methods utilizing same

Methods And Apparatus For Testing Electronic Circuits

Trimming circuit of semiconductor memory apparatus and trimming method thereof

Semiconductor device and test method therefor

Apparatus for the dynamic detection, selection and deselection of leaking decoupling capacitors

Nonvolatile nanotube programmable logic devices and a nonvolatile nanotube field programmable gate array using same

APPARATUS FOR THE DYNAMIC DETECTION, SELECTION AND DESELECTION OF LEAKING DECOUPLING CAPACITORS

Stacked device conductive path connectivity

Nonvolatile nanotube programmable logic devices and a nonvolatile nanotube field programmable gate array using same

SEMICONDUCTOR DEVICE

Apparatus and method for testing setup/hold time

Method and apparatus for measuring statistics of dram parameters with minimum perturbation to cell layout and environment

Control voltage tracking circuits, methods for recording a control voltage for a clock synchronization circuit and methods for setting a voltage controlled delay

Nonvolatile nanotube programmable logic devices and a nonvolatile nanotube field programmable gate array using same

Memory systems and methods for dynamically phase adjusting a write strobe and data to account for receive-clock drift

Interface for writing to memories having different write times

Dynamic real-time delay characterization and configuration

Circuit and method for optimizing memory sense amplifier timing

Method of verifying logic circuit including decoders and apparatus for the same

Drift tracking feedback for communication channels

SEMICONDUCTOR MEMORY DEVICE

Semiconductor memory device, test method thereof and semiconductor device

Semiconductor memory device

Memory access strobe configuration system and process

Semiconductor memory apparatus

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF INSPECTING THE SAME

Programming rate identification and control in a solid state memory

Semiconductor memory device and trimming method thereof

Separate CAM core power supply for power saving

Delay-lock loop and method adapting itself to operate over a wide frequency range

Nonvolatile nanotube programmable logic devices and a nonvolatile nanotube field programmable gate array using same

Integrated three-dimensional semiconductor system comprising nonvolatile nanotube field effect transistors

Semiconductor integrated circuit device

On-die termination of address and command signals

Memory device bit line sensing system and method that compensates for bit line resistance variations

Non-volatile memory with linear estimation of initial programming voltage

Method and apparatus for reducing oscillation in synchronous circuits

Fuse element reading circuit

Memory system and method using stacked memory device dice, and system using the memory system

Self-calibration method of a reading circuit of a nonvolatile memory

Data readout circuit and semiconductor memory device

Test device and semiconductor integrated circuit device

Apparatus and methods for through substrate via test

Systems and methods for defect testing of externally accessible integrated circuit interconnects

Controllable voltage reference driver for a memory system

Temperature sensor capable of reducing test mode time

Read leveling of memory units designed to receive access requests in a sequential chained topology

Memory device and method of programming thereof

Bit shadowing in a memory system

Flash memory device and programming method thereof

Flash memory device and programming method thereof

System to evaluate a voltage in a charge pump and associated methods

Identification circuit with repeatable output code

Apparatus for measuring data setup/hold time

Memory operation testing

Write latency tracking using a delay lock loop in a synchronous DRAM

Data processing device and method of reading trimming data

Circuit and method for generating word line off voltage

Spin-transfer torque memory self-reference read method

System and method for an asynchronous data buffer having buffer write and read pointers

System Having A Controller Device, A Buffer Device And A Plurality Of Memory Devices

Serially decoded digital device testing

DDR memory controller

Test circuit device for semiconductor memory apparatus

Monitoring circuit for semiconductor device

Memory and writing method thereof

Optimum timing of write and read clock paths

Memory chip and method for operating the same

Using error information from nearby locations to recover uncorrectable data in non-volatile memory

Method and circuit for configuring memory core integrated circuit dies with memory interface integrated circuit dies

Method and apparatus for testing a random access memory device

Simulating a memory circuit

Method and apparatus for handling failure in address line

Interface voltage adjustment based on error detection

Bus failure management method and system

Semiconductor memory device and thermal code output circuit capable of correctly measuring thermal codes

Semiconductor memory device

Device and method for testing a resistance value of on-die-termination device and semiconductor device having the same

MEMORY DEVICE AND TEST METHOD THEREOF

Data channel test apparatus and method thereof

Semiconductor device and method of testing the same

Semiconductor memory apparatus

POWER-UP SIGNAL GENERATOR OF SEMICONDUCTOR MEMORY APPARATUS AND METHOD FOR CONTROLLING THE SAME

Semiconductor memory device

SEMICONDUCTOR MEMORY DEVICE AND SYSTEM USING SEMICONDUCTOR MEMORY DEVICE

Method and apparatus providing final test and trimming for a power supply controller

Semiconductor integrated circuit

Technique for determining performance characteristics of electronic devices and systems

SEMICONDUCTOR DEVICE AND CONTROLLING METHOD OF SEMICONDUCTOR DEVICE

Nonvolatile memory device using variable resistive element

Memory and voltage monitoring device thereof

Semiconductor memory device with signal aligning circuit

Memory control circuit, memory control method, and integrated circuit

Apparatus and method for detecting word line leakage in memory devices

Adjusting a digital delay function of a data memory unit

I/O circuit with phase mixer for slew rate control

Apparatus, system, and method for adjusting memory hold time

Diagnosable general purpose test registers scan chain design

Asynchronous, high-bandwidth memory component using calibrated timing elements

Method and Circuit for Implementing Efuse Resistance Screening

Deliberate destruction of integrated circuits

Semiconductor device and cell plate voltage generating apparatus thereof

Semiconductor device having transmission control circuit

Semiconductor integrated circuit and method of measuring a maximum delay

Semiconductor memory device and semiconductor memory system for compensating crosstalk

Circuit and method for controlling sense amplifier of semiconductor memory apparatus

Integrated circuit and method to operate an integrated circuit