ClassID:

206376

H01J2237/06375 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Sources; Electron sources Arrangement of electrodes

Recent Application in this class:
#1
20260120989
2026-04-30

APPARATUS AND METHOD FOR IMPROVED ELECTRON BEAM INSPECTION WITH A CHARGE TREATMENT ELECTRON SOURCE

#2
20250308832
2025-10-02

STABILIZING A TIP WIRE OF AN ELECTRON SOURCE

#3
20250157776
2025-05-15

SYSTEMS, DEVICES, AND METHODS FOR ION BEAM MODULATION

#4
20240347311
2024-10-17

SYSTEM AND APPARATUS FOR STABILIZING ELECTRON SOURCES IN CHARGED PARTICLE SYSTEMS

#5
20240212966
2024-06-27

Charged Particle Gun and Charged Particle Beam Apparatus

#6
20230402255
2023-12-14

Equipment and Method for Improved Edge Uniformity of Plasma Processing of Wafers

#7
20230335376
2023-10-19

REMOTE SURFACE WAVE PROPAGATION FOR SEMICONDUCTOR CHAMBERS

#8
20230282445
2023-09-07

METHOD OF NUCLEAR REPROGRAMMING

#9
20230207249
2023-06-29

Electron gun, electron gun component, electron beam applicator, and alignment method

#10
20230178325
2023-06-08

Charged Particle Gun and Charged Particle Beam System

#11
20230078095
2023-03-16

PLASMA ETCHING APPARATUS AND SEMICONDUCTOR PROCESSING SYSTEM

#12
20230068224
2023-03-02

Substrate processing apparatus and substrate processing method

#13
20230028337
2023-01-26

Method and apparatus for detecting discharge site

#14
20230005704
2023-01-05

Scanning electron microscope device and electron beam inspection apparatus

#15
20220363558
2022-11-17

ION PRODUCTION SYSTEM WITH EFFICIENT ION COLLECTION

#16
20220310358
2022-09-29

Corona/plasma treatment machine

#17
20220301820
2022-09-22

Charged particle emission device, system, method, and program

#18
20220301819
2022-09-22

Charged particle emission device, system, method, and program

#19
20220199363
2022-06-23

PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

#20
20220115215
2022-04-14

Substrate processing apparatus

#21
20220084774
2022-03-17

Systems, devices, and methods for ion beam modulation

#22
20220068589
2022-03-03

CHARGED PARTICLE SOURCE

#23
20210335573
2021-10-28

Charged-particle source

#24
20200126753
2020-04-23

Charged particle source

#25
20190371564
2019-12-05

Space charge insensitive electron gun designs

#26
20190237288
2019-08-01

Charged-particle source and method for cleaning a charged-particle source using back-sputtering

#27
20190096626
2019-03-28

Cold cathode field-emission electron gun, adjustment method for cold cathode field-emission electron gun, sharpening method for emitter, and electron microscope

#28
20190057833
2019-02-21

Charged particle source

#29
20180254165
2018-09-06

Simplified particle emitter and method of operating thereof

#30
20180138008
2018-05-17

Ion source

#31
20180138007
2018-05-17

Ion Implanter

#32
20170213685
2017-07-27

X-ray tube including hybrid electron emission source

#33
20160374261
2016-12-29

Apparatus for impinging bulk material with accelerated electrons

#34
20160104597
2016-04-14

Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun

#35
20160071702
2016-03-10

ARC-PLASMA FILM FORMATION DEVICE

#36
20150117617
2015-04-30

X-ray tube

#37
20150076988
2015-03-19

Electron emitter device with integrated multi-pole electrode structure

#38
20130134324
2013-05-30

Compact high-voltage electron gun

#39
20120256097
2012-10-11

Indirectly heated cathode cartridge design

#40
20120131785
2012-05-31

Electron beam source and method of manufacturing the same

#41
20120091359
2012-04-19

SIMPLIFIED PARTICLE EMITTER AND METHOD OF OPERATING THEREOF

#42
20120085925
2012-04-12

Charged particle radiation device

#43
20110199027
2011-08-18

ELECTRON BEAM GENERATOR HAVING ADJUSTABLE BEAM WIDTH

#44
20110084591
2011-04-14

THERMAL FIELD EMISSION CATHODE

#45
20100320942
2010-12-23

Electron gun used in particle beam device

#46
20100301736
2010-12-02

Electron emitting source and manufacturing method of electron emitting source

#47
20100090579
2010-04-15

Device for the field emission of particles and production method

#48
20100078557
2010-04-01

Electron beam source and method of manufacturing the same

#49
20100019648
2010-01-28

Electron gun minimizing sublimation of electron source and electron beam exposure apparatus using the same

#50
20090315444
2009-12-24

Thermal field emission cathode

#51
20090289204
2009-11-26

Electron beam emitter with slotted gun

#52
20080277584
2008-11-13

Method for Changing Energy of Electron Beam in Electron Column

#53
20080217531
2008-09-11

Integrated deflectors for beam alignment and blanking in charged particle columns

#54
20080067421
2008-03-20

Electron Beam Etching Apparatus and Method for the same

#55
20080067377
2008-03-20

Electron beam apparatus and an aberration correction optical apparatus

#56
20080049888
2008-02-28

High brightness—multiple beamlets source for patterned X-ray production

#57
20070228922
2007-10-04

Electron gun and electron beam apparatus field of invention

#58
20070228286
2007-10-04

Polarized pulsed front-end beam source for electron microscope

#59
20050211921
2005-09-29

Electron beam exposure system

#60
20050199820
2005-09-15

Particle beam generator

#61
20050116156
2005-06-02

Electron flood apparatus and ion implantation system

#62
20050092929
2005-05-05

Integrated sub-nanometer-scale electron beam systems

#63
16024215
2024-01-02

Electron source devices, electron source assemblies, and methods for generating electrons

#64
15593900
2018-04-03

Extractor electrode for electron source