199825 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout for dual-port memories
Method and apparatus for clock power saving in multiport latch arrays
#2Semiconductor device and data processing system including the same
#3Signal control device and signal control method
#4Semiconductor device and data processing system including the same
#5Memory repair circuit and repairable pseudo-dual port static random access memory
#6Recovery of existing SRAM capacity from fused-out blocks