199827 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout for read only memories
CONTENT ADDRESSABLE MEMORY LOADING IN SEMICONDUCTOR DEVICES
#2Testing read-only memory using memory built-in self-test controller
#3Testing read-only memory using memory built-in self-test controller
#4Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing
#5E-fuse circuit
#6Field-Repair System and Method for Large-Capacity Mask-Programmed Read-Only Memory
#7Solving MLC NAND paired page program using reduced spatial redundancy
#8Method and system for rebalancing data stored in flash memory devices
#9Flash memory apparatus, memory controller and method for controlling flash memory
#10Field-Repair System and Method
#11Read only memory (ROM) with redundancy
#12Fault masking method for non-volatile memories
#13Read only memory (ROM) with redundancy
#14BURNING SYSTEM AND METHOD
#15Self-Repair System and Method
#16Field-Repair System and Method
#17Apparatus, embedded memory, address decoder, method of reading out data and method of configuring a memory
#18Circuit and method for patching for program ROM
#19MEMORY SYSTEM
#20ROM redundancy in ROM embedded DRAM