199828 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout for synchronous memories
MEMORIES AND MEMORY COMPONENTS WITH INTERCONNECTED AND REDUNDANT DATA INTERFACES
#2Memories and memory components with interconnected and redundant data interfaces
#3Memories and memory components with interconnected and redundant data interfaces
#4DRAM device with embedded flash memory for redundancy and fabrication method thereof
#5Shift register unit and method for controlling the same, gate driving circuit, display device
#6Peripheral logic circuits under DRAM memory arrays
#7Techniques to store data for critical chunk operations
#8DRAM device with embedded flash memory for redundancy and fabrication method thereof
#9Memories and memory components with interconnected and redundant data interfaces
#10SEMICONDUCTOR DEVICE VERIFYING SIGNAL SUPPLIED FROM OUTSIDE
#11Data input circuit of nonvolatile memory device
#12Semiconductor device, relief-address-information writing device, and relief-address-information writing method
#13Latency counter, semiconductor memory device including the same, and data processing system
#14Dynamic column redundancy replacement
#15Semiconductor memory device and local input/output division method