H01J2237/062 - CPC Classification Index

ClassID:

206366 ⎘

H01J2237/062 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Sources; Construction Reducing size of gun

Recent Application in this class:

20210151278

2021-05-20

Electron gun, electron microscope, three-dimensional additive manufacturing apparatus, and method of adjusting current of electron gun

20200211822

2020-07-02

Ionization chamber chip for a nano-aperture ion source, method of fabrication thereof, and a proton beam writing system

20200161085

2020-05-21

Nano vacuum tube

20190035598

2019-01-31

Nano vacuum tube

20190019648

2019-01-17

Plasmon-excited electron beam array for complementary patterning

20160104597

2016-04-14

Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun

20130187541

2013-07-25

Photocathode high-frequency electron-gun cavity apparatus

20130161511

2013-06-27

Sample observing device and sample observing method

20120217391

2012-08-30

CHARGED PARTICLE MICROSCOPE

#10

20110260621

2011-10-27

Low-power gaseous plasma source

#11

20100187433

2010-07-29

IMPROVED PARTICLE BEAM GENERATOR

#12

20090289186

2009-11-26

Small electron gun

#13

20070236143

2007-10-11

Small electron gun

#14

20060231773

2006-10-19

Charged particle beam apparatus

#15

20050092929

2005-05-05

Integrated sub-nanometer-scale electron beam systems

#16

20050052103

2005-03-10

Small electron gun